公开(公告)号：US20170018471A1

公开(公告)日：2017-01-19

申请号：US15182657

申请日：2016-06-15

Applicant: Hitachi, Ltd.

Inventor： Takanori AONO ,  Tomonori SEKIGUCHI ,  Takashi SHIOTA ,  Yuudai KAMADA ,  Atsushi ISOBE

IPC: H01L23/053 ,  G01L9/02 ,  G01P15/18 ,  G01P3/44 ,  H01L23/498 ,  B81B7/00

CPC classification number: G01L9/02 ,  B81B7/0048 ,  B81B2201/0235 ,  B81B2201/0242 ,  B81B2201/0264 ,  B81B2207/07 ,  G01C19/5783 ,  G01L9/12 ,  G01P1/006 ,  G01P1/023 ,  H01L23/057 ,  H01L23/49838 ,  H01L23/49861 ,  H01L2224/16225

Abstract: To provide a physical quantity sensor in which the influence of deformation of a package substrate on the measuring accuracy of a sensor element can be suppressed. A physical quantity sensor includes a sensor element that detects a predetermined physical quantity and outputs an electrical signal, a plurality of lead portions that are connected to the sensor element, and a package substrate that accommodates the sensor element and the plurality of lead portions. The plurality of lead portions are connected at proximal end sides thereof to the package substrate side, and connected at distal end sides thereof to the sensor element side, and the plurality of lead portions support the sensor element in such a manner that the sensor element does not contact the package substrate and that the transmission of deformation of the package substrate side to the sensor element is suppressed.

Abstract translation: 提供能够抑制封装基板的变形对传感器元件的测量精度的影响的物理量传感器。 物理量传感器包括检测预定物理量并输出电信号的传感器元件，连接到传感器元件的多个引线部分和容纳传感器元件和多个引线部分的封装基板。 多个引线部分在其近端侧连接到封装基板侧，并且在其远端侧连接到传感器元件侧，并且多个引线部分以传感器元件的方式支撑传感器元件 不接触封装基板，并且抑制封装基板侧向传感器元件的变形的传输。

公开(公告)号：US20170188443A1

公开(公告)日：2017-06-29

申请号：US15313982

申请日：2015-04-27

Applicant: Hitachi, Ltd.

Inventor： Takashi NAKAHARA ,  Shinya YUDA ,  Takanori AONO ,  Tetsu INAHARA ,  Yoshitaka SEKI ,  Kouji AKITA ,  Kiyomi ABE

IPC: H05G1/26

CPC classification number: H05G1/26 ,  A61B6/03 ,  A61B6/40 ,  A61B6/586 ,  H01J35/26 ,  H05G1/54

Abstract: A learning unit in learning mode generates a cluster from a cluster analysis of data formed from frequency constituent data and state data, obtained from a sensor unit. An abnormality calculation unit computes, as abnormalities, the minimum values among distances to surfaces of the clusters of the data formed from the frequency constituent data and the state data, obtained when in predictive fault indicator sensing mode. A predictive fault indicator determination unit determines a predictive fault indicator of an X-ray tube by comparing the abnormalities with a predetermined threshold.

公开(公告)号：US20160178506A1

公开(公告)日：2016-06-23

申请号：US14962334

申请日：2015-12-08

Applicant: Hitachi, Ltd.

Inventor： Jiro HASHIZUME ,  Kei TAKENAKA ,  Takanori AONO

IPC: G01N21/17

CPC classification number: G01N21/171 ,  G01N2021/1712

Abstract: The present invention includes: an excitation light source; a probe light source; a filter that mutually multiplexes a probe light emitted from the probe light source and an excitation light emitted from the excitation light source to a same optical axis; a condenser lens that focuses the excitation light and the probe light; a sample cell that stores a sample; a reflection member that is disposed on an inner wall of the sample cell and reflects the probe light; and a detector that detects the probe light reflected at the reflection member.

Abstract translation: 本发明包括：激发光源; 探测光源; 滤波器，其将从探测光源发射的探测光与从激发光源发射的激发光相互复用到相同的光轴; 聚焦透镜，聚焦激发光和探测光; 存储样品的样品池; 反射构件，其设置在所述样品池的内壁上并反射所述探测光; 以及检测器，其检测在反射构件处反射的探测光。