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公开(公告)号:US11906383B2
公开(公告)日:2024-02-20
申请号:US17282870
申请日:2020-01-20
申请人: Robert Bosch GmbH
发明人: Stefan Pinter , Nico Greiner
CPC分类号: G01L9/0052 , B81B7/0048 , B81B7/0058 , B81B7/0064 , B81C1/00325 , B81B2201/0264 , B81B2203/0127 , B81B2207/012 , B81B2207/098 , B81C2203/0792
摘要: A micromechanical sensor device and a corresponding manufacturing method are described. The micromechanical sensor device is fitted with a substrate including a front side and a rear side; a micromechanical sensor chip including a sensor area attached to the front side of the substrate; and a capping unit attached to the front side of the substrate, which is formed at least partially by an ASIC chip. The capping unit surrounds the micromechanical sensor chip in such a way that a cavity closed toward the front side of the substrate is formed between the sensor area of the micromechanical sensor chip and the ASIC chip. A mold package is formed above the capping unit.
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公开(公告)号:US11885621B2
公开(公告)日:2024-01-30
申请号:US17415340
申请日:2020-02-04
发明人: Koichiro Nakashima , Takashi Uchida , Yusuke Nakamura , Hideki Ueda , Naruhito Noda , Toshitsugu Konishi , Toshio Yamazaki
IPC分类号: G01C19/5783 , B81B7/00 , G01C19/5684
CPC分类号: G01C19/5783 , B81B7/007 , B81B7/0048 , G01C19/5684 , B81B2201/0242
摘要: A sensor device includes a sensor element, a substrate, and a bonding wire. Over the substrate, provided is the sensor element. The bonding wire forms at least part of a connection path that electrically connects the sensor element and the substrate together. The bonding wire is provided to connect two connection surfaces that intersect with each other.
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公开(公告)号:US11780727B2
公开(公告)日:2023-10-10
申请号:US17295598
申请日:2021-01-12
申请人: ZHEJIANG UNIVERSITY
发明人: Lufeng Che
IPC分类号: B81B7/00 , G01P1/02 , B81B7/02 , B81C1/00 , G01P15/125
CPC分类号: B81B7/0048 , B81B7/0045 , B81B7/02 , B81C1/00325 , G01P1/023 , G01P15/125 , B81B2201/0235
摘要: A low-stress packaging structure for a MEMS acceleration sensor chip includes a MEMS sensor chip and a chip carrier. Two sides of the bottom of the sensor chip are provided with a first metal layer and a second metal layer respectively. Two sides of a die attach area of the chip carrier are correspondingly provided with a third metal layer and a fourth metal layer. The first metal layer of the sensor chip and the third metal layer of the chip carrier are bonded together. The second metal layer of the sensor chip and the fourth metal layer of the chip carrier are only in contact but not bonded. A groove is arranged between the first metal layer and the second metal layer at the bottom of the sensor chip. A certain gap is defined between the sensor chip and cavity walls of chip carrier.
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公开(公告)号:US20190204171A1
公开(公告)日:2019-07-04
申请号:US16296920
申请日:2019-03-08
申请人: DENSO CORPORATION
发明人: Akira INABA , Minoru MURATA
CPC分类号: G01L9/0051 , B81B7/0048 , B81B2201/0264 , B81B2203/0127 , G01L9/00 , G01L13/06 , H01L29/84
摘要: A pressure sensor may include a sensor chip and a support member. The sensor chip may include a diaphragm and an inner space. The diaphragm may have a thin plate shape. The diaphragm may be bent in a thickness direction by a fluid pressure. The inner space may be provided by a space adjacent to the diaphragm in the thickness direction. The support member may support the sensor chip at a position separated from the diaphragm. An outer shape of the sensor chip may be provided by a polygonal shape or a circular shape. An outer shape of the diaphragm may be provided by a polygonal shape or a circular shape.
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公开(公告)号:US20180148321A1
公开(公告)日:2018-05-31
申请号:US15880332
申请日:2018-01-25
发明人: Enri DUQI , Sebastiano CONTI
CPC分类号: B81B7/0054 , B81B3/0051 , B81B7/0048 , B81B7/008 , B81B2201/0264 , B81C1/00325 , H01L2224/48091 , H01L2924/00014
摘要: A MEMS device is provided with: a supporting base, having a bottom surface in contact with an external environment; a sensor die, which is of semiconductor material and integrates a micromechanical detection structure; a sensor frame, which is arranged around the sensor die and is mechanically coupled to a top surface of the supporting base; and a cap, which is arranged above the sensor die and is mechanically coupled to a top surface of the sensor frame, a top surface of the cap being in contact with an external environment. The sensor die is mechanically decoupled from the sensor frame.
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公开(公告)号:US09963341B2
公开(公告)日:2018-05-08
申请号:US14716515
申请日:2015-05-19
发明人: David P. Potasek , Robert Stuelke
IPC分类号: B81B7/00
CPC分类号: B81B7/0058 , B81B7/0048 , B81B2207/015 , H01L2224/48247
摘要: A sensor package includes a manifold and a MEMS die. The manifold includes a cylindrical body, a flange, and a mounting surface. The cylindrical body defines a first passage that extends longitudinally along a central axis from a first exterior end to an interior end of the cylindrical body. The flange extends from the cylindrical body and has an outer periphery that is configured to support a print circuit board. The mounting surface is disposed at the interior end of the first passage. The surface area of the mounting surface is less than the surface area of a MEMS die configured to mate with the mounting surface.
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公开(公告)号:US09926188B2
公开(公告)日:2018-03-27
申请号:US15119917
申请日:2015-02-05
申请人: Robert Bosch GmbH
发明人: Johannes Classen , Torsten Kramer , Hubert Benzel , Jens Frey , Daniel Christoph Meisel , Christoph Schelling
IPC分类号: H01L23/498 , B81B7/00 , B81C3/00
CPC分类号: B81B7/0048 , B81B2201/0264 , B81B2203/0127 , B81B2207/017 , B81C3/001 , B81C2201/0132 , B81C2201/019 , H01L2224/16225 , H01L2924/15311
摘要: A sensor unit including a first semiconductor component and a second semiconductor component, the first semiconductor component including a first substrate and a sensor structure. The second semiconductor component includes a second substrate, the first and second semiconductor components being connected to each other with the aid of a wafer connection, the sensor unit having a decoupling structure, which is configured in such a way that the sensor structure is decoupled thermally and/or mechanically from the second semiconductor component.
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公开(公告)号:US20180016134A1
公开(公告)日:2018-01-18
申请号:US15541316
申请日:2015-11-06
申请人: TDK Corporation
CPC分类号: B81B7/0048 , B81B2201/0257 , B81B2207/07 , H04R1/021 , H04R19/005 , H04R19/04 , H04R2201/003
摘要: A model is specified in which a MEMS component is connected to the carrier in a stress-free fashion over a large temperature range. For this purpose, a mechanical connection comprises a compensation structure which bridges a horizontal offset of mounting points by means of a horizontal shoulder and the thermal expansion coefficient of which is suitably selected.
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公开(公告)号:US20170305740A1
公开(公告)日:2017-10-26
申请号:US15480015
申请日:2017-04-05
申请人: Robert Bosch GmbH
发明人: Steffen Zunft
CPC分类号: B81B7/0016 , B81B7/0048 , B81B2201/0235 , B81B2201/0242 , B81B2203/0163 , B81B2203/0315 , B81C1/00333 , B81C2203/0109 , B81C2203/0118
摘要: A micromechanical device having a substrate wafer, a functional layer situated above it which has a mobile micromechanical structure, and a cap situated on top thereof, having a first cavity, which is formed at least by the substrate wafer and the cap and which includes the micromechanical structure. The micromechanical device has a fixed part and a mobile part, which are movably connected to each other with at least one spring element, and the first cavity is situated in the mobile part. Also described is a method for producing the micromechanical device.
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公开(公告)号:US09790084B2
公开(公告)日:2017-10-17
申请号:US14536091
申请日:2014-11-07
申请人: Robert Bosch GmbH
发明人: Arnd Kaelberer , Jochen Reinmuth
CPC分类号: B81B7/0048 , B81B2201/0235 , B81B2201/0242 , B81B2207/012 , B81B2207/096 , B81C1/00238 , B81C2203/0792 , G01P15/0802 , G01P2015/0882
摘要: A micromechanical sensor device includes an evaluation circuit formed in a first substrate, and an MEMS structure which is situated in a cavity delimited by a second substrate and a third substrate, the MEMS structure and the second substrate being situated on top of each other, the MEMS structure being functionally connected to the evaluation circuit via a contact area, the contact area between the MEMS structure and the first substrate being situated essentially centrally on the second substrate and essentially centrally on the first substrate and has an essentially punctiform configuration, proceeding radially from the contact area, a clearance being formed between the first substrate and the second substrate.
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