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25 条记录 (耗时 0.023 秒)

    Circuits and methods for matching device characteristics for analog and mixed-signal designs
    1.
    发明授权
    Circuits and methods for matching device characteristics for analog and mixed-signal designs 失效
    用于匹配模拟和混合信号设计的器件特性的电路和方法

    公开(公告)号：US07086020B2

    公开(公告)日：2006-08-01

    申请号：US10733079

    申请日：2003-12-11

    申请人： Howard Hao Chen ,  Louis Lu-Chen Hsu ,  Charlie Chornglii Hwang

    发明人： Howard Hao Chen ,  Louis Lu-Chen Hsu ,  Charlie Chornglii Hwang

    IPC分类号： G06F17/50

    CPC分类号： G06F17/5068

    摘要： Circuit designs and methods are provided for matching device characteristics for, e.g., analog or mixed-signal semiconductor integrated circuit designs. In particular, circuit layout patterns and layout methods are provided which enable precise or proportional matching of circuit components by uniformly distributing circuit components in a manner that eliminates or significantly minimizes the sensitivity of such circuit components to environmental effects and process variations, thereby improving the performance of analog and mixed-signal circuits.

    摘要翻译： 提供电路设计和方法用于匹配例如模拟或混合信号半导体集成电路设计的器件特性。 特别地，提供电路布局图案和布局方法，其通过以消除或显着地最小化这些电路部件对环境影响和工艺变化的灵敏度的方式均匀地分配电路部件来实现电路部件的精确或比例匹配，从而提高性能 的模拟和混合信号电路。

    Low-power static column redundancy scheme for semiconductor memories
    9.
    发明授权
    Low-power static column redundancy scheme for semiconductor memories 有权
    半导体存储器的低功耗静态列冗余方案

    公开(公告)号：US06603690B1

    公开(公告)日：2003-08-05

    申请号：US10091663

    申请日：2002-03-06

    申请人： Howard Hao Chen ,  Louis Lu-Chen Hsu ,  Li-Kong Wang

    发明人： Howard Hao Chen ,  Louis Lu-Chen Hsu ,  Li-Kong Wang

    IPC分类号： G11C700

    CPC分类号： G11C29/802

    摘要： A static column redundancy scheme for a semiconductor memory such as an eDRAM. By utilizing the existing scan registers for SRAM array testing, the column redundancy information of each bank or each microcell of the memory chip can be scanned, stored and programmed during the power-on period. Two programming methods are disclosed to find the column redundancy information on the fly. In the first method, the column redundancy information is first stored in the SRAM, and is then written into the program registers of the corresponding bank or microcell location. In the second method, the column redundancy information is loaded directly into the program registers of a bank or microcell location according to the bank address information without loading the SRAM. Since the new static column redundancy scheme does not need to compare the incoming addresses, it eliminates the use of control and decoding circuits, which significantly reduces the power consumption for memory macros.

    摘要翻译： 用于诸如eDRAM的半导体存储器的静态列冗余方案。 通过利用现有的扫描寄存器进行SRAM阵列测试，可以在上电期间扫描，存储和编程存储器芯片的每个存储体或每个微单元的列冗余信息。 公开了两种编程方法来即时查找列冗余信息。 在第一种方法中，列冗余信息首先存储在SRAM中，然后被写入对应的存储体或微小区位置的程序寄存器中。 在第二种方法中，列冗余信息根据存储体地址信息被直接加载到存储体或微小区位置的程序寄存器中而不加载SRAM。 由于新的静态列冗余方案不需要比较输入地址，因此无需使用控制和解码电路，这显着降低了存储宏的功耗。

    On-chip power supply regulator and temperature control system
    10.
    发明授权
    On-chip power supply regulator and temperature control system 失效
    片上电源调节器和温度控制系统

    公开(公告)号：US07214910B2

    公开(公告)日：2007-05-08

    申请号：US10884933

    申请日：2004-07-06

    申请人： Howard Hao Chen ,  William J. Ferrante ,  Louis L. Hsu ,  Carl J. Radens

    发明人： Howard Hao Chen ,  William J. Ferrante ,  Louis L. Hsu ,  Carl J. Radens

    IPC分类号： H05B1/02

    CPC分类号： G05D23/20 ,  G05D23/1931 ,  Y10T307/469

    摘要： An on-chip temperature control system includes a temperature sensor, which monitors a temperature of a chip, and a hysteresis comparator which checks whether the temperature is in an acceptable range. A reference adjustment circuit is responsive to the hysteresis comparator to adjust an on-chip voltage to control the temperature locally by adjusting a local supply voltage, if the temperature is out of range.

    摘要翻译： 片上温度控制系统包括监测芯片温度的温度传感器和检查温度是否在可接受范围内的滞后比较器。 如果温度超出范围，参考调节电路响应于迟滞比较器来调节片上电压以局部地调节局部电源电压来控制温度。