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公开(公告)号:US11054470B1
公开(公告)日:2021-07-06
申请号:US16725689
申请日:2019-12-23
Applicant: Intel Corporation
Inventor: Amit Agarwal , Steven Hsu , Anupama Ambardar Thaploo , Simeon Realov , Ram Krishnamurthy
IPC: G01R31/3185 , G01R31/317 , H03K3/037 , G01R31/3177 , H03K3/038
Abstract: A family of novel, low power, min-drive strength, double-edge triggered (DET) input data multiplexer (Mux-D) scan flip-flop (FF) is provided. The flip-flop takes the advantage of no state node in the slave to remove data inverters in a traditional DET FF to save power, without affecting the flip-flop functionality under coupling/glitch scenarios.
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公开(公告)号:US20210203323A1
公开(公告)日:2021-07-01
申请号:US16727742
申请日:2019-12-26
Applicant: Intel Corporation
Inventor: Steven Hsu , Amit Agarwal , Simeon Realov , Ram Krishnamurthy
Abstract: A parasitic-aware single-edge triggered flip-flop reduces clock power through layout optimization, enabled through process-circuit co-optimization. The static pass-gate master-slave flip-flop utilizes novel layout optimization enabling significant power reduction. The layout removes the clock poly over notches in the diffusion area. Poly lines implement clock nodes. The poly lines are aligned between n-type and p-type active regions.
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公开(公告)号:US10193536B2
公开(公告)日:2019-01-29
申请号:US15860562
申请日:2018-01-02
Applicant: INTEL CORPORATION
Inventor: Amit Agarwal , Steven K. Hsu , Simeon Realov , Iqbal R. Rajwani , Ram K. Krishnamurthy
IPC: H03K3/3562 , H03K3/037
Abstract: An apparatus is provided which comprises: a clock node; a first inverter having an input coupled to the clock node; a data node; a master latch with a shared p-type keeper coupled to an output of the first inverter, the master latch coupled to the data node; and a slave latch coupled to an output of the master latch, the slave latch having a shared p-type keeper and a shared n-type footer, wherein the shared p-type keeper and the shared n-type footer of the slave latch are coupled to the clock node and the input of the first inverter.
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公开(公告)号:US11296681B2
公开(公告)日:2022-04-05
申请号:US16726020
申请日:2019-12-23
Applicant: Intel Corporation
Inventor: Amit Agarwal , Steven Hsu , Simeon Realov , Mahesh Kumashikar , Ram Krishnamurthy
IPC: H03K3/00 , H03K3/037 , G01R31/3177 , H03K3/038 , H03K19/20
Abstract: A fast Mux-D scan flip-flop is provided, which bypasses a scan multiplexer to a master keeper side path, removing delay overhead of a traditional Mux-D scan topology. The design is compatible with simple scan methodology of Mux-D scan, while preserving smaller area and small number of inputs/outputs. Since scan Mux is not in the forward critical path, circuit topology has similar high performance as level-sensitive scan flip-flop and can be easily converted into bare pass-gate version. The new fast Mux-D scan flip-flop combines the advantages of the conventional LSSD and Mux-D scan flip-flop, without the disadvantages of each.
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公开(公告)号:US20210263100A1
公开(公告)日:2021-08-26
申请号:US17240877
申请日:2021-04-26
Applicant: Intel Corporation
Inventor: Amit Agarwal , Ram Krishnamurthy , Satish Damaraju , Steven Hsu , Simeon Realov
IPC: G01R31/317 , G01R31/3177 , H03K3/037 , G01R31/3185
Abstract: An apparatus is provided which comprises: a multi-bit quad latch with an internally coupled level sensitive scan circuitry; and a combinational logic coupled to an output of the multi-bit quad latch. Another apparatus is provided which comprises: a plurality of sequential logic circuitries; and a clocking circuitry comprising inverters, wherein the clocking circuitry is shared by the plurality of sequential logic circuitries.
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公开(公告)号:US20210194469A1
公开(公告)日:2021-06-24
申请号:US16726020
申请日:2019-12-23
Applicant: Intel Corporation
Inventor: Amit Agarwal , Steven Hsu , Simeon Realov , Mahesh Kumashikar , Ram Krishnamurthy
IPC: H03K3/037 , H03K19/20 , H03K3/038 , G01R31/3177
Abstract: A fast Mux-D scan flip-flop is provided, which bypasses a scan multiplexer to a master keeper side path, removing delay overhead of a traditional Mux-D scan topology. The design is compatible with simple scan methodology of Mux-D scan, while preserving smaller area and small number of inputs/outputs. Since scan Mux is not in the forward critical path, circuit topology has similar high performance as level-sensitive scan flip-flop and can be easily converted into bare pass-gate version. The new fast Mux-D scan flip-flop combines the advantages of the conventional LSSD and Mux-D scan flip-flop, without the disadvantages of each.
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公开(公告)号:US20180278243A1
公开(公告)日:2018-09-27
申请号:US15992052
申请日:2018-05-29
Applicant: Intel Corporation
Inventor: Amit Agarwal , Steven K. Hsu , Simeon Realov , Ram K. Krishnamurthy
IPC: H03K3/3562 , H03K19/00 , H03K19/20
CPC classification number: H03K3/3562 , H03K3/0375 , H03K19/0002 , H03K19/20
Abstract: An apparatus is provided which comprises: a multiplexer which is gated by a clock; and a flip-flop coupled to the multiplexer, wherein the flip-flop has a chain of at least four inverters one of which has an input to receive the clock.
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公开(公告)号:US11442103B2
公开(公告)日:2022-09-13
申请号:US17240877
申请日:2021-04-26
Applicant: Intel Corporation
Inventor: Amit Agarwal , Ram Krishnamurthy , Satish Damaraju , Steven Hsu , Simeon Realov
IPC: G01R31/317 , G01R31/3177 , H03K3/037 , G01R31/3185
Abstract: An apparatus is provided which comprises: a multi-bit quad latch with an internally coupled level sensitive scan circuitry; and a combinational logic coupled to an output of the multi-bit quad latch. Another apparatus is provided which comprises: a plurality of sequential logic circuitries; and a clocking circuitry comprising inverters, wherein the clocking circuitry is shared by the plurality of sequential logic circuitries.
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公开(公告)号:US20220224316A1
公开(公告)日:2022-07-14
申请号:US17711638
申请日:2022-04-01
Applicant: Intel Corporation
Inventor: Amit Agarwal , Steven Hsu , Simeon Realov , Mahesh Kumashikar , Ram Krishnamurthy
IPC: H03K3/037 , G01R31/3177 , H03K3/038 , H03K19/20
Abstract: A fast Mux-D scan flip-flop is provided, which bypasses a scan multiplexer to a master keeper side path, removing delay overhead of a traditional Mux-D scan topology. The design is compatible with simple scan methodology of Mux-D scan, while preserving smaller area and small number of inputs/outputs. Since scan Mux is not in the forward critical path, circuit topology has similar high performance as level-sensitive scan flip-flop and can be easily converted into bare pass-gate version. The new fast Mux-D scan flip-flop combines the advantages of the conventional LSSD and Mux-D scan flip-flop, without the disadvantages of each.
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公开(公告)号:US20190187208A1
公开(公告)日:2019-06-20
申请号:US15846047
申请日:2017-12-18
Applicant: Intel Corporation
Inventor: Amit Agarwal , Ram Krishnamurthy , Satish Damaraju , Steven Hsu , Simeon Realov
IPC: G01R31/317 , H03K3/037 , G01R31/3177
Abstract: An apparatus is provided which comprises: a multi-bit quad latch with an internally coupled level sensitive scan circuitry; and a combinational logic coupled to an output of the multi-bit quad latch. Another apparatus is provided which comprises: a plurality of sequential logic circuitries; and a clocking circuitry comprising inverters, wherein the clocking circuitry is shared by the plurality of sequential logic circuitries.
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