High aspect ratio sample holder
    3.
    发明授权
    High aspect ratio sample holder 失效
    高纵横比样品架

    公开(公告)号:US08637836B1

    公开(公告)日:2014-01-28

    申请号:US13658733

    申请日:2012-10-23

    IPC分类号: H01J37/20

    摘要: An elongated member is formed which has a frontal and a distal end, and a length axis. The frontal end satisfies vacuum sealing and maneuverability specifications of a sample holder for a particle beam microscope. The elongated member includes a tubular section defining an axial cavity along the length axis, and having an orifice toward the distal end of the elongated member. The resulting device is characterized as being a sample holder for use in particle beam microscopes. The sample holder enables the examination of high aspect ratio samples by accommodating them in its axial cavity. The examination can take place without prior modification of the high aspect ratio samples.

    摘要翻译: 形成具有前端和远端以及长度轴的细长构件。 前端满足用于粒子束显微镜的样品架的真空密封和机动性规格。 细长构件包括限定沿着长度轴线的轴向空腔的管状部分,并且具有朝向细长构件的远端的孔口。 所得到的装置的特征在于作为用于粒子束显微镜的样品保持器。 样品保持器可以通过将它们容纳在其轴向腔中来检查高纵横比样品。 检查可以在没有先前修改高纵横比样品的情况下进行。

    HIGH ASPECT RATIO SAMPLE HOLDER
    8.
    发明申请
    HIGH ASPECT RATIO SAMPLE HOLDER 审中-公开
    高比例样品夹

    公开(公告)号:US20140082920A1

    公开(公告)日:2014-03-27

    申请号:US13629193

    申请日:2012-09-27

    IPC分类号: B23P13/00

    摘要: An elongated member is formed which has a frontal and a distal end, and a length axis. The frontal end satisfies vacuum sealing and maneuverability specifications of a sample holder for a particle beam microscope. The elongated member includes a tubular section defining an axial cavity along the length axis, and having an orifice toward the distal end of the elongated member. The resulting device is characterized as being a sample holder for use in particle beam microscopes. The sample holder enables the examination of high aspect ratio samples by accommodating them in its axial cavity. The examination can take place without prior modification of the high aspect ratio samples.

    摘要翻译: 形成具有前端和远端以及长度轴的细长构件。 前端满足用于粒子束显微镜的样品架的真空密封和机动性规格。 细长构件包括限定沿着长度轴线的轴向空腔的管状部分,并且具有朝向细长构件的远端的孔口。 所得到的装置的特征在于作为用于粒子束显微镜的样品保持器。 样品保持器可以通过将它们容纳在其轴向腔中来检查高纵横比样品。 检查可以在没有先前修改高纵横比样品的情况下进行。