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    PRE-TEST POWER-OPTIMIZED BIN REASSIGNMENT FOLLOWING SELECTIVE VOLTAGE BINNING
    3.
    发明申请
    PRE-TEST POWER-OPTIMIZED BIN REASSIGNMENT FOLLOWING SELECTIVE VOLTAGE BINNING 有权
    预先选择电压波动的优化电源优化

    公开(公告)号：US20160313394A1

    公开(公告)日：2016-10-27

    申请号：US14695112

    申请日：2015-04-24

    申请人： International Business Machines Corporation

    发明人： Igor Arsovski ,  Jeanne P. Bickford ,  Paul J. Grzymkowski ,  Susan K. Lichtensteiger ,  Robert J. McMahon ,  Troy J. Perry ,  David M. Picozzi ,  Thomas G. Sopchak

    IPC分类号： G01R31/28 ,  H01L21/67

    CPC分类号： G01R31/2894 ,  G01R21/133 ,  G01R31/31718 ,  G06F17/5045 ,  G06F2217/78

    摘要： Disclosed is a method wherein selective voltage binning and leakage power screening of integrated circuit (IC) chips are performed. Additionally, pre-test power-optimized bin reassignments are made on a chip-by-chip basis. Specifically, a leakage power measurement of an IC chip selected from a voltage bin can is compared to a bin-specific leakage power screen value of the next slower voltage bin. If the leakage power measurement is higher, the IC chip will be left in the voltage bin to which it is currently assigned. If the leakage power measurement is lower, the IC chip will be reassigned to that next slower voltage bin. These processes can be iteratively repeated until no slower voltage bins are available or the IC chip cannot be reassigned. IC chips can subsequently be tested according to testing parameters, including the minimum test voltages, associated with the voltage bins to which they are finally assigned.

    摘要翻译： 公开了一种其中执行集成电路（IC）芯片的选择性电压组合和漏电功率筛选的方法。 另外，预先测试功率优化的bin重新分配是在逐个芯片的基础上进行的。 具体地，将从电压仓罐选择的IC芯片的泄漏功率测量值与下一个较慢电压箱的二进制特定泄漏功率屏幕值进行比较。 如果泄漏功率测量值较高，则IC芯片将保留在当前分配给它的电压仓中。 如果泄漏功率测量值较低，则IC芯片将重新分配给下一个较慢的电压仓。 这些过程可以迭代重复，直到没有较慢的电压箱可用或IC芯片不能重新分配。 IC芯片随后可以根据测试参数进行测试，包括与最终分配给它们的电压箱相关联的最小测试电压。