-
公开(公告)号：US20200150246A1
公开(公告)日：2020-05-14
申请号：US16679748
申请日：2019-11-11
Applicant: Infineon Technologies AG
Inventor： Thomas THURNER , David BRUNNER , Marcus Edward HENNECKE , Georg SCHITTER , Han Woong YOO
Abstract: A light detection and ranging (LIDAR) sensor includes a first reflective surface configured to oscillate about a first rotation axis to deflect a light beam into an environment; and a second reflective surface configured to oscillate about a second rotation axis to guide light received from the environment onto a photodetector of the LIDAR sensor. The first rotation axis and the second rotation axis extend parallel to one another. The LIDAR sensor also includes a control circuit configured to drive the first reflective surface to oscillate with a first maximum deflection angle about the first rotation axis, and to drive the second reflective surface to oscillate with a second maximum deflection angle about the second rotation axis, the first maximum deflection angle being greater than the second maximum deflection angle, and an area of the first reflective surface is less than an area of the second reflective surface.
-
公开(公告)号：US20230031326A1
公开(公告)日：2023-02-02
申请号：US17874761
申请日：2022-07-27
Applicant: Infineon Technologies AG
Inventor： Thomas THURNER , Armin Josef SCHOENLIEB
IPC: H05B47/155 , G02B5/02 , G01S7/484 , G01S7/4865
Abstract: An illumination device for an optical sensor is provided. The illumination device includes a plurality of light sources and a control circuit. The control circuit is configured to control the plurality of light sources to entirely illuminate a field of illumination in a first operation mode. The control circuit is further configured to control the plurality of light sources to illuminate at least one subfield of the field of illumination in a second operation mode.
-
Patent Agency Ranking
公开(公告)号：US20230327310A1
公开(公告)日：2023-10-12
申请号：US18193196
申请日：2023-03-30
Applicant: Infineon Technologies AG
Inventor： Stefano DI MARTINO , Dominik AMSCHL , Thomas THURNER
Abstract: An apparatus for detachably coupling with a printed circuit board to transfer electromagnetic waves. The apparatus includes a coupling element. The coupling element includes a first wave transmission structure configured to receive the electromagnetic waves from the printed circuit board and to transmit the electromagnetic waves along the first wave transmission structure. The apparatus further includes a vacuum channel structure including an inlet for coupling the apparatus to a vacuum generator to generate a vacuum between a first surface of the coupling element and a second surface of the printed circuit board such that a force between the coupling element and the printed circuit board is applied.
-
4.发明公开公开(公告)号：US20230189420A1
公开(公告)日：2023-06-15
申请号：US18055053
申请日：2022-11-14
Applicant: Infineon Technologies AG
Inventor： Thomas THURNER , Patrick FLEISCHANDERL
Abstract: An illumination device is provided. The illumination device includes a light source and a current path configured to transport a supply current to the light source. Further, the illumination device includes a sensor configured to contactlessly measure a current strength of the supply current in the current path and to output a measurement signal indicative of the measured current strength. The illumination device additionally includes processing circuitry coupled to the sensor and configured to determine the optical output power of the light source based on the measured current strength indicated by the measurement signal.
-
公开(公告)号：US20220326279A1
公开(公告)日：2022-10-13
申请号：US17225462
申请日：2021-04-08
Applicant: Infineon Technologies AG
Inventor： Stefano DI MARTINO , Thomas THURNER
Abstract: A wafer probe alignment system includes a test probe needle including a body having a tip that is configured to make contact with a surface of a wafer at a first tip position, wherein the body is deformable and includes a sensing area that undergoes a deformation in response to at least one force, including a lateral friction force, applied to the tip; at least one sensor configured to monitor the sensing area for deformation caused by a lateral friction force and generate at least one first sensor information representative of the lateral friction force; and a controller configured to control a position of the tip, wherein the controller is configured to receive the at least one first sensor information and reposition the tip to counteract the lateral friction force in order to maintain the tip at the first tip position.
-
公开(公告)号：US20200370955A1
公开(公告)日：2020-11-26
申请号：US16868064
申请日：2020-05-06
Applicant: Infineon Technologies AG
Inventor： Marcus Edward HENNECKE , Boris KIRILLOV , Thomas THURNER
Abstract: A digital light detector includes a clock signal generator configured to generate a clock signal comprised of clock pulses generated at a predetermined frequency; a single-photon avalanche diode (SPAD) configured to turn on and generate an avalanche current in response to receiving a photon, the SPAD including an internal capacitor coupled internally between an anode terminal and an cathode terminal; and an active quenching-recharging circuit that is triggered by the clock signal. The active quenching-recharging circuit is configured to be activated and deactivated based on the clock signal, where the active quenching-recharging circuit is configured to recharge the internal capacitor on a condition the active quenching-recharging circuit is activated, and where the active quenching-recharging circuit is configured to discharge the internal capacitor on a condition the active quenching-recharging circuit is deactivated.
-
7.发明申请公开(公告)号：US20190253688A1
公开(公告)日：2019-08-15
申请号：US15892706
申请日：2018-02-09
Applicant: Infineon Technologies AG
Inventor： Thomas THURNER
CPC classification number: H04N13/106 , G01S7/4911 , G01S7/4914 , G01S7/4915 , G01S17/36 , G01S17/46 , G01S17/89 , H04N13/211 , H04N13/254 , H04N13/296 , H04N2013/0081
Abstract: A three-dimensional image system includes a modulator configured to generate a first and a second modulation signal having a predetermined frequency difference, an illumination source configured to generate a light signal modulated by the first modulation signal, and a pixel array modulated by the second modulation signal. At least one pixel of the pixel array is configured to receive a reflected modulated light signal and generate a plurality of measurement signals based on a plurality of image acquisitions taken at different acquisition times. A controller is configured to control a phase difference between the first modulation signal and the second modulation signal by setting the first modulation frequency and the second modulation frequency to have a predetermined frequency difference greater than zero; and calculate a depth of the object based on the plurality of measurement signals, the depth being a distance from the 3DI system to the object.
-
-
-
-
-
-
Search Results
7
records
(took 0.013 seconds)
