公开(公告)号：US20240234303A9

公开(公告)日：2024-07-11

申请号：US17972975

申请日：2022-10-25

Applicant: Intel Corporation

Inventor： Min Suet Lim ,  Telesphor Kamgaing ,  Chee Kheong Yoon ,  Chu Aun Lim ,  Eng Huat Goh ,  Jooi Wah Wong ,  Kavitha Nagarajan

IPC: H01L23/522 ,  H01L49/02

CPC classification number: H01L23/5227 ,  H01L28/10

Abstract: Described herein are integrated circuit devices that include semiconductor devices near the center of the device, rather than towards the top or bottom of the device, and integrated inductors formed over the semiconductor devices. Power delivery to the device is on the opposite side of the semiconductor devices. The integrated inductors may be used for power step-down to reduce device thickness and/or a number of power rails.

公开(公告)号：US20190103358A1

公开(公告)日：2019-04-04

申请号：US15845336

申请日：2017-12-18

Applicant: Intel Corporation

Inventor： Eng Huat Goh ,  Min Suet Lim ,  Chee Kheong Yoon ,  Jia Yan Go

IPC: H01L23/538 ,  H05K1/18 ,  H01L25/18 ,  H01L25/00

Abstract: An electronic device may be a first package. The first package may include a first substrate having a first mounting surface. A first die may be coupled to the first mounting surface. A first interconnect region may be laterally spaced from the first die. The first package may be interconnected with a second package. The second package may include a second die coupled to a second mounting surface. Interconnection of the first package with the second package may establish one or more electrical communication pathways between the first package and the second package. The interconnection of the first package with the second package may interconnect the first die with the second die such that the first die and second die are in communication only through the one or more electrical communication pathways.

公开(公告)号：US20240234234A9

公开(公告)日：2024-07-11

申请号：US17972923

申请日：2022-10-25

Applicant: Intel Corporation

Inventor： Min Suet Lim ,  Telesphor Kamgaing ,  Ilan Ronen ,  Kavitha Nagarajan ,  Chee Kheong Yoon ,  Chu Aun Lim ,  Eng Huat Goh ,  Jooi Wah Wong

IPC: H01L23/367 ,  H01L23/42 ,  H01L23/532

CPC classification number: H01L23/367 ,  H01L23/42 ,  H01L23/53233

Abstract: Described herein are integrated circuit devices that include semiconductor devices near the center of the device, rather than towards the top or bottom of the device. In this arrangement, heat can become trapped inside the device. Metal fill, such as copper, is formed within a portion of the device, e.g., over the semiconductor devices and any front side interconnect structures, to transfer heat away from the semiconductor devices and towards a heat spreader.

公开(公告)号：US20240136279A1

公开(公告)日：2024-04-25

申请号：US17972975

申请日：2022-10-24

Applicant: Intel Corporation

Inventor： Min Suet Lim ,  Telesphor Kamgaing ,  Chee Kheong Yoon ,  Chu Aun Lim ,  Eng Huat Goh ,  Jooi Wah Wong ,  Kavitha Nagarajan

IPC: H01L23/522 ,  H01L49/02

CPC classification number: H01L23/5227 ,  H01L28/10

Abstract: Described herein are integrated circuit devices that include semiconductor devices near the center of the device, rather than towards the top or bottom of the device, and integrated inductors formed over the semiconductor devices. Power delivery to the device is on the opposite side of the semiconductor devices. The integrated inductors may be used for power step-down to reduce device thickness and/or a number of power rails.

公开(公告)号：US20240136243A1

公开(公告)日：2024-04-25

申请号：US17972923

申请日：2022-10-24

Applicant: Intel Corporation

Inventor： Min Suet Lim ,  Telesphor Kamgaing ,  Ilan Ronen ,  Kavitha Nagarajan ,  Chee Kheong Yoon ,  Chu Aun Lim ,  Eng Huat Goh ,  Jooi Wah Wong

IPC: H01L23/367 ,  H01L23/42 ,  H01L23/532

CPC classification number: H01L23/367 ,  H01L23/42 ,  H01L23/53233

Abstract: Described herein are integrated circuit devices that include semiconductor devices near the center of the device, rather than towards the top or bottom of the device. In this arrangement, heat can become trapped inside the device. Metal fill, such as copper, is formed within a portion of the device, e.g., over the semiconductor devices and any front side interconnect structures, to transfer heat away from the semiconductor devices and towards a heat spreader.

公开(公告)号：US11133261B2

公开(公告)日：2021-09-28

申请号：US15845336

申请日：2017-12-18

Applicant: Intel Corporation

Inventor： Eng Huat Goh ,  Min Suet Lim ,  Chee Kheong Yoon ,  Jia Yan Go

IPC: H01L23/538 ,  H01L25/10 ,  H05K1/18 ,  H01L25/00 ,  H01L25/18 ,  H01L23/18 ,  H01L25/065 ,  H01L23/498 ,  H01L23/31

Abstract: An electronic device may be a first package. The first package may include a first substrate having a first mounting surface. A first die may be coupled to the first mounting surface. A first interconnect region may be laterally spaced from the first die. The first package may be interconnected with a second package. The second package may include a second die coupled to a second mounting surface. Interconnection of the first package with the second package may establish one or more electrical communication pathways between the first package and the second package. The interconnection of the first package with the second package may interconnect the first die with the second die such that the first die and second die are in communication only through the one or more electrical communication pathways.