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1.发明授权公开(公告)号：US09537495B2
公开(公告)日：2017-01-03
申请号：US14857145
申请日：2015-09-17
Applicant: Intel Corporation
Inventor： Cho-Ying Lu , William Yee Li , Khoa Minh Nguyen , Ashoke Ravi , Maneesha Yellepeddi , Binta M. Patel
CPC classification number: H03L7/085 , H03L1/00 , H03L7/08 , H03L7/091 , H03L7/0991 , H03L7/0992 , H03L2207/50
Abstract: A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.
Abstract translation: 公开了一种用于分配表征和校准参数的系统。 该系统包括频率测量电路和有限状态机。 频率测量电路被配置为测量振荡信号的频率并产生包括测量频率的测量信号。 有限状态机被配置为通过频率测量电路来控制测量，基于测量信号为参数分配表征，并且基于所表征的参数来产生校准信号。
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公开(公告)号：US10340923B2
公开(公告)日：2019-07-02
申请号：US15354066
申请日：2016-11-17
Applicant: Intel Corporation
Inventor： Cho-Ying Lu , William Yee Li , Khoa Minh Nguyen , Ashoke Ravi , Maneesha Yellepeddi , Binta M. Patel
Abstract: A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.
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3.发明申请公开(公告)号：US20170070232A1
公开(公告)日：2017-03-09
申请号：US15354066
申请日：2016-11-17
Applicant: Intel Corporation
Inventor： Cho-Ying Lu , William Yee Li , Khoa Minh Nguyen , Ashoke Ravi , Maneesha Yellepeddi , Binta M. Patel
CPC classification number: H03L7/085 , H03L1/00 , H03L7/08 , H03L7/091 , H03L7/0991 , H03L7/0992 , H03L2207/50
Abstract: A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.
Abstract translation: 公开了一种用于分配表征和校准参数的系统。 该系统包括频率测量电路和有限状态机。 频率测量电路被配置为测量振荡信号的频率并产生包括测量频率的测量信号。 有限状态机被配置为通过频率测量电路来控制测量，基于测量信号为参数分配表征，并且基于所表征的参数来产生校准信号。
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Patent Agency Ranking
公开(公告)号：US20190393880A1
公开(公告)日：2019-12-26
申请号：US16458609
申请日：2019-07-01
Applicant: Intel Corporation
Inventor： Cho-Ying Lu , William Yee Li , Khoa Minh Nguyen , Ashoke Ravi , Maneesha Yellepeddi , Binta M. Patel
Abstract: A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.
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公开(公告)号：US10205456B2
公开(公告)日：2019-02-12
申请号：US15441603
申请日：2017-02-24
Applicant: Intel Corporation
Inventor： Cho-Ying Lu , William Yee Li , Khoa Minh Nguyen , Ashoke Ravi , Maneesha Yellepeddi , Binta M. Patel
Abstract: A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.
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公开(公告)号：US20170170833A1
公开(公告)日：2017-06-15
申请号：US15441603
申请日：2017-02-24
Applicant: Intel Corporation
Inventor： Cho-Ying Lu , William Yee Li , Khoa Minh Nguyen , Ashoke Ravi , Maneesha Yellepeddi , Binta M. Patel
CPC classification number: H03L7/085 , H03L1/00 , H03L7/08 , H03L7/091 , H03L7/0991 , H03L7/0992 , H03L2207/50
Abstract: A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.
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7.发明申请公开(公告)号：US20160079992A1
公开(公告)日：2016-03-17
申请号：US14857145
申请日：2015-09-17
Applicant: Intel Corporation
Inventor： Cho-Ying Lu , William Yee Li , Khoa Minh Nguyen , Ashoke Ravi , Maneesha Yellepeddi , Binta M. Patel
CPC classification number: H03L7/085 , H03L1/00 , H03L7/08 , H03L7/091 , H03L7/0991 , H03L7/0992 , H03L2207/50
Abstract: A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.
Abstract translation: 公开了一种用于分配表征和校准参数的系统。 该系统包括频率测量电路和有限状态机。 频率测量电路被配置为测量振荡信号的频率并产生包括测量频率的测量信号。 有限状态机被配置为通过频率测量电路来控制测量，基于测量信号为参数分配表征，并且基于所表征的参数来产生校准信号。
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8.发明授权公开(公告)号：US09148153B2
公开(公告)日：2015-09-29
申请号：US14143116
申请日：2013-12-30
Applicant: Intel Corporation
Inventor： Cho-Ying Lu , William Yee Li , Khoa Minh Nguyen , Ashoke Ravi , Maneesha Yellepeddi , Binta M. Patel
CPC classification number: H03L7/085 , H03L1/00 , H03L7/08 , H03L7/091 , H03L7/0991 , H03L7/0992 , H03L2207/50
Abstract: A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.
Abstract translation: 公开了一种用于分配表征和校准参数的系统。 该系统包括频率测量电路和有限状态机。 频率测量电路被配置为测量振荡信号的频率并产生包括测量频率的测量信号。 有限状态机被配置为通过频率测量电路来控制测量，基于测量信号为参数分配表征，并且基于所表征的参数来产生校准信号。
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