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    Methods and apparatuses for determining a parameter of a die
    1.
    发明授权
    Methods and apparatuses for determining a parameter of a die 有权

    公开(公告)号：US10109551B2

    公开(公告)日：2018-10-23

    申请号：US14854487

    申请日：2015-09-15

    Applicant: Intel Corporation

    Inventor： Cho-Ying Lu ,  Matthias Eberlein ,  Hyung-Jin Lee

    IPC: H01L23/34 ,  H01L27/16

    Abstract: Embodiments of the present disclosure provide techniques and configurations for integrally determining a parameter (e.g., temperature) of a die of an integrated circuit. In one instance, the apparatus may comprise a die including a first (e.g., remote) area and a second (e.g., local) area disposed at a distance from the first area, and circuitry to determine a parameter associated with the remote area of the die. The circuitry may include: a first sensing device disposed in the remote area, to provide first readings associated with the parameter; a second sensing device disposed in the local area, to provide second readings associated with the parameter; and a control module coupled with the sensing devices and disposed in the local area, to facilitate a determination of the parameter based on the first and second readings provided by the first and second sensing devices. Other embodiments may be described and/or claimed.

    Time-interleaved analog-to-digital converter with calibration
    2.
    发明授权
    Time-interleaved analog-to-digital converter with calibration 有权

    公开(公告)号：US11057044B2

    公开(公告)日：2021-07-06

    申请号：US16876942

    申请日：2020-05-18

    Applicant: Intel Corporation

    Inventor： Cho-Ying Lu

    IPC: H03M1/10 ,  H03M1/12 ,  H03M1/16 ,  H03M1/06

    Abstract: An apparatus is provided to calibrate an analog-to-digital converter (ADC). The apparatus includes a calibration circuitry coupled to an output of the ADC, wherein the calibration circuitry is to identify a maximum value and minimum value of the output of the ADC, and is to calibrate one or more performance parameters of the ADC according to the maximum and minimum values. The performance parameters include: gain of the ADC, offset of the ADC, and timing skew between the ADC and a neighboring ADC.

    METHODS AND APPARATUSES FOR DETERMINING A PARAMETER OF A DIE
    4.
    发明申请
    METHODS AND APPARATUSES FOR DETERMINING A PARAMETER OF A DIE 审中-公开
    用于确定DIE参数的方法和装置

    公开(公告)号：US20170074924A1

    公开(公告)日：2017-03-16

    申请号：US14854487

    申请日：2015-09-15

    Applicant: Intel Corporation

    Inventor： Cho-Ying Lu ,  Matthias Eberlein ,  Hyung-Jin Lee

    IPC: G01R31/28 ,  H01L23/34 ,  H01L27/16

    CPC classification number: H01L23/34 ,  H01L27/16

    Abstract: Embodiments of the present disclosure provide techniques and configurations for integrally determining a parameter (e.g., temperature) of a die of an integrated circuit. In one instance, the apparatus may comprise a die including a first (e.g., remote) area and a second (e.g., local) area disposed at a distance from the first area, and circuitry to determine a parameter associated with the remote area of the die. The circuitry may include: a first sensing device disposed in the remote area, to provide first readings associated with the parameter; a second sensing device disposed in the local area, to provide second readings associated with the parameter; and a control module coupled with the sensing devices and disposed in the local area, to facilitate a determination of the parameter based on the first and second readings provided by the first and second sensing devices. Other embodiments may be described and/or claimed.

    Abstract translation: 本公开的实施例提供用于整体确定集成电路的管芯的参数（例如，温度）的技术和配置。 在一个实例中，该装置可以包括一个管芯，该管芯包括设置在与第一区域相距一定距离的第一（例如，远程）区域和第二区域（例如，局部）区域，以及用于确定与该区域的偏远区域相关联的参数的电路 死。 电路可以包括：设置在远程区域中的第一感测装置，以提供与参数相关联的第一读数; 设置在所述局部区域中的第二感测装置，以提供与所述参数相关联的第二读数; 以及与感测装置耦合并设置在局部区域中的控制模块，以便于基于由第一和第二感测装置提供的第一和第二读数确定参数。 可以描述和/或要求保护其他实施例。

    Systems and methods for frequency domain calibration and characterization
    5.
    发明授权
    Systems and methods for frequency domain calibration and characterization 有权
    用于频域校准和表征的系统和方法

    公开(公告)号：US09537495B2

    公开(公告)日：2017-01-03

    申请号：US14857145

    申请日：2015-09-17

    Applicant: Intel Corporation

    Inventor： Cho-Ying Lu ,  William Yee Li ,  Khoa Minh Nguyen ,  Ashoke Ravi ,  Maneesha Yellepeddi ,  Binta M. Patel

    IPC: H03L7/08 ,  H03L7/099 ,  H03L1/00

    CPC classification number: H03L7/085 ,  H03L1/00 ,  H03L7/08 ,  H03L7/091 ,  H03L7/0991 ,  H03L7/0992 ,  H03L2207/50

    Abstract: A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.

    Abstract translation: 公开了一种用于分配表征和校准参数的系统。 该系统包括频率测量电路和有限状态机。 频率测量电路被配置为测量振荡信号的频率并产生包括测量频率的测量信号。 有限状态机被配置为通过频率测量电路来控制测量，基于测量信号为参数分配表征，并且基于所表征的参数来产生校准信号。

    Systems and Methods for Frequency Domain Calibration and Characterization
    8.
    发明申请
    Systems and Methods for Frequency Domain Calibration and Characterization 审中-公开
    频域校准和表征的系统和方法

    公开(公告)号：US20170070232A1

    公开(公告)日：2017-03-09

    申请号：US15354066

    申请日：2016-11-17

    Applicant: Intel Corporation

    Inventor： Cho-Ying Lu ,  William Yee Li ,  Khoa Minh Nguyen ,  Ashoke Ravi ,  Maneesha Yellepeddi ,  Binta M. Patel

    IPC: H03L7/099 ,  H03L7/091 ,  H03L1/00

    CPC classification number: H03L7/085 ,  H03L1/00 ,  H03L7/08 ,  H03L7/091 ,  H03L7/0991 ,  H03L7/0992 ,  H03L2207/50

    Abstract: A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.

    Abstract translation: 公开了一种用于分配表征和校准参数的系统。 该系统包括频率测量电路和有限状态机。 频率测量电路被配置为测量振荡信号的频率并产生包括测量频率的测量信号。 有限状态机被配置为通过频率测量电路来控制测量，基于测量信号为参数分配表征，并且基于所表征的参数来产生校准信号。

    TIME-INTERLEAVED ANALOG-TO-DIGITAL CONVERTER WITH CALIBRATION
    9.
    发明申请
    TIME-INTERLEAVED ANALOG-TO-DIGITAL CONVERTER WITH CALIBRATION 审中-公开

    公开(公告)号：US20200280321A1

    公开(公告)日：2020-09-03

    申请号：US16876942

    申请日：2020-05-18

    Applicant: Intel Corporation

    Inventor： Cho-Ying Lu

    IPC: H03M1/12 ,  H03M1/16 ,  H03M1/06 ,  H03M1/10

    Abstract: An apparatus is provided to calibrate an analog-to-digital converter (ADC). The apparatus includes a calibration circuitry coupled to an output of the ADC, wherein the calibration circuitry is to identify a maximum value and minimum value of the output of the ADC, and is to calibrate one or more performance parameters of the ADC according to the maximum and minimum values. The performance parameters include: gain of the ADC, offset of the ADC, and timing skew between the ADC and a neighboring ADC.

    Time-interleaved analog-to-digital converter with calibration
    10.
    发明授权
    Time-interleaved analog-to-digital converter with calibration 有权

    公开(公告)号：US10659072B1

    公开(公告)日：2020-05-19

    申请号：US16221394

    申请日：2018-12-14

    Applicant: Intel Corporation

    Inventor： Cho-Ying Lu

    IPC: H03M1/10 ,  H03M1/12 ,  H03M1/16 ,  H03M1/06

    Abstract: An apparatus is provided to calibrate an analog-to-digital converter (ADC). The apparatus includes a calibration circuitry coupled to an output of the ADC, wherein the calibration circuitry is to identify a maximum value and minimum value of the output of the ADC, and is to calibrate one or more performance parameters of the ADC according to the maximum and minimum values. The performance parameters include: gain of the ADC, offset of the ADC, and timing skew between the ADC and a neighboring ADC.

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