Semiconductor package floating metal checks

    公开(公告)号:US10423751B2

    公开(公告)日:2019-09-24

    申请号:US15719698

    申请日:2017-09-29

    IPC分类号: G06F17/50

    摘要: Embodiments of the invention include methods, systems, and computer program products for checking floating metals in a laminate structure. Aspects of the invention include receiving, by a processor, floating metal rules and a semiconductor package design having a plurality of laminate layers. Each laminate layer includes a plurality of metal shapes, a plurality of signal lines, and a plurality of vias. The metal shapes, signal lines, and vias are mapped to one or more cells in an array. The processor determines, for each cell corresponding to a metal shape, whether the plurality of vias satisfies the floating metal rules. The processor can suggest new vias to satisfy the floating metal rules.

    Semiconductor package floating metal checks

    公开(公告)号:US10949600B2

    公开(公告)日:2021-03-16

    申请号:US16539120

    申请日:2019-08-13

    摘要: Embodiments of the invention include methods, systems, and computer program products for checking floating metals in a laminate structure. Aspects of the invention include receiving, by a processor, floating metal rules and a semiconductor package design having a plurality of laminate layers. Each laminate layer includes a plurality of metal shapes, a plurality of signal lines, and a plurality of vias. The metal shapes, signal lines, and vias are mapped to one or more cells in an array. The processor determines, for each cell corresponding to a metal shape, whether the plurality of vias satisfies the floating metal rules. The processor can suggest new vias to satisfy the floating metal rules.

    Dedicated Integrated Circuit Chip Carrier Plane Connected to Decoupling Capacitor(s)

    公开(公告)号:US20200075468A1

    公开(公告)日:2020-03-05

    申请号:US16120782

    申请日:2018-09-04

    摘要: An integrated circuit (IC) chip carrier includes one or more internal metal planes. A dedicated metal plane (DMP) may be formed upon a metal plane dielectric layer. The metal plane dielectric layer may be formed upon a first dielectric layer that is formed upon an IC chip carrier core. The DMP may be formed of the same or different material relative to the material of the wires of the IC chip carrier. The side surfaces of the DMP may be coplanar with associated side surfaces of the IC chip carrier. The DMP may transfer heat from the IC chip horizontally to its side surfaces. A decoupling capacitor is externally connected to the IC chip carrier and is electrically connected to the DMP. By connecting the decoupling capacitor to the DMP, the decoupling capacitor may further reduce inductance and noise within the IC chip system.

    SEMICONDUCTOR PACKAGE FLOATING METAL CHECKS
    9.
    发明申请

    公开(公告)号:US20190102505A1

    公开(公告)日:2019-04-04

    申请号:US15719698

    申请日:2017-09-29

    IPC分类号: G06F17/50

    摘要: Embodiments of the invention include methods, systems, and computer program products for checking floating metals in a laminate structure. Aspects of the invention include receiving, by a processor, floating metal rules and a semiconductor package design having a plurality of laminate layers. Each laminate layer includes a plurality of metal shapes, a plurality of signal lines, and a plurality of vias. The metal shapes, signal lines, and vias are mapped to one or more cells in an array. The processor determines, for each cell corresponding to a metal shape, whether the plurality of vias satisfies the floating metal rules. The processor can suggest new vias to satisfy the floating metal rules.