RETENTION OPTIMIZED MEMORY DEVICE USING PREDICTIVE DATA INVERSION
    1.
    发明申请
    RETENTION OPTIMIZED MEMORY DEVICE USING PREDICTIVE DATA INVERSION 有权
    使用预测数据反转保留优化的存储器件

    公开(公告)号:US20140313834A1

    公开(公告)日:2014-10-23

    申请号:US13868884

    申请日:2013-04-23

    Abstract: A method for storing data. The method includes providing an addressable memory including a memory space, wherein the memory space includes a plurality of memory cells. The method includes configuring the addressable memory such that a majority of the plurality of memory cells in the memory space stores internal data values in a preferred bias condition when a first external data state of one or more external data states is written to the memory space, wherein the first external data state is opposite the preferred bias condition.

    Abstract translation: 一种存储数据的方法。 该方法包括提供包括存储器空间的可寻址存储器,其中存储器空间包括多个存储器单元。 该方法包括配置可寻址存储器,使得当将一个或多个外部数据状态的第一外部数据状态写入存储器空间时,存储器空间中的多个存储器单元的大部分将内部数据值存储在优选偏置条件中, 其中所述第一外部数据状态与所述偏好条件相反。

    Self Healing Compute Array
    2.
    发明申请

    公开(公告)号:US20180173600A1

    公开(公告)日:2018-06-21

    申请号:US15849468

    申请日:2017-12-20

    Abstract: This disclosure pertains to hardware compute arrays (sometimes called systolic arrays) for applications such as artificial intelligence (AI), machine learning (ML), digital signal processing (DSP), graphics processing units (GPUs), and other computationally intensive applications. More particularly, it pertains to novel and advantageous architecture innovations for efficiently and inexpensively implementing such arrays using multiple integrated circuits. Hardware and methods are disclosed to allow compute arrays to be tested after face-to-face or wafer-to-wafer bonding and without out any pre-bonding test. Defects discovered in the post-bonding testing can be completely or partially healed increasing yields and reducing costs.

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