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    System and method for an adaptive list prefetch
    1.
    发明授权
    System and method for an adaptive list prefetch 失效
    用于自适应列表预取的系统和方法

    公开(公告)号：US08185701B2

    公开(公告)日：2012-05-22

    申请号：US12025801

    申请日：2008-02-05

    申请人： Jeffrey A. Berger ,  You-Chin Fuh ,  Yue Huang ,  Hong Min ,  Terence P. Purcell ,  Kou-Horng A. Yang

    发明人： Jeffrey A. Berger ,  You-Chin Fuh ,  Yue Huang ,  Hong Min ,  Terence P. Purcell ,  Kou-Horng A. Yang

    IPC分类号： G06F13/00 ,  G06F13/28

    CPC分类号： G06F17/30442

    摘要： A method, system, and computer program product are provided for retrieving records into a main memory. A first number of gaps and a first total gap size are received for a list of records from a database subsystem. A determination is made of a first average gap size using the first number of gaps and the first total gap size. A determination is made as to whether the first average gap size is greater than a prestaging threshold value. Responsive to the first average gap size being equal to or less than the prestaging threshold value, a prestaging flag is set for the list of records. Then, the list of records is retrieved into the main memory using prestaging.

    摘要翻译： 提供了一种用于将记录检索到主存储器中的方法，系统和计算机程序产品。 从数据库子系统收到记录的第一个数量和第一个总间隙大小。 使用第一数量的间隙和第一总间隙尺寸确定第一平均间隙尺寸。 确定第一平均间隙大小是否大于预定阈值。 响应于第一平均间隙尺寸等于或小于预定阈值，为记录列表设置预置标记。 然后，使用前置记录将记录列表检索到主存储器中。

    System and Method for an Adaptive List Prefetch
    2.
    发明申请
    System and Method for an Adaptive List Prefetch 失效
    自适应列表预取的系统和方法

    公开(公告)号：US20090198738A1

    公开(公告)日：2009-08-06

    申请号：US12025801

    申请日：2008-02-05

    申请人： Jeffrey A. Berger ,  You-Chin Fuh ,  Yue Huang ,  Hong Min ,  Terence P. Purcell ,  Kou-Horng A. Yang

    发明人： Jeffrey A. Berger ,  You-Chin Fuh ,  Yue Huang ,  Hong Min ,  Terence P. Purcell ,  Kou-Horng A. Yang

    IPC分类号： G06F12/00 ,  G06F17/30

    CPC分类号： G06F17/30442

    摘要： A method, system, and computer program product are provided for retrieving records into a main memory. A first number of gaps and a first total gap size are received for a list of records from a database subsystem. A determination is made of a first average gap size using the first number of gaps and the first total gap size. A determination is made as to whether the first average gap size is greater than a prestaging threshold value. Responsive to the first average gap size being equal to or less than the prestaging threshold value, a prestaging flag is set for the list of records. Then, the list of records is retrieved into the main memory using prestaging.

    摘要翻译： 提供了一种用于将记录检索到主存储器中的方法，系统和计算机程序产品。 从数据库子系统收到记录的第一个数量和第一个总间隙大小。 使用第一数量的间隙和第一总间隙尺寸确定第一平均间隙尺寸。 确定第一平均间隙大小是否大于预定阈值。 响应于第一平均间隙尺寸等于或小于预定阈值，为记录列表设置预置标记。 然后，使用前置记录将记录列表检索到主存储器中。

    LED folding magnifier
    3.
    外观设计
    LED folding magnifier 有权

    公开(公告)号：USD1026060S1

    公开(公告)日：2024-05-07

    申请号：US29858841

    申请日：2022-11-04

    申请人： Yue Huang

    设计人： Yue Huang

    摘要： FIG. 1 is a perspective view of an LED folding magnifier showing my new design;
    FIG. 2 is another perspective view thereof;
    FIG. 3 is a front elevational view thereof;
    FIG. 4 is a rear elevational view thereof;
    FIG. 5 is a left side elevational view thereof;
    FIG. 6 is a right side elevational view thereof;
    FIG. 7 is a top plan view thereof;
    FIG. 8 is a bottom plan view thereof;
    FIG. 9 is a perspective view of the LED folding magnifier where the LED folding magnifier is in a folded state;
    FIG. 10 is a perspective view of the LED folding magnifier where the LED folding magnifier is in a configuration of use; and,
    FIG. 11 is an enlarged view of portion 11 shown in FIG. 1.
    The dash-dash broken lines in the drawings depict portions of the LED folding magnifier that form no part of the claimed design. The dot-dash broken lines represent boundaries of the enlarged portion and form no part of the claimed design.

    Monolithic Three-Axis Magnetometer
    5.
    发明申请
    Monolithic Three-Axis Magnetometer 审中-公开
    单片三轴磁力仪

    公开(公告)号：US20150309125A1

    公开(公告)日：2015-10-29

    申请号：US14262804

    申请日：2014-04-28

    申请人： Yue Huang ,  Jue Lu

    发明人： Yue Huang ,  Jue Lu

    IPC分类号： G01R33/02 ,  G01R33/00

    CPC分类号： G01R33/0206 ,  G01R33/0005 ,  G01R33/0052

    摘要： A three-axis magnetic field sensing device, a magnetometer, and methods of fabricating and testing are presented. The magnetometer comprises a plurality of sloped surfaces. A plurality of magnetic sensing units is disposed on the slopes. A magnetic field can be measured by the sensing units. Each of the three orthogonal-axis components of the magnetic field, a Euclidean vector, can then be solved by using a simple algorithm as an expression of the sensing unit measurement values and slope angles. Polarization, testing and characterization of the device could be done by applying a magnetic field along a common axis to all sensing units, along which each sensing unit has sensitivity.

    摘要翻译： 介绍了一种三轴磁场检测装置，磁力计，以及制造和测试方法。 磁力计包括多个倾斜表面。 多个磁感测单元设置在斜面上。 可以通过感测单元来测量磁场。 然后可以通过使用简单算法作为感测单元测量值和倾斜角的表达式来解决磁场的三个正交轴分量中的每一个，即欧几里得矢量。 器件的极化，测试和表征可以通过沿着公共轴施加磁场到所有感测单元来完成，每个感测单元沿着该磁场具有灵敏度。

    System and method of assessing reliability of a semiconductor
    10.
    发明申请
    System and method of assessing reliability of a semiconductor 审中-公开
    评估半导体可靠性的系统和方法

    公开(公告)号：US20080016486A1

    公开(公告)日：2008-01-17

    申请号：US11417451

    申请日：2006-05-03

    申请人： Yuen Chan ,  Yong Han Low ,  Yue Huang ,  Kok Goh ,  Kok Tan

    发明人： Yuen Chan ,  Yong Han Low ,  Yue Huang ,  Kok Goh ,  Kok Tan

    IPC分类号： G06F17/50 ,  H03K19/00 ,  H01L21/66 ,  G01R31/26

    CPC分类号： G06F17/5045 ,  G06F17/504

    摘要： A system for assessing reliability of a semiconductor product design, the system comprising a first database for storing circuits data specifying cells of available circuits for semiconductor products; an input unit for input of reliability qualification data of tested semiconductor products; an uploading unit for uploading semiconductor product design data; and a processor for processing the reliability qualification data to generate reliability data at a circuit-level, a cell-level, or both utilizing the circuits data, and for assessing the reliability of the semiconductor product design based on the generated reliability data.

    摘要翻译： 一种用于评估半导体产品设计的可靠性的系统，所述系统包括：第一数据库，用于存储指定用于半导体产品的可用电路单元的电路数据; 用于输入测试半导体产品的可靠性鉴定数据的输入单元; 用于上传半导体产品设计数据的上传单元; 以及处理器，用于处理可靠性鉴定数据，以便利用电路数据在电路级，单元级或两者产生可靠性数据，以及基于所生成的可靠性数据来评估半导体产品设计的可靠性。