摘要:
Methods and devices use in two-color measurement systems. The methods and devices include methods of making corrections, methods of calculating correction factors, fluorescence scanners, and microarray chips. The said methods and devices enable a user to correct fluorescence intensities for errors caused by the occurrence of FRET and/or cross-talk when two fluorophores are used in two-color fluorescence arrays.
摘要:
Methods and devices use in two-color measurement systems. The methods and devices include methods of making corrections, methods of calculating correction factors, fluorescence scanners, and microarray chips. The said methods and devices enable a user to correct fluorescence intensities for errors caused by the occurrence of FRET and /or cross-talk when two fluorophores are used in two-color fluorescence arrays.
摘要:
A distance measurement system comprises an optical distance sensor configured to generate a light beam, a first optical module, and a processor. The first optical module is configured to receive the light beam, and generate and selectively transmit a plurality of light beams having different light channels for projection onto one or more points of an object to generate one or more reflected light beams scattered from the respective one or more points of the object, and capture and transmit the one or more reflected light beams into the optical distance sensor to retrieve a plurality of distance data to the respective one or more points of the object. The processor is configured to process the distance data to determine position information of the respective one or more points of the object. A distance measurement method is also presented.
摘要:
A measurement system comprising a light source unit, a projection unit and an optics unit is disclosed. The light source unit is configured to generate a plurality of modulated phase shifted light beams. The projection unit is configured to reflect the modulated phase shifted light beams onto an object surface. The optics unit is configured to capture the modulated phase shifted light beams from the object surface. The measurement system further comprises a photodetector and a processor. The photodetector is configured to receive the modulated phase shifted light beams from the optics unit to generate electrical signals. The processor is configured to retrieve position information of the object surface based on the electrical signals from the photodetector. A measurement method is also presented.
摘要:
A measurement system comprising a light source unit, a projection unit and an optics unit is disclosed. The light source unit is configured to generate a plurality of modulated phase shifted light beams. The projection unit is configured to reflect the modulated phase shifted light beams onto an object surface. The optics unit is configured to capture the modulated phase shifted light beams from the object surface. The measurement system further comprises a photodetector and a processor. The photodetector is configured to receive the modulated phase shifted light beams from the optics unit to generate electrical signals. The processor is configured to retrieve position information of the object surface based on the electrical signals from the photodetector. A measurement method is also presented.