-
公开(公告)号:US20050020095A1
公开(公告)日:2005-01-27
申请号:US10487577
申请日:2002-08-14
申请人: Johannes Baur , Georg Bruderl , Alfred Lell , Walter Neu , Raimund Oberschmid
发明人: Johannes Baur , Georg Bruderl , Alfred Lell , Walter Neu , Raimund Oberschmid
IPC分类号: H01L21/28 , H01L21/268 , H01L21/324 , H01L21/26 , H01L21/00 , H01L21/84
CPC分类号: H01L21/3245 , H01L21/268
摘要: The invention relates to a method for the thermal treatment of a surface layer (4) on a semiconductor substrate (5). Laser pulses (2) generated by a laser (1) are emitted onto the surface layer (4). This method can be used to produce, in particular, ohmic contacts to III-V compound semiconductors.
摘要翻译: 本发明涉及一种用于热处理半导体衬底(5)上的表面层(4)的方法。 由激光器(1)产生的激光脉冲(2)被发射到表面层(4)上。 该方法可用于产生特别是与III-V族化合物半导体的欧姆接触。
-
公开(公告)号:US5107516A
公开(公告)日:1992-04-21
申请号:US658951
申请日:1991-02-12
申请人: Martin Dressel , Harald Gerhardt , Walter Neu
发明人: Martin Dressel , Harald Gerhardt , Walter Neu
CPC分类号: B23K26/032 , A61B18/20 , A61B18/245 , A61B5/0084 , A61B2017/00061 , A61B2018/00636 , A61B5/0071 , A61B5/0075 , A61B5/0086
摘要: Apparatus for controlled ablation of material from a predetermined working point, comprising a first laser, in particular excimer laser, for generating laser radiation pulses having a wavelength in a wavelength range suitable for the ablation, in particular in the ultraviolet spectral range, further comprising a radiation analyzer such as a spectrometer for analysis of material-specific radiation from the ablation plume forming at the working point, and a second laser, in particular a tunable dye laser, for generating a further laser radiation in a wavelength range which is different from said first wavelength range and which is better suited for the resonant stimulation of the radiation serving for the analysis than the ablation radiation wavelength range.
摘要翻译: 用于从预定工作点受控烧蚀材料的装置,包括第一激光器,特别是准分子激光器,用于产生具有适于消融的波长范围内的波长的激光辐射脉冲,特别是在紫外光谱范围内,还包括 辐射分析仪,例如用于分析在工作点处形成的消融羽流的材料特定辐射的光谱仪;以及第二激光器,特别是可调染料激光器,用于产生与所述激光束不同的波长范围内的另外的激光辐射 第一波长范围,并且其比消融辐射波长范围更适合于用于分析的辐射的共振刺激。
-