Method of shaping polycrystalline diamond
    1.
    发明授权
    Method of shaping polycrystalline diamond 失效
    多晶金刚石成型方法

    公开(公告)号:US5500157A

    公开(公告)日:1996-03-19

    申请号:US368581

    申请日:1995-01-04

    CPC分类号: G02B1/02 B24D3/00

    摘要: A technique that involves selective removal of material from a surface of a polycrystalline diamond (polyD) film such that a non-planar surface results. Exemplarily the technique is used to form polyD optical elements, e.g., convex or concave lenses, or Fresnel lenses, including arrays of such lenses. The technique involves maintaining on appropriately shaped hot template body in intimate contact with a polyD surface for a time (e.g., in the range 1-1000 hours) sufficient to result in formation of the desired feature in the polyD surface. The template body involves a rare earth metal (La and Ce are preferred), Mn and/or Fe, and the temperature is below the melting temperature of the template body. Removal of "spent" template material by, e.g., chemical etching and finishing of the polyD feature, e.g., by laser ablation and/or polishing, are contemplated.

    摘要翻译: 涉及从多晶金刚石(polyD)膜的表面选择性地去除材料从而形成非平面表面的技术。 示例性地,该技术用于形成多晶光学元件,例如凸透镜或凹透镜,或菲涅尔透镜,包括这种透镜的阵列。 该技术涉及将适当形状的热模板主体与polyD表面紧密接触一段时间(例如,在1-1000小时内),足以导致在polyD表面中形成所需特征。 模板体包括稀土金属(优选La和Ce),Mn和/或Fe,温度低于模板体的熔融温度。 考虑通过例如通过激光烧蚀和/或抛光的polyD特征的化学蚀刻和整理来去除“已用”模板材料。

    Apparatus for simultaneously measuring the thickness of, and the optical
intensity transmitted through, a sample body
    3.
    发明授权
    Apparatus for simultaneously measuring the thickness of, and the optical intensity transmitted through, a sample body 失效
    用于同时测量透射通过样本体的厚度和光强度的装置

    公开(公告)号:US5625449A

    公开(公告)日:1997-04-29

    申请号:US509410

    申请日:1995-07-31

    IPC分类号: G01N21/59

    CPC分类号: G01N21/59

    摘要: A portion of a surface of a sample body is arranged to receive an incident optical beam having an optical intensity I.sub.0. On an opposing surface of the sample body is located an optical detector which senses the intensity I of the resulting optical radiation emerging from the opposing surface of the sample body. In order to measure the thickness t of the sample body, a thickness gauge is located either at another portion of the surface of the sample body or on the optical detector.

    摘要翻译: 样品体的表面的一部分被布置成接收具有光强度I0的入射光束。 在样本体的相对表面上设置有光学检测器,其感测从样品体的相对表面出射的所得光学辐射的强度I. 为了测量样品体的厚度t,厚度计位于样品体表面的另一部分或光学检测器上。

    Method of determining the thermal resistivity of electrically insulating
crystalline materials
    4.
    发明授权
    Method of determining the thermal resistivity of electrically insulating crystalline materials 失效
    确定电绝缘结晶材料的热阻的方法

    公开(公告)号:US5620253A

    公开(公告)日:1997-04-15

    申请号:US509678

    申请日:1995-07-31

    IPC分类号: G01N25/18 G01N25/20

    CPC分类号: G01N25/18

    摘要: The thermal resistivities W.sub.s (=1/.kappa..sub.s) of electrically insulating, crystalline or polycrystalline samples under test (SUTs), all comprising host material such as CVD diamond, can be determined rather quickly once the thermal resistivities W=1/.kappa. of at least two other host crystalline or polycrystalline bodies B.sub.1 and B.sub.2 comprising the same host material as that of the SUTs, and containing the same type of impurity or combination of impurities as the SUTs, are measured by some other technique. These determinations of these thermal resistivities W.sub.s of the SUTs thus require only the measurements of the optical absorptivities .alpha..sub.1 and .alpha..sub.2 and of the thermal resistivities W.sub.1 and W.sub.2, respectively, of at least each of the two other bodies B.sub.1 and B.sub.2 and only of the optical absorptivities .alpha..sub.s of each of the SUTs by such other technique. These determinations of W.sub.s rely on our discovery that the following linear relationship exists: W=A+C.alpha., where A and C are constants so long as the type of impurity or combination of impurities in all the bodies B.sub.1, B.sub.2, and SUTs is the same, even though the impurities or combination of impurities have different concentrations in the bodies B.sub.1 and B.sub.2, as well as in the SUTs.

    摘要翻译: 一旦热电阻率W = 1 / kappa,所有包含主体材料如CVD金刚石的电绝缘,晶体或多晶样品(SUT)的热电阻W s(= 1 / kappa s)可以相当快速地确定 通过一些其它技术测量包含与SUT相同的主体材料,并且含有相同类型的杂质或杂质作为SUT的至少两个其它主体结晶或多晶体B1和B2。 因此,SUT的这些热电阻Ws的这些确定因此仅需要分别测量两个其它物体B1和B2中的至少每一个的光吸收率α1和α2以及热电阻率W1和W2,并且仅 通过这种其他技术,每个SUT的光吸收率αs。 W的这些测定依赖于我们的发现,存在以下线性关系:W = A + Cα,其中A和C是常数,只要所有物质B1,B2和SUT中的杂质类型或杂质的组合是 即使杂质或杂质的组合在体B1和B2以及SUT中也具有不同的浓度。

    Measuring thermal conductivity and apparatus therefor
    6.
    发明授权
    Measuring thermal conductivity and apparatus therefor 失效
    测量导热系数及其设备

    公开(公告)号:US5297868A

    公开(公告)日:1994-03-29

    申请号:US81726

    申请日:1993-06-23

    申请人: John E. Graebner

    发明人: John E. Graebner

    IPC分类号: G01N25/18 G01N25/20

    CPC分类号: G01N25/18

    摘要: In order to measure the in-plane thermal conductivity of a sample plate, the plate is placed in a prefabricated device containing (1) a pair of thermocouples, (2) a source of heat flow into the plate, (3) a heat sink of the heat flow having an open cavity, (4) a taut membrane, on which the source of heat flow and the thermocouples are bonded, located on the resilient filling, (5) a resilient filling of thermally insulating material located underneath the membrane, in the cavity of the heat sink, and (6) a thermally insulating medium covering the plate and exerting a compressive force on it.

    摘要翻译: 为了测量样品板的面内热导率,将板放置在预制装置中,其中包含(1)一对热电偶,(2)热流入板中的源,(3)散热器 具有开放空腔的热流;(4)位于弹性填充物上的热流源和热电偶接合的拉紧膜,(5)位于膜下方的绝热材料的弹性填充物, 在散热器的空腔中,以及(6)覆盖该板并在其上施加压缩力的隔热介质。