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    Method of shaping polycrystalline diamond
    2.
    发明授权
    Method of shaping polycrystalline diamond 失效
    多晶金刚石成型方法

    公开(公告)号：US5500157A

    公开(公告)日：1996-03-19

    申请号：US368581

    申请日：1995-01-04

    申请人： John E. Graebner ,  Sungho Jin ,  Raymond Wolfe

    发明人： John E. Graebner ,  Sungho Jin ,  Raymond Wolfe

    IPC分类号： C30B29/04 ,  B24D3/00 ,  C30B33/00 ,  G02B1/02 ,  G02B3/00 ,  B29D11/00

    CPC分类号： G02B1/02 ,  B24D3/00

    摘要： A technique that involves selective removal of material from a surface of a polycrystalline diamond (polyD) film such that a non-planar surface results. Exemplarily the technique is used to form polyD optical elements, e.g., convex or concave lenses, or Fresnel lenses, including arrays of such lenses. The technique involves maintaining on appropriately shaped hot template body in intimate contact with a polyD surface for a time (e.g., in the range 1-1000 hours) sufficient to result in formation of the desired feature in the polyD surface. The template body involves a rare earth metal (La and Ce are preferred), Mn and/or Fe, and the temperature is below the melting temperature of the template body. Removal of "spent" template material by, e.g., chemical etching and finishing of the polyD feature, e.g., by laser ablation and/or polishing, are contemplated.

    摘要翻译： 涉及从多晶金刚石（polyD）膜的表面选择性地去除材料从而形成非平面表面的技术。 示例性地，该技术用于形成多晶光学元件，例如凸透镜或凹透镜，或菲涅尔透镜，包括这种透镜的阵列。 该技术涉及将适当形状的热模板主体与polyD表面紧密接触一段时间（例如，在1-1000小时内），足以导致在polyD表面中形成所需特征。 模板体包括稀土金属（优选La和Ce），Mn和/或Fe，温度低于模板体的熔融温度。 考虑通过例如通过激光烧蚀和/或抛光的polyD特征的化学蚀刻和整理来去除“已用”模板材料。

    Apparatus for simultaneously measuring the thickness of, and the optical intensity transmitted through, a sample body
    3.
    发明授权
    Apparatus for simultaneously measuring the thickness of, and the optical intensity transmitted through, a sample body 失效
    用于同时测量透射通过样本体的厚度和光强度的装置

    公开(公告)号：US5625449A

    公开(公告)日：1997-04-29

    申请号：US509410

    申请日：1995-07-31

    申请人： John E. Graebner ,  Sungho Jin

    发明人： John E. Graebner ,  Sungho Jin

    IPC分类号： G01N21/59

    CPC分类号： G01N21/59

    摘要： A portion of a surface of a sample body is arranged to receive an incident optical beam having an optical intensity I.sub.0. On an opposing surface of the sample body is located an optical detector which senses the intensity I of the resulting optical radiation emerging from the opposing surface of the sample body. In order to measure the thickness t of the sample body, a thickness gauge is located either at another portion of the surface of the sample body or on the optical detector.

    摘要翻译： 样品体的表面的一部分被布置成接收具有光强度I0的入射光束。 在样本体的相对表面上设置有光学检测器，其感测从样品体的相对表面出射的所得光学辐射的强度I. 为了测量样品体的厚度t，厚度计位于样品体表面的另一部分或光学检测器上。

    Method of determining the thermal resistivity of electrically insulating crystalline materials
    4.
    发明授权
    Method of determining the thermal resistivity of electrically insulating crystalline materials 失效
    确定电绝缘结晶材料的热阻的方法

    公开(公告)号：US5620253A

    公开(公告)日：1997-04-15

    申请号：US509678

    申请日：1995-07-31

    申请人： John E. Graebner ,  Sungho Jin

    发明人： John E. Graebner ,  Sungho Jin

    IPC分类号： G01N25/18 ,  G01N25/20

    CPC分类号： G01N25/18

    摘要： The thermal resistivities W.sub.s (=1/.kappa..sub.s) of electrically insulating, crystalline or polycrystalline samples under test (SUTs), all comprising host material such as CVD diamond, can be determined rather quickly once the thermal resistivities W=1/.kappa. of at least two other host crystalline or polycrystalline bodies B.sub.1 and B.sub.2 comprising the same host material as that of the SUTs, and containing the same type of impurity or combination of impurities as the SUTs, are measured by some other technique. These determinations of these thermal resistivities W.sub.s of the SUTs thus require only the measurements of the optical absorptivities .alpha..sub.1 and .alpha..sub.2 and of the thermal resistivities W.sub.1 and W.sub.2, respectively, of at least each of the two other bodies B.sub.1 and B.sub.2 and only of the optical absorptivities .alpha..sub.s of each of the SUTs by such other technique. These determinations of W.sub.s rely on our discovery that the following linear relationship exists: W=A+C.alpha., where A and C are constants so long as the type of impurity or combination of impurities in all the bodies B.sub.1, B.sub.2, and SUTs is the same, even though the impurities or combination of impurities have different concentrations in the bodies B.sub.1 and B.sub.2, as well as in the SUTs.

    摘要翻译： 一旦热电阻率W = 1 / kappa，所有包含主体材料如CVD金刚石的电绝缘，晶体或多晶样品（SUT）的热电阻W s（= 1 / kappa s）可以相当快速地确定 通过一些其它技术测量包含与SUT相同的主体材料，并且含有相同类型的杂质或杂质作为SUT的至少两个其它主体结晶或多晶体B1和B2。 因此，SUT的这些热电阻Ws的这些确定因此仅需要分别测量两个其它物体B1和B2中的至少每一个的光吸收率α1和α2以及热电阻率W1和W2，并且仅 通过这种其他技术，每个SUT的光吸收率αs。 W的这些测定依赖于我们的发现，存在以下线性关系：W = A + Cα，其中A和C是常数，只要所有物质B1，B2和SUT中的杂质类型或杂质的组合是 即使杂质或杂质的组合在体B1和B2以及SUT中也具有不同的浓度。

    Article comprising metal oxide nanostructures
    6.
    发明授权
    Article comprising metal oxide nanostructures 失效
    文章包含金属氧化物纳米结构

    公开(公告)号：US08659217B2

    公开(公告)日：2014-02-25

    申请号：US11892737

    申请日：2007-08-27

    申请人： Dong-Wook Kim ,  Sungho Jin ,  In-Kyung Yoo

    发明人： Dong-Wook Kim ,  Sungho Jin ,  In-Kyung Yoo

    IPC分类号： H01J1/62

    CPC分类号： H01J31/127 ,  H01J9/025 ,  H01J2201/30469 ,  H01J2329/0431 ,  H01J2329/0455 ,  Y10S977/742

    摘要： This invention includes field emitters, in particular, electron field emitters with metal oxide nanoscale, aligned and sharped-tip emitter structures, the metal oxide emitter structures being a plurality of carbon nanostructures supported by and projecting from a substrate and including a metal oxide coating overlying the surfaces of the plurality of carbon nanostructures.

    摘要翻译： 本发明包括场致发射体，特别是具有金属氧化物纳米尺度，排列和锐尖发射极结构的电子场发射体，金属氧化物发射体结构是多个碳纳米结构，由碳纳米结构支撑并从衬底突出，并包括覆盖上面的金属氧化物涂层 多个碳纳米结构的表面。

    Articles comprising high-electrical-conductivity nanocomposite material and method for fabricating same
    9.
    发明授权
    Articles comprising high-electrical-conductivity nanocomposite material and method for fabricating same 有权
    包含高导电性纳米复合材料的制品及其制造方法

    公开(公告)号：US07959830B2

    公开(公告)日：2011-06-14

    申请号：US10584680

    申请日：2004-12-23

    申请人： Sungho Jin

    发明人： Sungho Jin

    IPC分类号： H01B1/02 ,  B32B3/02 ,  B22F3/00 ,  H01L21/763

    CPC分类号： H01B1/026 ,  B22F1/0018 ,  B22F2998/00 ,  B22F2998/10 ,  B22F2999/00 ,  B82Y30/00 ,  C22C47/04 ,  C25D5/48 ,  C25D15/02 ,  H01L23/3732 ,  H01L2924/0002 ,  Y10T428/12049 ,  Y10T428/12493 ,  Y10T428/12576 ,  Y10T428/12771 ,  Y10T428/25 ,  Y10T428/26 ,  Y10T428/2991 ,  B22F2207/03 ,  B22F1/025 ,  B22F1/0085 ,  B22F3/02 ,  B22F3/10 ,  B22F2201/01 ,  H01L2924/00

    摘要： This invention discloses novel nanocomposite material structures which are strong, highly conductive, and fatigue-resistant. It also discloses novel fabrication techniques to obtain such structures. The new nanocomposite materials comprise a high-conductivity base metal, such as copper, incorporating high-conductivity dispersoid particles that simultaneously minimize field enhancements, maintain good thermal conductivity, and enhance mechanical strength. The use of metal nanoparticles with electrical conductivity comparable to that of the base automatically removes the regions of higher RF field and enhanced current density. Additionally, conductive nanoparticles will reduce the surface's sensitivity to arc or sputtering damage. If the surface is sputtered away to uncover the nanoparticles, their properties will not be dramatically different from the base surface. Most importantly, the secondary electron emission coefficients of all materials in the nanocomposite are small and close to unity, whereas the previously used insulating particles can produce significant and undesirable electron multiplication.

    摘要翻译： 本发明公开了具有强的，高导电性和耐疲劳性的新型纳米复合材料结构。 它还公开了获得这种结构的新型制造技术。 新的纳米复合材料包括高导电性贱金属（例如铜），其结合了高导电性分散质颗粒，同时最小化场增强，保持良好的导热性和增强机械强度。 使用具有与碱性电导率相当的导电性的金属纳米粒子自动去除较高RF场的区域和增强的电流密度。 另外，导电纳米颗粒将降低表面对电弧或溅射损伤的敏感性。 如果表面被溅射以揭开纳米颗粒，它们的性质将不会与基底表面显着不同。 最重要的是，纳米复合材料中所有材料的二次电子发射系数很小，接近于单一，而先前使用的绝缘颗粒可以产生显着和不期望的电子倍增。

    Probe system comprising an electric-field-aligned probe tip and method for fabricating the same
    10.
    发明授权
    Probe system comprising an electric-field-aligned probe tip and method for fabricating the same 有权
    包括电场对准探针尖端的探针系统及其制造方法

    公开(公告)号：US07735147B2

    公开(公告)日：2010-06-08

    申请号：US12088223

    申请日：2006-10-10

    申请人： Sungho Jin ,  Li-Han Chen ,  I-Chen Chen

    发明人： Sungho Jin ,  Li-Han Chen ,  I-Chen Chen

    IPC分类号： H01J37/06

    CPC分类号： H01J9/025 ,  C01B32/162 ,  C01B32/18 ,  G01Q60/38 ,  G01Q60/56 ,  G01Q70/12 ,  G11B9/1409 ,  H01J1/3044 ,  H01J2201/30407 ,  H01J2201/30469 ,  Y10T428/11

    摘要： A mechanically stable and oriented scanning probe tip comprising a carbon nanotube having a base with gradually decreasing diameter, with a sharp tip at the probe tip. Such a tip or an array of tips is produced by depositing a catalyst metal film on a substrate (10 & 12 in FIG. 1(a)), depositing a carbon dot (14 in FIG. 1(b)) on the catalyst metal film, etching away the catalyst metal film (FIG. 1(c)) not masked by the carbon dot, removing the carbon dot from the catalyst metal film to expose the catalyst metal film (FIG. 1(d)), and growing a carbon nanotube probe tip on the catalyst film (16 in FIG. 1(e)). The carbon probe tips can be straight, angled, or sharply bent and have various technical applications.

    摘要翻译： 一种机械稳定和取向的扫描探针尖端，其包括具有逐渐减小的直径的基底的碳纳米管，在探针尖端具有尖锐的尖端。 通过在基板（图1（a）中的10和12）上沉积催化剂金属膜，在催化剂金属上沉积碳点（图1（b）中的14））来产生尖端或尖端阵列 蚀刻不被碳点掩蔽的催化剂金属膜（图1（c）），从催化剂金属膜除去碳点以暴露催化剂金属膜（图1（d）），并生长 催化剂膜上的碳纳米管探针尖端（图1（e）中的16））。 碳探针尖端可以是直的，有角度的或急剧弯曲的，并具有各种技术应用。