摘要:
A display is arranged in rows and columns with a current source for each column instead of a current source in each display cell. By omitting the current source from the cell, smaller display cell geometries are achieved. In a display where one row is selected at a time, the display of the present invention with smaller circuitry achieves performance identical to the prior art. Application is made to flat panel displays generally including field emission displays, liquid crystal displays, and integrated light emitting diode array displays.
摘要:
A display is arranged in rows and columns with a current source for each column instead of a current source in each display cell. By omitting the current source from the cell, smaller display cell geometries are achieved. In a display where one row is selected at a time, the display of the present invention with smaller circuitry achieves performance identical to the prior art. Application is made to flat panel displays generally including field emission displays, liquid crystal displays, and integrated light emitting diode array displays.
摘要:
An apparatus for stabilizing the threshold voltage in an active matrix field emission device is disclosed. The apparatus includes the formation of radiation-blocking elements between a cathodoluminescent display screen of the FED and semiconductor junctions formed on a baseplate of the FED.
摘要:
An apparatus and a method for stabilizing the threshold voltage in an active matrix field emission device. The method includes the formation of radiation blocking elements between a cathodoluminescent display screen of the FED and semiconductor junctions formed on a baseplate of the FED.
摘要:
Methods and apparatus for identifying and disabling shorted electrode pairs (such as field emitter tip electrodes shorted to grid electrodes) in a field emission display by applying a test voltage across the two electrodes in each pair. The magnitude of the test voltage is set below the voltage required to initiate field emission from the emitter tip electrode. Because no field emission occurs at this voltage, the test voltage should produce no current flow through good (non-shorted) emitter tips. However, current will flow through emitter tips which are shorted to their respective grid electrodes. In one embodiment, the current flow vaporizes the bad emitter tips themselves. In another embodiment, the current flow thermally damages a removable link connected in series with either the shorted emitter tip or the shorted grid electrode. Alternatively, rather than disabling the shorted electrodes, the method of the invention can identify shorted electrodes by sensing which electrodes conduct current in response to the test voltage. In one embodiment, the test voltage is applied, preferably simultaneously, to all the electrode pairs in the display, causing a current flow through any shorted electrodes which is high enough to produce resistive heating which can be sensed to locate the shorted electrodes. In another embodiment, the test voltage is applied sequentially to small subsets of the electrode pairs while measuring the resulting current flow. The display can be fabricated with multiple power supply busses to facilitate applying the test voltage to selected subsets of electrode pairs.
摘要:
A cold-cathode emitter includes a high-voltage tank of a second conductivity that is formed in a substrate having a first conductivity. An emitter tip is integral with the tank and extends outwardly from the substrate. The tank forms either a drain region or a collector region of a transistor. A cold-cathode emitter device includes a drive transistor formed in a substrate of a first conductivity. The transistor includes an electron receive region of a second conductivity. An emitter tip is integral with the electron receive region and extends outwardly from the substrate.
摘要:
According to the present invention, there is provided a method for forming an emitter grid in a substrate of a field emission display. In one embodiment of the invention, the method includes the step of forming an emitter in a trench in the substrate, the trench having a dimension which is substantially the same as a desired dimension of the emitter grid, disposing a dielectric layer on the substrate, and disposing a grid material layer on the dielectric layer. The field emission display is then planarized to expose a portion of the dielectric which contacts the emitter.
摘要:
A micropoint assembly of a field emission device ("FED") including a baseplate, one or more conductors formed over the baseplate, and one or more micropoints formed over the conductor(s) is disclosed. The micropoint assembly further includes resistive structures associated with specific FED elements that limit current to a maximum level and minimize impact to remaining elements of the device. Any variation in resistivity is uniformly distributed since the same process is consistently applied across a plurality of element locations.
摘要:
Methods and apparatus for identifying and disabling shorted electrode pain (such as field emitter tip electrodes shorted to grid electrodes) in a field emission display by applying a test voltage across the two electrodes in each pair. The magnitude of the test voltage is set below the voltage required to initiate field emission from the emitter tip electrode. Because no field emission occurs at this voltage, the test voltage should produce no current flow through good (non-shorted) emitter tips. However, current will flow through emitter tips which are shorted to their respective grid electrodes. In one embodiment, the current flow vaporizes the bad emitter tips themselves. In another embodiment, the current flow thermally damages a removable link connected in series with either the shorted emitter tip or the shorted grid electrode. Alternatively, rather than disabling the shorted electrodes, the method of the invention can be used to merely identify shorted electrodes by sensing which electrodes conduct current in response to the test voltage. In one embodiment, the test voltage is applied, preferably simultaneously, to all the electrode pairs in the display, causing a current flow through any shorted electrodes which is high enough to produce resistive heating which can be sensed to locate the shorted electrodes. In another embodiment, the test voltage is applied sequentially to small subsets of the electrode pairs while measuring the resulting current flow. The display can be fabricated with multiple power supply busses to facilitate applying the test voltage to selected subsets of electrode pairs.
摘要:
In a flat panel display in which low-voltage row and column address signals control a much higher pixel activation voltage by respectively gating at least one pair of series coupled MOSFETs to ground for each pixel, effective current regulation is achieved by placing a current-regulating resistor in series with each pair of the series-coupled MOSFETs. The resistor is coupled directly to ground and to the source of the MOSFET furthest from the emitter node. By coupling the current-regulating resistor directly to the ground bus, stable current values are achieved over a wide range of cathode voltages.