Electrically Conductive Pins For Microcircuit Tester
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    发明申请
    Electrically Conductive Pins For Microcircuit Tester 审中-公开
    微电路测试仪导电销

    公开(公告)号:US20150123689A1

    公开(公告)日:2015-05-07

    申请号:US14594872

    申请日:2015-01-12

    摘要: The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface.

    摘要翻译: 被测器件的端子通过一系列导电引脚对临时电连接到负载板上的对应接触焊盘。 销对通过插入器膜保持在适当的位置,该插入器膜包括面向被测器件的顶部接触板,面向负载板的底部接触板以及位于顶部和底部接触板之间的垂直弹性的非导电部件。 每个销对包括顶部和底部销,其分别延伸超过顶部和底部接触板,朝向被测设备和负载板。 顶部和底部销在相对于膜表面正常倾斜的界面处彼此接触。 当纵向压缩时,销沿着界面滑动朝向彼此平移。