摘要:
Digital testing of an analog driver circuit is enabled using a circuit including a control circuit for generating signals, a differential driver circuit for receiving a differential input signal, amplifying the differential input signal and transmitting a differential output signal, a programmable termination impedance circuit for generating a differential termination impedance at the output node of the differential driver circuit, and a differential receiver circuit for converting the differential output signal to a single ended signal and transmitting the single ended signal. The testing includes skewing a differential output termination impedance, adjusting a differential receiver circuit voltage offset, selecting a differential driver circuit power level, enabling a decoder which activates only one differential driver circuit segment per test sequence, activating a segment, stimulating the differential driver circuit with digital test patterns, receiving differential driver circuit output, converting the output to a single-ended signal, and observing the single-ended signal.
摘要:
A circuit and method of testing an analog driver circuit using digital scan-based test methodologies. The circuit of the present invention comprises a control circuit for generating signals in response to a test enable signal, a differential driver circuit for receiving a differential input signal, amplifying the differential input signal and transmitting a differential output signal in response to the differential input signal and the signals generated by the control circuit, a programmable termination impedance circuit for generating a differential termination impedance at the output node of the differential driver circuit in response the signals generated by the control circuit, and a differential receiver circuit for receiving the differential output from the differential driver circuit, convert the differential output signal to a single ended signal and transmitting the single ended signal, all in response to the test enable signal. The method of the present invention comprises digitally testing the differential driver circuit by activating a test enable signal, skewing the differential output termination impedance in response to the test enable signal, adjusting a voltage offset of the differential receiver circuit in response to the test enable signal, selecting a power level for the differential driver circuit in response to the test enable signal, enabling a decoder in response to the test enable signal, wherein the decoder activates only one segment of the differential driver circuit during any one test sequence, activating one of the segments for testing, stimulating the differential driver circuit with digital test patterns, receiving an output of the differential driver circuit by the differential receiver circuit, converting the received differential driver output to a single-ended signal, observing the single-ended signal; and deactivating the test enable signal.
摘要:
A circuit of testing an analog driver circuit using digital scan-based test methodologies. The circuit of the present invention includes a control circuit for generating signals in response to a test enable signal, a differential driver circuit for receiving a differential input signal, amplifying the differential input signal and transmitting a differential output signal in response to the differential input signal and the signals generated by the control circuit, a programmable termination impedance circuit for generating a differential termination impedance at the output node of the differential driver circuit in response the signals generated by the control circuit, and a differential receiver circuit for receiving the differential output from the differential driver circuit, convert the differential output signal to a single ended signal and transmitting the single ended signal, all in response to the test enable signal.
摘要:
A clock generator circuit for generating synchronization signals for a multiple chip system. The clock generator circuit comprises generation of a synchronization signal from a reference clock and chip global clock with edge detection logic. In high performance server system design with multiple chips, a common practice for server systems is to use feedback clock and delayed reference clock to generate the synchronization signal. The generated synchronization signal is transferred to latches clocked by the global clock to be used for chip synchronization functions. As the system clock frequency is pushed higher, the phase difference between generated synchronization signal clocked by feedback clock and receiving latch clocked by global clock is becoming such a large portion of cycle time that this signal cannot be transferred deterministically. This invention resolves the uncertainty problem and allows the synchronization signals to be generated deterministically independent of the chip global clock cycle time.
摘要:
A method for locally generating a ratio clock on a chip includes generating a global clock signal having a global clock cycle. A centralized state machine includes a counter going through a complete cycle in response to a non-integer number of global clock cycles, the state machine generating a control signal in response to the counter. The control signal is provided to staging latches, the staging latches generating a clock high signal and a clock low signal. Local pass gates generate an (n+0.5)-to-1 clock signal in response to the global clock signal, the clock high signal and the clock low signal.
摘要:
Circuitry for locally generating a ratio clock on a chip. The circuitry includes circuitry for generating a global clock signal having a global clock cycle. A state machine includes a counter going through a complete cycle in response to a non-integer number of global clock cycles. The state machine generates a control signal in response to the counter. Staging latches receive the control signal and generate a clock high signal and a clock low signal, the clock high signal and the clock low signal having patterns derived from a waveform of a target divided ratio clock, the clock high signal and the clock low signals have patterns that match the targeted divided clock frequency and duty cycle. A local pass gate receives the clock low signal and the clock high signal and generates an (n+0.5)-to-1 clock signal in response to the global clock signal, the clock high signal and the clock low signal.
摘要:
Concurrent refresh in a cache memory includes calculating a refresh time interval at a centralized refresh controller, the centralized refresh controller being common to all cache memory banks of the cache memory, transmitting a starting time of the refresh time interval to a bank controller, the bank controller being local to, and associated with, only one cache memory bank of the cache memory, sampling a continuous refresh status indicative of a number of refreshes necessary to maintain data within the cache memory bank associated with the bank controller, requesting a gap in a processing pipeline of the cache memory to facilitate the number of refreshes necessary, receiving a refresh grant in response to the requesting, and transmitting an encoded refresh command to the bank controller, the encoded refresh command indicating a number of refresh operations granted to the cache memory bank associated with the bank controller.
摘要:
A clock generator circuit for generating synchronization signals for a multiple chip system. The clock generator circuit comprises generation of a synchronization signal from a reference clock and chip global clock with edge detection logic. In high performance server system design with multiple chips, a common practice for server systems is to use feedback clock and delayed reference clock to generate the synchronization signal. The generated synchronization signal is transferred to latches clocked by the global clock to be used for chip synchronization functions. As the system clock frequency is pushed higher, the phase difference between generated synchronization signal clocked by feedback clock and receiving latch clocked by global clock is becoming such a large portion of cycle time that this signal cannot be transferred deterministically. This invention resolves the uncertainty problem and allows the synchronization signals to be generated deterministically independent of the chip global clock cycle time.
摘要:
Concurrent refresh in a cache memory includes calculating a refresh time interval at a centralized refresh controller, the centralized refresh controller being common to all cache memory banks of the cache memory, transmitting a starting time of the refresh time interval to a bank controller, the bank controller being local to, and associated with, only one cache memory bank of the cache memory, sampling a continuous refresh status indicative of a number of refreshes necessary to maintain data within the cache memory bank associated with the bank controller, requesting a gap in a processing pipeline of the cache memory to facilitate the number of refreshes necessary, receiving a refresh grant in response to the requesting, and transmitting an encoded refresh command to the bank controller, the encoded refresh command indicating a number of refresh operations granted to the cache memory bank associated with the bank controller.
摘要:
A wiring structure for clock signals has two or more parallel clock signal wires disposed in adjacent power wire bays that span the distance between the sinks to which the clock signal wires are to be coupled. The parallel clock signal wires are shorted one to another by stubs placed at locations in order to time the clock wiring structure. The delay tuning of the structure is obtained by the discrete movement of wiring stubs between the wiring bays of the pre-defined power grid.