摘要:
A light emitting apparatus includes a plurality of light emitting devices including luminous bodies, and a plurality of resistors made of the same material having negative resistance-temperature characteristics, the plurality of resistors being connected respectively in series to the plurality of light emitting devices. When the plurality of resisters are at the same temperature, one or ones among the plurality of resistors, which exhibit higher temperatures during driving, have larger resistance values than other among the plurality of resistors, which exhibit lower temperatures during the driving.
摘要:
In an image display apparatus, each sub-pixel includes a phosphor configured to emit light of a predetermined color when the phosphor is irradiated with electrons, an electron emission device configured to irradiate the phosphor with the electrons, and a resistor connected in series to the electron emission device and having a negative temperature characteristic of resistance. In three or more sub-pixels with different luminescent colors included in each pixel, the resistor is configured such that a sub-pixel having a phosphor with a smaller temperature dependency of luminescent brightness has a resistor with a greater activation energy, or the resistor is configured such that the resistor is made of the same material for the three or more sub-pixel and such that a sub-pixel having a phosphor with a smaller temperature dependency of luminescent brightness has a resistor with a greater resistance.
摘要:
In an image display apparatus, each sub-pixel includes a phosphor configured to emit light of a predetermined color when the phosphor is irradiated with electrons, an electron emission device configured to irradiate the phosphor with the electrons, and a resistor connected in series to the electron emission device and having a negative temperature characteristic of resistance. In three or more sub-pixels with different luminescent colors included in each pixel, the resistor is configured such that a sub-pixel having a phosphor with a smaller temperature dependency of luminescent brightness has a resistor with a greater activation energy, or the resistor is configured such that the resistor is made of the same material for the three or more sub-pixel and such that a sub-pixel having a phosphor with a smaller temperature dependency of luminescent brightness has a resistor with a greater resistance.
摘要:
Deformation of a gate by Coulomb force generated when operating an electron-emitting device is inhibited by appropriately maintaining relationship between film thickness h of the gate and distance L from an outer surface of an insulating member to an inner surface of a concave portion. According to this, in an electron beam apparatus provided with a laminate-type electron-emitting device, the deformation of the gate is prevented to reduce variation in electron emission characteristics, thereby preventing the element from being broken.
摘要:
In an electron beam apparatus including an electron emission element and an anode, the electron emission element includes a gate 5 and a cathode 6 having a projection portion. The gate 5 and the cathode 6 are located in a surface of an insulating member 3 including a recess 7. The projection portion of the cathode 6 has a height distribution, and an average value dav (m) of a shortest distance between the gate 5 and the projection portion of the cathode 6 and a difference h (m) between the average value dav and a shortest distance dmin (m) from the gate 5 to a maximum convex portion of the projection portion of the cathode 6 satisfy a relationship of h/dav
摘要:
In an electron beam apparatus including a lamination electron emitting device, it is an object to enhance electron emission efficiency by controlling an electron emission point at which electrons are emitted. In the device, an insulating member and a gate are formed on a substrate, a recess portion is formed in the insulating member, a protruding portion protruding from an edge of the recess portion toward the gate is provided at an end in opposition to the gate, of a cathode 6 arranged on a side surface of the insulating member, and convex portions at a distance of not less than 1 nm and not more than 5 nm from the gate in a width direction of the protruding portion are included in a density of 10% or less in a width direction of the cathode.
摘要:
Deformation of a gate by Coulomb force generated when operating an electron-emitting device is inhibited by appropriately maintaining relationship between film thickness h of the gate and distance L from an outer surface of an insulating member to an inner surface of a concave portion. According to this, in an electron beam apparatus provided with a laminate-type electron-emitting device, the deformation of the gate is prevented to reduce variation in electron emission characteristics, thereby preventing the element from being broken.
摘要:
In an electron beam apparatus including an electron emission element and an anode, the electron emission element includes a gate 5 and a cathode 6 having a projection portion. The gate 5 and the cathode 6 are located in a surface of an insulating member 3 including a recess 7. The projection portion of the cathode 6 has a height distribution, and an average value day (m) of a shortest distance between the gate 5 and the projection portion of the cathode 6 and a difference h (m) between the average value day and a shortest distance dmin (m) from the gate 5 to a maximum convex portion of the projection portion of the cathode 6 satisfy a relationship of h/day
摘要:
A three-dimensional structure forming a space in which a wiring-side portion of a device electrode is located is arranged on a rear plate. A surface potential of the three-dimensional structure is defined so that an electric field intensity of the space becomes weaker than an average electric field intensity expressed below, average electric field intensity=Va/d, where Va is application voltage of an anode electrode, and d is an interval between a rear plate and the face plate. The device electrode includes a high-temperature portion where temperature locally rises when current flows through the device electrode. The high-temperature portion is positioned in the space or at a distance of less than or equal to 20 μm from the space.
摘要:
There provided is an electron beam apparatus of preventing surface creeping discharge from newly arising due to discharge that arises between an anode electrode and an electron-emitting device. In an electron-emitting device including a scan signal device electrode and an information signal device electrode, a portion of the scan signal device electrode is covered by an insulating layer of insulating scan signal wiring from information signal wiring, an additional electrode is connected to the scan signal device electrode at an end portion of the insulating layer and the additional electrode is configured so that energy Ee being lost due to melting of the additional electrode is larger than energy Ea of discharge current flowing in to the electron-emitting device.