Abstract:
Provided is a bit line bridge detection method for selectively floating even-numbered or odd-numbered bit lines. The bit line bridge detection method simultaneously activates even-numbered sense amplifiers and odd-numbered sense amplifiers in response to a sense amplifier enable signal. The even-numbered sense amplifiers and the odd-numbered sense amplifiers are selectively disabled in response to a sense amplifier disable signal generated at a predetermined time after the sense amplifier enable signal is generated, and an even-numbered or odd-numbered sense amplifier selection signal which is stored in a mode register. As a result, the even-numbered bit lines and the odd-numbered bit lines are selectively floated. If data input to memory cells is inverted, a bit line bridge is detected.
Abstract:
Provided is a method for remediating arsenic-contaminated soil, including: a collection step of collecting arsenic-contaminated soil; a washing step of adding the collected soil to a washing solution, which is acidic in nature and provides reducing conditions to the soil, so as to remove arsenic from the soil and transfer the removed arsenic to the washing solution; a solid-liquid separation step of separating the soil and the washing solution from each other after the washing step; and a post-treatment step of removing arsenic from the washing solution, which was separated in the solid-liquid separation step, and employing the soil for remediation.
Abstract:
A semiconductor memory device comprises a substrate comprising a first cell array region, a first sense circuit region, a second sense circuit region, and a second cell array region that are arranged in order from a first side to a second side. First and second bit lines are coupled to a plurality of memory cells in the first cell array region, and first and second complementary bit lines are coupled to a plurality of memory cells in the second cell array region. A first column selector is formed in the first sense circuit region and is coupled to the first bit line and the first complementary bit line. A second column selector is formed in the second sense circuit region and is coupled to the second bit line and the second complementary bit line. The first column selector and the second column selector are formed directly adjacent to each other.
Abstract:
A high voltage generator is provided. The high voltage generator may comprise a high voltage output node, a plurality of pumping stages, a plurality of charge transfer elements, and a field relieving unit. The plurality of pumping stages sequentially pump charges in response to a sequentially enabled plurality of pump signals and output the pumped charges, respectively. The plurality of charge transfer elements sequentially transfer the charges sequentially pumped by the plurality of pumping stages to the next pumping stage and transfer the charge of an output node of the last pumping stage to the high voltage output node. The field relieving unit reduces the voltage of the input terminal of at least one of the plurality of charge transfer elements. The high voltage generator reduces hot carrier injection in charge transfer transistors without decreasing pumping efficiency.
Abstract:
Provided is a method of remediating cyanide-contaminated soil. The method is provided to remediate soil contaminated with cyanide and treat the cyanide, which includes collecting the soil contaminated with first cyanide in a solid state and second cyanide in a gaseous or dissolved state, dissociating cyanide by mixing the soil with an alkali washing solution, dissolving the first cyanide in a solid state in the washing solution, and transferring the second cyanide in a dissolved state dissociated from the soil to the washing solution, dissociating the soil from the washing solution, precipitating the first cyanide in a solid state by acidifying the washing solution containing the cyanide, and performing post-treatment on the first cyanide after the first cyanide precipitated in a solid state is dissociated from the washing solution.
Abstract:
A semiconductor memory device includes a memory block having first and second word lines extending in a first direction and bit lines extending in a perpendicular second direction; a first driver region at a side of the memory block in the first direction driving the first word lines; a second driver region at another side of the memory block in the first direction driving the second word lines; a sensing region at a side of the memory block in the second direction controlling the bit lines responsive to signals from drive lines; a first conjunction region at an intersection of the first driver and sensing regions including a first driver driving the drive lines responsive to signals from control lines; and a second conjunction region at an intersection of the second driver and sensing regions, including a second driver driving the drive lines responsive to signals from the control lines.
Abstract:
Provided is a semiconductor memory device having peripheral circuit capacitors. In the semiconductor memory device, a first node is electrically connected to a plurality of lower electrodes of a plurality of capacitors in a peripheral circuit region to connect at least a portion of the capacitors in parallel. A second node is electrically connected to a plurality of upper electrodes of the capacitors in the peripheral circuit region to connect at least a portion of the capacitors in parallel. The first node is formed at substantially the same level as a bit line in a cell array region and is formed of the same material used to form the bit line.