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公开(公告)号:US20170009353A1
公开(公告)日:2017-01-12
申请号:US15189190
申请日:2016-06-22
Applicant: K.C. Tech Co., Ltd.
Inventor: Jin Sook HWANG , Hyun Goo KONG , Han Teo PARK
CPC classification number: C09G1/02 , C08K3/36 , C08K2003/2213 , C08K2003/2227 , C08K2003/2237 , C08K2003/2244 , C08K2003/2262 , C09K3/14 , C09K13/00 , C23F1/10 , C23F3/06 , H01L21/30625 , H01L21/32115
Abstract: A slurry composition for polishing tungsten is provided. The slurry composition for polishing tungsten may include a water-soluble polymer, abrasive particles and an etching adjuster.
Abstract translation: 提供了用于抛光钨的浆料组合物。 用于抛光钨的浆料组合物可以包括水溶性聚合物,磨料颗粒和蚀刻调节剂。
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公开(公告)号:US20170022391A1
公开(公告)日:2017-01-26
申请号:US15205684
申请日:2016-07-08
Applicant: K.C. Tech Co., Ltd.
Inventor: Dong Kyu CHOI , Young Ho YOON , Hyun Goo KONG , Jin Sook HWANG , Han Teo PARK
Abstract: A polishing slurry composition is provided. The polishing slurry composition includes at least two types of abrasive particles among first abrasive particles, second abrasive particles, and third abrasive particles, and an oxidizer. A peak-to-valley roughness Rpv decreases when a contact area between the abrasive particles and a tungsten-containing film increases.
Abstract translation: 提供抛光浆料组合物。 抛光浆料组合物包括第一磨料颗粒,第二磨料颗粒和第三磨料颗粒中的至少两种磨料颗粒和氧化剂。 当磨料颗粒和含钨膜之间的接触面积增加时,峰 - 谷粗糙度Rpv降低。
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