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    Sample rack handling system
    1.
    发明授权
    Sample rack handling system 有权
    样品架处理系统

    公开(公告)号：US06337050B1

    公开(公告)日：2002-01-08

    申请号：US09292990

    申请日：1999-04-16

    申请人： Katsushi Takahashi ,  Hitoshi Tokieda ,  Toshiyuki Ikeda ,  Susumu Kai

    发明人： Katsushi Takahashi ,  Hitoshi Tokieda ,  Toshiyuki Ikeda ,  Susumu Kai

    IPC分类号： G01N3502

    CPC分类号： G01N35/026 ,  G01N2035/00326 ,  Y10T436/11 ,  Y10T436/111666 ,  Y10T436/113332 ,  Y10T436/114165 ,  Y10T436/114998

    摘要： A rack transportation assembly having a projecting member projecting forward is fixed onto a floor by a plurality of adjusters so that its rack transportation surface is brought to a desired level. The projecting member has a first reference surface facing upward. A treatment unit structure having a rack transferring area has a second reference surface in its lower surface. The treatment unit structure is pushed toward the rack transportation assembly under a condition that the second reference surface is lifted upward using height-adjustable casters so as to not become higher than the first reference surface. Then, the treatment unit structure is lowered so that the second reference surface is mounted onto the first reference surface, and a height in the front side of the treatment unit structure is adjusted using the plurality of adjusters.

    摘要翻译： 通过多个调节器将具有向前突出的突出部件的机架运输组件固定在地板上，使其齿条运送面达到期望的水平。 突出构件具有面向上的第一参考表面。 具有支架转移区域的处理单元结构在其下表面具有第二参考表面。 处理单元结构在使用高度可调的脚轮向上举起的条件下被推向机架运输组件，使得不会变得高于第一参考表面。 然后，降低处理单元结构，使第二基准面安装在第一基准面上，利用多个调整器调整处理单元结构的前侧的高度。

    Sample rack handling system
    2.
    发明授权
    Sample rack handling system 有权
    样品架处理系统

    公开(公告)号：US06764650B2

    公开(公告)日：2004-07-20

    申请号：US09929053

    申请日：2001-08-15

    申请人： Katsushi Takahashi ,  Hitoshi Tokieda ,  Toshiyuki Ikeda ,  Susumu Kai

    发明人： Katsushi Takahashi ,  Hitoshi Tokieda ,  Toshiyuki Ikeda ,  Susumu Kai

    IPC分类号： B32B2704

    CPC分类号： G01N35/026 ,  G01N2035/00326 ,  Y10T436/11 ,  Y10T436/111666 ,  Y10T436/113332 ,  Y10T436/114165 ,  Y10T436/114998

    摘要： A rack transportation assembly having a projecting member projecting forward is fixed onto a floor by a plurality of adjusters so that its rack transportation surface is brought to a desired level. The projecting member has a first reference surface facing upward. A treatment unit structure having a rack transferring area has a second reference surface in its lower surface. The treatment unit structure is pushed toward the rack transportation assembly under a condition that the second reference surface is lifted upward using height-adjustable casters so as to not become higher than the first reference surface. Then, the treatment unit structure is lowered so that the second reference surface is mounted onto the first reference surface, and a height in the front side of the treatment unit structure is adjusted using the plurality of adjusters.

    摘要翻译： 通过多个调节器将具有向前突出的突出部件的机架运输组件固定在地板上，使其齿条运送面达到期望的水平。 突出构件具有面向上的第一参考表面。 具有支架转移区域的处理单元结构在其下表面具有第二参考表面。 处理单元结构在使用高度可调的脚轮向上举起的条件下被推向机架运输组件，使得不会变得高于第一参考表面。 然后，降低处理单元结构，使第二基准面安装在第一基准面上，利用多个调整器调整处理单元结构的前侧的高度。

    AUTOMATIC ANALYZER AND SAMPLE-PROCESSING SYSTEM
    5.
    发明申请
    AUTOMATIC ANALYZER AND SAMPLE-PROCESSING SYSTEM 有权
    自动分析仪和样品处理系统

    公开(公告)号：US20110162438A1

    公开(公告)日：2011-07-07

    申请号：US13059511

    申请日：2009-08-28

    申请人： Hitoshi Tokieda ,  Yoshimitsu Takagi ,  Masashi Akutsu ,  Shotaro Sagawa

    发明人： Hitoshi Tokieda ,  Yoshimitsu Takagi ,  Masashi Akutsu ,  Shotaro Sagawa

    IPC分类号： G01N1/10

    CPC分类号： G01N35/026 ,  G01N35/00732

    摘要： In a sample-processing system having function modules and buffer units each combined as a pair with one another, in case of device stoppage due to failure, since a number of sample racks are held in the buffers, resetting involves a huge amount of time for storage of the racks. In addition, if the system configuration includes a plurality of buffer units, the resetting time increases with the number of buffer units.Sample rack ID reading means is provided in each buffer unit and during resetting, IDs of the sample racks in the buffer unit are read in the buffer unit. The buffer unit then uses the read information to make an inquiry to a control unit as to transport destinations of each sample rack. After this, sample processing based on transport destination instructions from the control unit is restarted using the buffer unit as a restarting position.

    摘要翻译： 在具有功能模块和缓冲单元的采样处理系统中，每个组合成一对，在由于故障而导致设备停止的情况下，由于多个采样架被保持在缓冲器中，所以重置涉及大量的时间 货架的存放。 此外，如果系统配置包括多个缓冲单元，则复位时间随着缓冲器单元的数量而增加。 在每个缓冲单元中提供样品架ID读取装置，并且在复位期间，缓冲单元中的样品架的ID被读取到缓冲单元中。 缓冲单元然后使用读取的信息来向控制单元询问每个样品架的运输目的地。 此后，使用缓冲单元重新启动基于来自控制单元的传送目的地指令的样本处理作为重新启动位置。

    Automatic analyzing system
    7.
    发明授权
    Automatic analyzing system 有权
    自动分析系统

    公开(公告)号：US09031794B2

    公开(公告)日：2015-05-12

    申请号：US13575169

    申请日：2011-01-28

    申请人： Osamu Watabe ,  Masashi Akutsu ,  Hitoshi Tokieda

    发明人： Osamu Watabe ,  Masashi Akutsu ,  Hitoshi Tokieda

    IPC分类号： G01N35/02 ,  G01N35/00 ,  G01N35/04

    CPC分类号： G01N35/0092 ,  G01N35/0095 ,  G01N35/026 ,  G01N35/04 ,  G01N2035/00326 ,  G01N2035/0415 ,  G01N2035/0462

    摘要： There is provided an analysis apparatus in which congestion does not occur and whose analysis efficiency is high as a whole even when the apparatus is an automatic analyzing apparatus to which a plurality of functional modules having different functions and process performances from each other are connected. Also, there is provided an automatic analysis system in which, even when a new functional module is added, it is not required to consider influence on the existing functional modules and restructure a carrying plan or others for improving process performances as a whole. Buffer units paired with the respective functional modules are connected to a specimen carrying line, and an operating-section computer issues an instruction for carrying to the respective functional modules in accordance with requests for specimens, so that carrying-in/out operations are performed as managing respective carrying-possible states among the buffer units and functional modules.

    摘要翻译： 即使设备是具有彼此不同的功能和处理性能的多个功能模块相连接的自动分析装置，也提供了一种不发生拥塞并且其分析效率总体高的分析装置。 此外，提供了一种自动分析系统，其中即使添加了新的功能模块，也不需要考虑对现有功能模块的影响，并且重新构建承载计划或其他用于整体改进过程性能的运行计划。 与相应的功能模块配对的缓冲单元连接到样本运送线，并且操作部分计算机根据对样本的请求发出用于携带到各个功能模块的指令，使得进/出操作被执行为 管理缓冲单元和功能模块中的相应可携带状态。

    AUTOMATIC ANALYZER
    9.
    发明申请
    AUTOMATIC ANALYZER 审中-公开
    自动分析仪

    公开(公告)号：US20120070343A1

    公开(公告)日：2012-03-22

    申请号：US13288332

    申请日：2011-11-03

    申请人： Hitoshi Tokieda ,  Isao Yamazaki ,  Masaaki Hanawa

    发明人： Hitoshi Tokieda ,  Isao Yamazaki ,  Masaaki Hanawa

    IPC分类号： G01N35/10

    CPC分类号： G01N35/109 ,  G01N35/0092 ,  G01N35/0099 ,  G01N35/025 ,  G01N35/1065 ,  G01N2035/0094 ,  G01N2035/0443 ,  G01N2035/0444 ,  G01N2035/0453 ,  G01N2035/0455 ,  G01N2035/1093 ,  Y10T436/11

    摘要： An automatic analyzer includes a plurality of reagent disks having reagent containers thereon, a reaction disk having a plurality of reaction cuvettes and a plurality of reagent dispensing probes arranged on each of the reagent disks. Each of the dispensing probes includes a first arm rotatable about a first rotary shaft and a second arm rotatable about a second rotary shaft arranged on the first arm with the arms being rotatable independently of each other. A mechanism analyzes reactions of the reagents and samples in the cuvettes.

    摘要翻译： 一种自动分析仪，包括多个试剂盘，其上具有试剂容器，具有多个反应试管的反应盘和布置在每个试剂盘上的多个试剂分注探针。 每个分配探针包括可围绕第一旋转轴旋转的第一臂和可布置在第一臂上的第二旋转轴可旋转的第二臂，其中臂彼此独立地旋转。 机制分析试剂和样品在比色皿中的反应。