PLASMA PROCESSING APPARATUS
    1.
    发明申请
    PLASMA PROCESSING APPARATUS 审中-公开
    等离子体加工设备

    公开(公告)号:US20080170969A1

    公开(公告)日:2008-07-17

    申请号:US11680118

    申请日:2007-02-28

    IPC分类号: G05D23/00

    摘要: It is possible to provide a plasma etching apparatus that controls the temperature of a sample at a higher speed and with more accuracy to improve the efficiency of processing the sample. A plasma processing apparatus includes a processing chamber to be depressurized and exhausted, a sample placement electrode provided in the processing chamber and having a sample placement surface on which a substrate to be processed is placed, an electromagnetic generation device to generate plasma in the processing chamber, a supply system that supplies processing gas to the processing chamber, a vacuum exhaust system that exhausts inside the processing chamber, a heater layer and a base temperature monitor that are disposed on the sample placement electrode, a wafer temperature estimating unit that estimates a wafer temperature from the base temperature monitor and plasma forming power supply, and a controller that regulates the heater corresponding to output from the temperature estimating unit.

    摘要翻译: 可以提供一种等离子体蚀刻装置,其以更高的速度和更高的精度来控制样品的温度,以提高样品的处理效率。 一种等离子体处理装置,其特征在于,包括要被减压和排出的处理室,设置在处理室中并具有放置有待处理基板的样品放置面的样品放置电极,在处理室中产生等离子体的电磁产生装置 向处理室供给处理气体的供给系统,在处理室内排出的真空排气系统,设置在样本设置电极上的加热器层和基底温度监视器,估计晶片的晶片温度估计单元 来自基础温度监视器和等离子体形成电源的温度,以及根据来自温度估计单元的输出来调节加热器的控制器。

    Sample holding electrode and a plasma processing apparatus using the same
    2.
    发明申请
    Sample holding electrode and a plasma processing apparatus using the same 审中-公开
    样品保持电极和使用其的等离子体处理装置

    公开(公告)号:US20070209933A1

    公开(公告)日:2007-09-13

    申请号:US11513070

    申请日:2006-08-31

    IPC分类号: C23C14/00

    摘要: A temperature control type sample-holding electrode using a heater capable of enhancing the performance of controlling the electrode temperature and ensuring the uniformity of static adsorption force over the entire surface, the sample-holding electrode being provided in a processing chamber with a sample being disposed thereon, including a dielectric film having a sample-placing surface and a thin electrode film disposed so as to oppose to the sample-placing surface by way of the dielectric film and comprising a layer of a substantially identical height serving both as a static adsorption electrode and a heater electrode, and provided with power source device capable of simultaneously supplying an AC power for heater and DC power for static adsorption to the thin electrode film.

    摘要翻译: 一种使用加热器的温度控制型样品保持电极,其能够提高控制电极温度的性能并确保整个表面上的静态吸附力的均匀性,所述样品保持电极设置在处理室中,其中设置有样品 在其上,包括具有样品放置表面的电介质膜和通过电介质膜设置成与样品放置表面相对的薄电极膜,并且包括具有基本上相同的高度的层,同时用作静态吸附电极 和加热电极,并且设置有能够同时向薄电极膜提供用于加热器的AC电力和静电吸附的DC电力的电源装置。

    Plasma Processing Apparatus and Plasma Processing Method
    3.
    发明申请
    Plasma Processing Apparatus and Plasma Processing Method 审中-公开
    等离子体处理装置和等离子体处理方法

    公开(公告)号:US20090321017A1

    公开(公告)日:2009-12-31

    申请号:US12206021

    申请日:2008-09-08

    IPC分类号: C23F1/00

    摘要: There is disclosed a plasma processing apparatus wherein a sample placed on the top surface of the sample table located within the processing chamber contained in a vacuum vessel is processed with plasma formed in the processing chamber, comprising a set of ducts cut within the sample table through which cooling medium flows; a film-shaped heater whose heating elements are concentrically embedded in the dielectric film serving as the top surface of the sample table; plural temperature controllers which set up the temperature of the cooling medium flowing through the ducts at different values, respectively; and a control unit which switches over the circulations through the ducts of the cooling medium supplied from the plural temperature controllers.

    摘要翻译: 公开了一种等离子体处理装置,其中放置在位于真空容器中的处理室内的样品台的顶表面上的样品用处理室中形成的等离子体进行处理,其包括在样品台内切割的一组导管 哪个冷却介质流动? 其加热元件同心地嵌入在作为样品台的顶表面的电介质膜中的膜状加热器; 多个温度控制器分别设置以不同的值流过管道的冷却介质的温度; 以及控制单元,其通过从多个温度控制器供给的冷却介质的管道切换循环。

    Plasma processing method and plasma processing apparatus
    4.
    发明申请
    Plasma processing method and plasma processing apparatus 失效
    等离子体处理方法和等离子体处理装置

    公开(公告)号:US20080280451A1

    公开(公告)日:2008-11-13

    申请号:US12073048

    申请日:2008-02-28

    IPC分类号: H01L21/3065

    摘要: A plasma processing apparatus includes: a film which is made of an insulative material and constructs a surface of a sample stage on which a sample is put; a disk-shaped member whose upper surface is joined with the film in a lower portion of the film and which is made of a heat conductive member; heaters which are arranged in the film and arranged in a center portion and regions of its outer peripheral side of the film; coolant channels which are arranged in the disk-shaped member and in which a coolant for cooling the disk-shaped member flows; a plurality of power sources each of which adjusts an electric power to each of the heaters in the plurality of regions; and a controller which adjusts outputs from the plurality of power sources by using a result obtained by presuming a temperature of the upper surface of the disk-shaped member.

    摘要翻译: 一种等离子体处理装置,包括:由绝缘材料制成的薄膜,构成放置样品的样品台的表面; 其上表面与膜接合在膜的下部并由导热构件制成的盘状构件; 加热器布置在膜中并且布置在膜的中心部分和其外周侧的区域中; 布置在盘状构件中并且用于冷却盘形构件的冷却剂流过的冷却剂通道; 多个电源,其各自调整对所述多个区域中的每个所述加热器的电力; 以及控制器,其通过使用通过假设盘状构件的上表面的温度获得的结果来调整来自多个电源的输出。

    Plasma processing method and plasma processing apparatus
    6.
    发明授权
    Plasma processing method and plasma processing apparatus 失效
    等离子体处理方法和等离子体处理装置

    公开(公告)号:US08282848B2

    公开(公告)日:2012-10-09

    申请号:US12073048

    申请日:2008-02-28

    摘要: A plasma processing apparatus includes: a film which is made of an insulative material and constructs a surface of a sample stage on which a sample is put; a disk-shaped member whose upper surface is joined with the film in a lower portion of the film and which is made of a heat conductive member; heaters which are arranged in the film and arranged in a center portion and regions of its outer peripheral side of the film; coolant channels which are arranged in the disk-shaped member and in which a coolant for cooling the disk-shaped member flows; a plurality of power sources each of which adjusts an electric power to each of the heaters in the plurality of regions; and a controller which adjusts outputs from the plurality of power sources by using a result obtained by presuming a temperature of the upper surface of the disk-shaped member.

    摘要翻译: 一种等离子体处理装置,包括:由绝缘材料制成的薄膜,构成放置样品的样品台的表面; 其上表面与膜接合在膜的下部并由导热构件制成的盘状构件; 加热器布置在膜中并且布置在膜的中心部分和其外周侧的区域中; 布置在盘状构件中并且用于冷却盘形构件的冷却剂流过的冷却剂通道; 多个电源,其各自调整对所述多个区域中的每个所述加热器的电力; 以及控制器,其通过使用通过假设盘状构件的上表面的温度获得的结果来调整来自多个电源的输出。

    Manufacturing method in plasma processing apparatus
    10.
    发明授权
    Manufacturing method in plasma processing apparatus 有权
    等离子体处理装置的制造方法

    公开(公告)号:US08092637B2

    公开(公告)日:2012-01-10

    申请号:US12038841

    申请日:2008-02-28

    IPC分类号: C23F1/00 H01L21/306

    摘要: A manufacturing method includes steps of: placing a film composed of dielectric, on the top surface of a sample stage, forming a film-like heater on the film made of the dielectric, supplying power to the heater to detect a temperature distribution, adjusting a resistance value of the heater on the basis of a result of detection of a temperature distribution so that the temperature distribution has a predetermined value, and then forming the film composed of the dielectric, on the heater.

    摘要翻译: 一种制造方法包括以下步骤:将由电介质组成的膜放置在样品台的顶表面上,在由电介质制成的膜上形成膜状加热器,向加热器供电以检测温度分布,调节 基于温度分布的检测结果使加热器的电阻值,使得温度分布具有预定值,然后在加热器上形成由电介质组成的膜。