摘要:
To realize a semiconductor memory which can be operated at a low frequency without reducing a data transfer rate, the semiconductor memory according to the invention is configured so that a series of operation can be finished in two clock cycles of row address strobe operation and column address strobe operation for operating DRAM. Timing for turning a sense amplifier activation signal SE at a high level after delay time determined by a first delay element since a leading edge of a clock pulse CLK that turns a row address strobe pulse (/RAS) at a low level and activating a sense amplifier sequence is generated. Also, timing for starting read operation and write operation since a leading edge of the clock pulse CLK at which a column address strobe pulse (/CAS) is turned at a low level, turning the sense amplifier activation signal SE at a low level, turning a bit line precharge signal EQPR at a high level and starting precharge operation when the termination of reading and writing is detected is acquired.
摘要:
In order to correct an error in input data to thereby obtain write data, in a memory core, an EXOR element performs arithmetic processing based on an output result of an output data latch for latching read data and a result of inputted array input data, and a selector selects a result of the arithmetic processing to prepare write data. Thus, data obtained after performance of the arithmetic processing can be generated in a semiconductor memory by an operation performed immediately after data read. In addition, it is unnecessary to transfer data to an external logic circuit. Therefore, the result of the arithmetic processing can be written to a memory cell block in a subsequent clock.
摘要:
To provide a semiconductor memory which can drive a word line faster than a conventional art, and reduce a layout area when a chip is formed as a semiconductor integrated circuit, thereby miniaturizing the chip. In the present invention, a word driver for driving the word line is constituted by a one-stage row decoder and a one-stage word driver group, and a load on a word line select signal is reduced, thereby driving the word line at high speeds.
摘要:
In a semiconductor memory device composed of a semiconductor chip and overlaid to a surface of another semiconductor chip so as to connect together, a control circuit provided in the semiconductor memory device is provided with a chip connector portion having a plurality of pads. The chip connector portion is formed to have a configuration corresponding to the maximum capacity of the memory cell array provided in the semiconductor memory device, and the location and the number of the pads are invariably determined even when the memory cell array has a capacity less than the maximum capacity. The control circuit incorporating the chip connector portion is also invariably determined so as to control reading and writing data from and into the memory cell array having the maximum capacity, regardless of the capacity of the memory cell array provided.
摘要:
In order to correct an error in input data to thereby obtain write data, in a memory core, an EXOR element performs arithmetic processing based on an output result of an output data latch for latching read data and a result of inputted array input data, and a selector selects a result of the arithmetic processing to prepare write data. Thus, data obtained after performance of the arithmetic processing can be generated in a semiconductor memory by an operation performed immediately after data read. In addition, it is unnecessary to transfer data to an external logic circuit. Therefore, the result of the arithmetic processing can be written to a memory cell block in a subsequent clock.
摘要:
In the present invention, a row decoder circuit is made up of a transistor having a first gate oxide film thickness, a transistor having a second gate oxide film thickness, and a transistor having a third gate oxide film thickness. Thus even a control circuit at a lower voltage can drive word lines at high speeds while achieving reliability.
摘要:
A voltage booster power supply circuit using a first voltage VDD3 and a second voltage VDDM to boost the first voltage VDD3, which is higher than the second voltage, to provide a boosted voltage VPP. Thus, a high efficiency of generation of a boosted voltage can be achieved compared with a configuration in which only the second voltage is used to boost the first voltage. A detector circuit detects the boosted voltage VPP to control a voltage booster circuit.
摘要:
In order to correct an error in input data to thereby obtain write data, in a memory core, an EXOR element performs arithmetic processing based on an output result of an output data latch for latching read data and a result of inputted array input data, and a selector selects a result of the arithmetic processing to prepare write data. Thus, data obtained after performance of the arithmetic processing can be generated in a semiconductor memory by an operation performed immediately after data read. In addition, it is unnecessary to transfer data to an external logic circuit. Therefore, the result of the arithmetic processing can be written to a memory cell block in a subsequent clock.
摘要:
In the present invention, a row decoder circuit is made up of a transistor having a first gate oxide film thickness, a transistor having a second gate oxide film thickness, and a transistor having a third gate oxide film thickness. Thus even a control circuit at a lower voltage can drive word lines at high speeds while achieving reliability.
摘要:
A semiconductor memory including a memory cell, a bit line pair connected to the memory cell, a data line pair connected to the bit line pair through a switching element capable of ON/OFF switching in response to a value of a column selection signal and a precharge circuit for controlling an initial potential common between the data line pair. The semiconductor memory comprises a precharge potential control circuit which applies, in a precharge period, a low apply voltage not higher than a first predetermined potential to the data line pair when the initial potential of the data line pair is higher than the first predetermined potential, a high apply voltage not lower than a second predetermined potential to the data line pair when the potential of the data line pair is lower than the second predetermined potential or no voltage when the potential of the data line pair is not higher than the first predetermined potential and not lower than the second predetermined potential.