Cr-based alloy excellent in balance between strength and ductility at high temperature
    1.
    发明授权
    Cr-based alloy excellent in balance between strength and ductility at high temperature 失效
    高温下强度和延展性平衡优良的Cr基合金

    公开(公告)号:US07037467B1

    公开(公告)日:2006-05-02

    申请号:US09926600

    申请日:2000-05-26

    申请人: Kenji Abiko

    发明人: Kenji Abiko

    IPC分类号: C22C27/06

    CPC分类号: C22C27/06 C22F1/18

    摘要: A strength-ductility balance at a high temperature above 1000° C., particularly a high temperature above 1050° C. is improved by rendering a chemical composition of Cr-based alloy into Cr: not less than 60 mass %, C+N: not more than 20 mass ppm, S: not more than 20 mass ppm, O: not more than 100 mass ppm, O as an oxide: not more than 50 mass ppm, and the remainder being Fe and inevitable impurities.

    摘要翻译: 在高于1000℃的高温下,特别是高于1050℃的高温下的强度 - 延性平衡通过使Cr基合金的化学组​​成为Cr:不小于60质量%,C + N: 不大于20质量ppm,S:不大于20质量ppm,O:不大于100质量ppm,作为氧化物的O:不大于50质量ppm,余量为Fe和不可避免的杂质。

    Cr-based alloy having an excellent strength-ductility balance at high temperature
    3.
    发明申请
    Cr-based alloy having an excellent strength-ductility balance at high temperature 失效
    在高温下具有优异的强度 - 延展性平衡的Cr基合金

    公开(公告)号:US20050281703A1

    公开(公告)日:2005-12-22

    申请号:US11211641

    申请日:2005-08-26

    申请人: Kenji Abiko

    发明人: Kenji Abiko

    IPC分类号: C22C27/06 C22F1/18

    CPC分类号: C22C27/06 C22F1/18

    摘要: A strength-ductility balance at a high temperature above 1000° C., particularly a high temperature above 1050° C. is improved by rendering a chemical composition of Cr-based alloy into Cr: more than 60 mass % but less than 65 mass %, C+N: not more than 20 mass ppm, S: not more than 20 mass ppm, O: not more than 100 mass ppm, O as an oxide: not more than 50 mass ppm, and the remainder being Fe and inevitable impurities.

    摘要翻译: 在高于1000℃的高温下,特别是高于1050℃的高温下的强度 - 延展性平衡通过使Cr基合金的化学组​​成为Cr为大于60质量%但小于65质量% ,C + N:20质量ppm以下,S:20质量ppm以下,O:100质量ppm以下,作为氧化物的O:50质量ppm以下,其余为Fe和不可避免的杂质 。

    Surface contour measuring tracer
    5.
    发明授权
    Surface contour measuring tracer 失效
    表面轮廓测量示踪剂

    公开(公告)号:US4899456A

    公开(公告)日:1990-02-13

    申请号:US235360

    申请日:1988-08-23

    IPC分类号: G01B5/012

    CPC分类号: G01B5/012

    摘要: The present invention relates to a surface contour measuring tracer permitting a probe element to move in the directions of X-, Y- and Z-axes. A support structure includes a base supporting thereon an X-slider and a Y-slider which are movable in the directions of X- and Y-axes, respectively. A Z-slider is supported on the X-slider so to be movable in the direction of a Z-axis. Supported on the Z-slider is a probe element, the movements of which in the directions of X-, Y- and Z-axes are permitted by the movements of the X-, Y- and Z-sliders. The X- and Y-sliders are normally held at neutral positions by a wire spring extending in the direction of the Z-axis, and the Z-slider is permitted to move in the direction of the Z-axis against the action of a coil spring and normally held at a neutral position.

    摘要翻译: 本发明涉及允许探针元件在X轴,Y轴和Z轴方向上移动的表面轮廓测量示踪器。 支撑结构包括分别支撑在X轴和Y轴方向上的X滑块和Y滑块的基座。 X滑块支撑在Z轴上,以便能够在Z轴方向上移动。 在Z滑块上支持探头元件,X,Y和Z轴方向的移动可以通过X,Y和Z滑块的移动来实现。 X和Y滑块通过沿Z轴方向延伸的线弹簧通常保持在中立位置,并且允许Z滑块抵抗Z线的作用沿Z轴方向移动 弹簧并且通常保持在中立位置。

    Method of treating metal analysis sample and device thereof
    8.
    发明授权
    Method of treating metal analysis sample and device thereof 失效
    处理金属分析样品的方法及其装置

    公开(公告)号:US06726739B2

    公开(公告)日:2004-04-27

    申请号:US10181912

    申请日:2002-07-24

    IPC分类号: G01N128

    CPC分类号: G01N1/32 G01N33/20

    摘要: The present invention provides a pre-treatment apparatus for an analytical metal sample, the apparatus including (1) a treatment chamber having a sample charging port which can be opened and closed and provided at the top of the chamber, a sample discharging port which can be opened and closed and provided at the bottom of the chamber, and a gas inlet and gas outlet, (2) a sample carrying bar joined to a sample holder also used as a sputtering electrode, and provided to pass through at least one side wall of the treatment chamber so as to be substantially horizontally movable and axially rotatable, and (3) a sputtering counter electrode at least having portions arranged opposite to each other in a region not inhibiting the charge and discharge of an analytical metal sample so that the sample holder can be arranged in the counter electrode. The present invention also provides a pre-treatment method capable of simply cleaning the surface of the analytical metal sample by using the pre-treatment apparatus and preventing re-contamination of the cleaned sample by exposure to the air or the like. Furthermore, the present invention provides an analysis apparatus provided with the pre-treatment apparatus to permit high-accuracy quantitative determination of trace elements of metals.

    摘要翻译: 本发明提供了一种用于分析金属样品的预处理装置,该装置包括(1)具有可以打开和关闭并设置在室顶部的样品加料口的处理室,可以将样品排出口 打开和关闭并设置在室的底部,以及气体入口和气体出口,(2)连接到样品保持器的样品携带杆,还用作溅射电极,并且被提供以通过至少一个侧壁 的处理室,以便基本上水平移动并且可轴向旋转;以及(3)至少具有彼此相对布置的部分的溅射相对电极,所述区域不抑制分析金属样品的充放电,所以样品 支架可以布置在对电极中。 本发明还提供了一种预处理方法,其能够通过使用预处理装置简单地清洁分析金属样品的表面,并防止通过暴露于空气等来清洁样品的再污染。 此外,本发明提供一种具有预处理装置的分析装置,以允许金属微量元素的高精度定量测定。

    Cr-based alloy having an excellent strength-ductility balance at high temperature
    9.
    发明授权
    Cr-based alloy having an excellent strength-ductility balance at high temperature 失效
    在高温下具有优异的强度 - 延展性平衡的Cr基合金

    公开(公告)号:US08685315B2

    公开(公告)日:2014-04-01

    申请号:US11211641

    申请日:2005-08-26

    申请人: Kenji Abiko

    发明人: Kenji Abiko

    IPC分类号: C22C27/06

    CPC分类号: C22C27/06 C22F1/18

    摘要: A strength-ductility balance at a high temperature above 1000° C., particularly a high temperature above 1050° C. is improved by rendering a chemical composition of Cr-based alloy into Cr: more than 60 mass % but less than 65 mass %, C+N: not more than 20 mass ppm, S: not more than 20 mass ppm, O: not more than 100 mass ppm, O as an oxide: not more than 50 mass ppm, and the remainder being Fe and inevitable impurities.

    摘要翻译: 在高于1000℃的高温下,特别是高于1050℃的高温下的强度 - 延展性平衡通过使Cr基合金的化学组​​成为Cr为大于60质量%但小于65质量% ,C + N:20质量ppm以下,S:20质量ppm以下,O:100质量ppm以下,作为氧化物的O:50质量ppm以下,其余为Fe和不可避免的杂质 。