利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

20 条记录 (耗时 0.026 秒)

    Cold crucible induction furnace
    2.
    发明授权
    Cold crucible induction furnace 失效
    冷坩埚感应炉

    公开(公告)号：US5892790A

    公开(公告)日：1999-04-06

    申请号：US939652

    申请日：1997-09-29

    申请人： Kenji Abiko ,  Hitoshi Kawano ,  Masanori Tsuda ,  Tadahito Nakajima

    发明人： Kenji Abiko ,  Hitoshi Kawano ,  Masanori Tsuda ,  Tadahito Nakajima

    IPC分类号： F27B14/06 ,  H05B6/24 ,  H05B6/32 ,  H05B5/16

    CPC分类号： H05B6/32 ,  F27B14/063 ,  H05B6/24

    摘要： A cold crucible induction melting furnace is provided with a plurality of segments separated by a plurality of slits that surround a bottom member which together form the melting chamber. Each lower end of each segment is overlapped with and spaced from a short part of a vertically extending side wall of the bottom member so as to form a horizontal gap there between. A radially and outwardly extending flange protrudes from the bottom member side wall below each segment lower end to form a lower gap there between. An induction coil is disposed around and spaced from an outer face of the segments with a lower end adjacent to each of the lower segment ends and an upper end adjacent to an upper part of each segment that is in turn connected with an adjacent upper segment part to form a short circuited part. The radial thickness of each segment from the upper end of the coil to the lower end of the segments is the same and the magnetic flux generated by the induction coil passing through the lower gap and the horizontal gap provides increased magnetic flux density at least adjacent to the region adjacent to the bottom member and the lower ends of the segments.

    摘要翻译： 冷坩埚感应熔炼炉设置有多个由多个狭缝隔开的段，所述多个狭缝围绕底部构件，所述底部构件一起形成熔化室。 每个段的每个下端与底部构件的垂直延伸的侧壁的短部分重叠并间隔开，从而在其之间形成水平间隙。 径向和向外延伸的凸缘从每个段下端下方的底部构件侧壁突出，以在其之间形成较小间隙。 一个感应线圈设置在该片段的外表面周围并与该片段的外表面间隔开，并具有与每个下段末端相邻的下端，以及与每个片段的上部相邻的上端，该上端又与相邻的上片段连接 形成短路部分。 从线圈的上端到段的下端的每个段的径向厚度是相同的，并且由感应线圈产生的通过下间隙和水平间隙的磁通量提供至少相邻的线圈的增加的磁通密度 邻近底部构件的区域和段的下端。

    Cr-based alloy excellent in balance between strength and ductility at high temperature
    4.
    发明授权
    Cr-based alloy excellent in balance between strength and ductility at high temperature 失效
    高温下强度和延展性平衡优良的Cr基合金

    公开(公告)号：US07037467B1

    公开(公告)日：2006-05-02

    申请号：US09926600

    申请日：2000-05-26

    申请人： Kenji Abiko

    发明人： Kenji Abiko

    IPC分类号： C22C27/06

    CPC分类号： C22C27/06 ,  C22F1/18

    摘要： A strength-ductility balance at a high temperature above 1000° C., particularly a high temperature above 1050° C. is improved by rendering a chemical composition of Cr-based alloy into Cr: not less than 60 mass %, C+N: not more than 20 mass ppm, S: not more than 20 mass ppm, O: not more than 100 mass ppm, O as an oxide: not more than 50 mass ppm, and the remainder being Fe and inevitable impurities.

    摘要翻译： 在高于1000℃的高温下，特别是高于1050℃的高温下的强度 - 延性平衡通过使Cr基合金的化学组​​成为Cr：不小于60质量％，C + N： 不大于20质量ppm，S：不大于20质量ppm，O：不大于100质量ppm，作为氧化物的O：不大于50质量ppm，余量为Fe和不可避免的杂质。

    Cr-based alloy having an excellent strength-ductility balance at high temperature
    5.
    发明申请
    Cr-based alloy having an excellent strength-ductility balance at high temperature 失效
    在高温下具有优异的强度 - 延展性平衡的Cr基合金

    公开(公告)号：US20050281703A1

    公开(公告)日：2005-12-22

    申请号：US11211641

    申请日：2005-08-26

    申请人： Kenji Abiko

    发明人： Kenji Abiko

    IPC分类号： C22C27/06 ,  C22F1/18

    CPC分类号： C22C27/06 ,  C22F1/18

    摘要： A strength-ductility balance at a high temperature above 1000° C., particularly a high temperature above 1050° C. is improved by rendering a chemical composition of Cr-based alloy into Cr: more than 60 mass % but less than 65 mass %, C+N: not more than 20 mass ppm, S: not more than 20 mass ppm, O: not more than 100 mass ppm, O as an oxide: not more than 50 mass ppm, and the remainder being Fe and inevitable impurities.

    摘要翻译： 在高于1000℃的高温下，特别是高于1050℃的高温下的强度 - 延展性平衡通过使Cr基合金的化学组​​成为Cr为大于60质量％但小于65质量％ ，C + N：20质量ppm以下，S：20质量ppm以下，O：100质量ppm以下，作为氧化物的O：50质量ppm以下，其余为Fe和不可避免的杂质 。

    Surface contour measuring tracer
    7.
    发明授权
    Surface contour measuring tracer 失效
    表面轮廓测量示踪剂

    公开(公告)号：US4899456A

    公开(公告)日：1990-02-13

    申请号：US235360

    申请日：1988-08-23

    申请人： Hideo Morita ,  Kenji Abiko ,  Katsuaki Anzawa

    发明人： Hideo Morita ,  Kenji Abiko ,  Katsuaki Anzawa

    IPC分类号： G01B5/012

    CPC分类号： G01B5/012

    摘要： The present invention relates to a surface contour measuring tracer permitting a probe element to move in the directions of X-, Y- and Z-axes. A support structure includes a base supporting thereon an X-slider and a Y-slider which are movable in the directions of X- and Y-axes, respectively. A Z-slider is supported on the X-slider so to be movable in the direction of a Z-axis. Supported on the Z-slider is a probe element, the movements of which in the directions of X-, Y- and Z-axes are permitted by the movements of the X-, Y- and Z-sliders. The X- and Y-sliders are normally held at neutral positions by a wire spring extending in the direction of the Z-axis, and the Z-slider is permitted to move in the direction of the Z-axis against the action of a coil spring and normally held at a neutral position.

    摘要翻译： 本发明涉及允许探针元件在X轴，Y轴和Z轴方向上移动的表面轮廓测量示踪器。 支撑结构包括分别支撑在X轴和Y轴方向上的X滑块和Y滑块的基座。 X滑块支撑在Z轴上，以便能够在Z轴方向上移动。 在Z滑块上支持探头元件，X，Y和Z轴方向的移动可以通过X，Y和Z滑块的移动来实现。 X和Y滑块通过沿Z轴方向延伸的线弹簧通常保持在中立位置，并且允许Z滑块抵抗Z线的作用沿Z轴方向移动 弹簧并且通常保持在中立位置。

    Method of treating metal analysis sample and device thereof
    10.
    发明授权
    Method of treating metal analysis sample and device thereof 失效
    处理金属分析样品的方法及其装置

    公开(公告)号：US06726739B2

    公开(公告)日：2004-04-27

    申请号：US10181912

    申请日：2002-07-24

    申请人： Kenji Abiko ,  Hisao Yasuhara ,  Takashi Niida ,  Makoto Shimura ,  Hideo Iwai

    发明人： Kenji Abiko ,  Hisao Yasuhara ,  Takashi Niida ,  Makoto Shimura ,  Hideo Iwai

    IPC分类号： G01N128

    CPC分类号： G01N1/32 ,  G01N33/20

    摘要： The present invention provides a pre-treatment apparatus for an analytical metal sample, the apparatus including (1) a treatment chamber having a sample charging port which can be opened and closed and provided at the top of the chamber, a sample discharging port which can be opened and closed and provided at the bottom of the chamber, and a gas inlet and gas outlet, (2) a sample carrying bar joined to a sample holder also used as a sputtering electrode, and provided to pass through at least one side wall of the treatment chamber so as to be substantially horizontally movable and axially rotatable, and (3) a sputtering counter electrode at least having portions arranged opposite to each other in a region not inhibiting the charge and discharge of an analytical metal sample so that the sample holder can be arranged in the counter electrode. The present invention also provides a pre-treatment method capable of simply cleaning the surface of the analytical metal sample by using the pre-treatment apparatus and preventing re-contamination of the cleaned sample by exposure to the air or the like. Furthermore, the present invention provides an analysis apparatus provided with the pre-treatment apparatus to permit high-accuracy quantitative determination of trace elements of metals.

    摘要翻译： 本发明提供了一种用于分析金属样品的预处理装置，该装置包括（1）具有可以打开和关闭并设置在室顶部的样品加料口的处理室，可以将样品排出口 打开和关闭并设置在室的底部，以及气体入口和气体出口，（2）连接到样品保持器的样品携带杆，还用作溅射电极，并且被提供以通过至少一个侧壁 的处理室，以便基本上水平移动并且可轴向旋转;以及（3）至少具有彼此相对布置的部分的溅射相对电极，所述区域不抑制分析金属样品的充放电，所以样品 支架可以布置在对电极中。 本发明还提供了一种预处理方法，其能够通过使用预处理装置简单地清洁分析金属样品的表面，并防止通过暴露于空气等来清洁样品的再污染。 此外，本发明提供一种具有预处理装置的分析装置，以允许金属微量元素的高精度定量测定。