摘要:
An integrated circuit arrangement for providing erase voltages to a flash EEPROM memory array including one charge pump for generating a first high voltage with substantial current which may be used for application to the source terminals of flash EEPROM memory cells during erase and to the gate terminals of flash EEPROM memory cells during programming, and another charge pump for generating a second lower voltage which may be used for application to the drain terminals of flash EEPROM memory cells during programming.
摘要:
Various embodiments of the invention may provide one or more non-volatile storage entities, such as a register or a storage array, to store configuration information for a memory device. The specified configuration may then be enabled at the occurrence of a specified event, such as power-up and/or reset.
摘要:
In one embodiment of the present invention, a method includes sensing a first burst length of data equal to half of a sense width of a plurality of sense amplifiers of a memory, and sensing a second burst length of data equal to the half of the sense width during a latency while sensing the first burst length of data.
摘要:
Briefly, in accordance with an embodiment of the invention, a method and system to retrieve information from a memory is provided. The method may include transferring information from the memory in response to at least two synchronous burst read requests using pipelining.
摘要:
A flash memory device includes a charge pump having a capacity that is preset to a particular value. The flash memory device includes a measuring circuit to measure the actual capacity of the charge pump and to reset the capacity of the charge pump to a value based on the measured capacity.