摘要:
Briefly, in accordance with an embodiment of the invention, a method and system to retrieve information from a memory is provided. The method may include transferring information from the memory in response to at least two synchronous burst read requests using pipelining.
摘要:
Some embodiments of the invention may use a single control line signal as both a wake up signal and as an indicator of a device selection command. In a command-based protocol on a non-volatile memory bus, a host memory controller may assert a signal on a control line to bring all the memory devices on the bus into an operational mode, while concurrently placing a device selection command on the input/output lines. The memory device selected by the selection command may remain operational to perform a sequence of operations as directed by the host controller. The remaining (non-selected) memory devices may return to a sleep mode until a new signal on the control line is received, indicating a new selection command.
摘要:
A memory device is disclosed which includes memory cells having m possible states, where m is at least 2. The memory device includes a multiplexed pair of output paths, wherein each output path is coupled to sense the state of a memory cell and includes a read path circuit, a column load circuit, and a comparator. Provided between the pair of output paths is a switching circuit for coupling the comparators to one another in response to a control signal. For single-bit read operations, each output path senses and outputs the data of the associated memory cell, and the control signal is inactive. When the control signal is active, the read path circuit and column load circuit of one of the output paths is disabled and the switching circuit couples the other read path circuit to the second comparator such that the state of the memory cell is sensed by two comparators.
摘要:
In a flash EEPROM memory array in which a plurality of floating gate field effect transistor memory devices are arranged in rows and columns, in which wordlines are utilized to select rows of such devices and bitlines are utilized to select columns of such devices, in which groups of such devices are arranged in blocks which are independently erasable, and the blocks are divided into sub-blocks for storing lower and upper bytes of words to be stored, apparatus is provided for disabling the wordlines to all high byte sub-blocks when a low byte sub-block is to be programmed, for disabling the wordlines to all low byte sub-blocks when a high byte sub-block is to be programmed, for grounding the sources of all high byte sub-blocks when a low byte sub-block is to be programmed, and for grounding the sources of all low byte sub-blocks when a high byte sub-block is to be programmed.
摘要:
A multilevel cell memory may use an architecture in which bits from different words are stored in the same multilevel memory cell. This may improve access time because it is not necessary to sense both cells before the word can be outputted. Therefore, the access time may be improved by removing a serial element from the access chain.
摘要:
A method of quickly aborting an automated program or erase sequence on a nonvolatile memory array in which each operation of the sequence is performed by a write state machine. During each operation of the program or erase sequence, the state of an abort signal is detected to determine whether or not the sequence should be aborted. If the abort signal is in a second state, the sequence continues to the next operation. If the abort signal is in a first state, the write state machine aborts the sequence and the nonvolatile memory array is placed in a read-only mode. The nonvolatile memory array is then available for user access.
摘要:
A nonvolatile memory device residing on a substrate is described. The memory device includes a first block and a second block. The first block includes a first sub-block comprising a first memory cell, a first bit line coupled to a drain of the first memory cell, and a first source line coupled to a source of the first memory cell. The first block also includes a second sub-block which includes a second memory cell, a second bit line coupled to a drain of the second memory cell, and a second source line coupled to a source of the second memory cell. The second block comprises a third sub-block comprising a third memory cell, a third bit line coupled to a drain of the third memory cell, and a third source line coupled to a source of the third memory cell. The second block also includes a fourth sub-block which includes a fourth memory cell, a fourth bit line coupled to a drain of the fourth memory cell, and a fourth source line coupled to a source of the fourth memory cell. The first sub-block of the first block and the third sub-block of the second block are grouped together on the substrate to form a first data bit group corresponding to a first data pin of the memory device such that the distances of the first and third memory cells of the first data bit group to a first sensing circuit are substantially minimized and are substantially equal. The second sub-block of the first block and the fourth sub-block of the second block are grouped together on the substrate to form a second data bit group corresponding to a second data pin of the memory device such that the distances of the second and fourth memory cells of the second data bit group to a second sensing circuit are substantially minimized and are substantially equal.
摘要:
A single status register, capable of providing status for simultaneous read-while-write operation on a flash memory array is described. The status of the memory array is reported to the user based on two partitions. A microcontroller is used to traffic the status register to memory array communication.
摘要:
Schemes for verifying the successful programming of a memory cell having more than two possible states are disclosed. Each program verify reference flash cell is set to have a V.sub.t that defines a boundary of a possible state for the selected flash cell. For a first embodiment, program verify reference flash cells are used in the place of read reference cells to perform a binary search read operation similar to a standard read operation for the memory device architecture. The data sensed by the write verify operation is compared to expected data. For a second embodiment, a single program verify reference flash cell is used to define a threshold voltage beyond which the floating gate of the selected flash cell must be programmed to pass the write verify operation. Thus, for the second embodiment, the program verify reference flash cell is used to verify the analog V.sub.t voltage level of the selected flash cell, rather than to determine the data of the selected flash cell, as is done for the first embodiment.
摘要:
A circuit for accessing data which may be stored in a flash EEPROM memory array in sixteen bit quantities has apparatus for writing data to the array in eight bit quantities which quantities may be either the lower or upper byte of a word and appear at identical input terminals, apparatus for writing data to the array in sixteen bit quantities, apparatus for reading data from the array to identical output terminals in eight bit quantities which quantities may be either the lower or upper byte of a word, and apparatus for reading data from the array in sixteen bit quantities. The circuit also has apparatus for reading data from the array in eight and sixteen bit quantities during periods in which an erase operation conducted on sixteen bits is suspended.