FLUID DETECTION WITH A SPECTROMETER-ON-A-CHIP
    2.
    发明申请
    FLUID DETECTION WITH A SPECTROMETER-ON-A-CHIP 有权
    使用光谱仪在片上进行流体检测

    公开(公告)号:US20100064773A1

    公开(公告)日:2010-03-18

    申请号:US12210170

    申请日:2008-09-12

    IPC分类号: G01M3/04 G01J3/28

    CPC分类号: G01M3/047

    摘要: A liquid detection device for detecting liquid at a location on a structure includes a nanoscale spectrometer-on-a chip, and a fluid-absorptive element for absorbing liquid at the location and also securing the chip to the structure. Fluid absorbed by the element is analyzed by the spectrometer.

    摘要翻译: 用于在结构上的位置处检测液体的液体检测装置包括芯片上的纳米级光谱仪,以及用于在该位置吸收液体并且还将芯片固定到结构的流体吸收元件。 通过光谱仪分析被元素吸收的液体。

    Fluid detection with a spectrometer-on-a-chip
    4.
    发明授权
    Fluid detection with a spectrometer-on-a-chip 有权
    使用片上光谱仪进行流体检测

    公开(公告)号:US08561456B2

    公开(公告)日:2013-10-22

    申请号:US12210170

    申请日:2008-09-12

    IPC分类号: G01M3/04

    CPC分类号: G01M3/047

    摘要: A liquid detection device for detecting liquid at a location on a structure includes a nanoscale spectrometer-on-a chip, and a fluid-absorptive element for absorbing liquid at the location and also securing the chip to the structure. Fluid absorbed by the element is analyzed by the spectrometer.

    摘要翻译: 用于在结构上的位置处检测液体的液体检测装置包括芯片上的纳米级光谱仪,以及用于在该位置吸收液体并且还将芯片固定到结构的流体吸收元件。 通过光谱仪分析被元素吸收的液体。

    Contamination identification system
    5.
    发明授权
    Contamination identification system 有权
    污染识别系统

    公开(公告)号:US08836934B1

    公开(公告)日:2014-09-16

    申请号:US13472031

    申请日:2012-05-15

    IPC分类号: G01N21/00

    摘要: A method and apparatus for inspecting a composite workpiece. A response to electromagnetic radiation directed to a surface of the composite workpiece is separated into a number of wavelengths for each of a number of locations on the surface of the composite workpiece. A set of contaminants on the surface of the composite workpiece is identified from the number of wavelengths for the each of the number of locations. A two-dimensional image of the surface of the composite workpiece is generated with a set of graphical indicators indicating the set of contaminants identified from the number of wavelengths for the each of the number of locations on the surface of the composite workpiece.

    摘要翻译: 一种用于检查复合工件的方法和装置。 针对复合工件的表面的电磁辐射的响应被分离成复合工件表面上的多个位置中的每一个的多个波长。 从复合工件表面上的一组污染物可以从多个位置中的每一个的波长数来识别。 使用一组图形指示器来生成复合工件的表面的二维图像,所述图形指示器指示从复合工件的表面上的每个位置的波长数目中识别的一组污染物。

    Shearographic inspection system using a laser matrix
    6.
    发明授权
    Shearographic inspection system using a laser matrix 有权
    使用激光矩阵的剪切检查系统

    公开(公告)号:US09234740B1

    公开(公告)日:2016-01-12

    申请号:US13593008

    申请日:2012-08-23

    IPC分类号: G01B9/02

    CPC分类号: G01B9/02098 G01B9/02096

    摘要: A method and apparatus for inspection of an object. The apparatus comprises an array of light sources and a support structure. The array of light sources is configured to generate beams of coherent light with a substantially uniform distribution of the beams of coherent light in an area on a surface of an object in the area that results in a number of speckle patterns in light reflected from the surface of the object in the area in response to the beams of coherent light in the area. The support structure is associated with the array of light sources.

    摘要翻译: 一种用于检查物体的方法和装置。 该装置包括光源阵列和支撑结构。 光源阵列被配置为产生相干光束,其中相干光束的大致均匀分布在区域中的物体表面上的区域中,导致从表面反射的光中的多个斑纹图案 响应于该区域中的相干光束而在该区域中的物体。 支撑结构与光源阵列有关。