MEMORY DEVICE AND METHOD OF FABRICATING THE SAME

    公开(公告)号:US20210305273A1

    公开(公告)日:2021-09-30

    申请号:US16835360

    申请日:2020-03-31

    Abstract: A memory device includes: a first bit line located on a dielectric layer and a second bit line located over the dielectric layer; a first word line and a second word line located between the first bit line and the second bit line; a source line located between the first word line and the second word line; a channel pillar penetrating through the first word line and the source line and the second word line, and being connected to the first bit line, the source line and the second bit line; and a charge storage structure including an upper portion surrounding an upper sidewall of the channel pillar and located between the second word line and the channel pillar; and a lower portion surrounding a lower sidewall of the channel pillar and located between the first word line and the channel pillar.

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