-
公开(公告)号:US11935584B2
公开(公告)日:2024-03-19
申请号:US17935825
申请日:2022-09-27
Applicant: Micron Technology, Inc.
Inventor: Mamoru Nishizaki
IPC: G11C11/4091 , H01L23/528 , H10B12/00
CPC classification number: G11C11/4091 , H01L23/528 , H10B12/50
Abstract: Drivers for sense amplifiers are disclosed. A driver may include two or more drain areas extending in a first direction and two or more source areas extending in the first direction. The driver may also include a drain interconnection including two or more first drain-interconnection portions which extend in the first direction above the two of more drain areas and one or more second drain-interconnection portions extending in a second direction between the two or more first drain-interconnection portions. The driver may also include a source interconnection including two or more first source-interconnection portions extending in the first direction above the two or more source areas and one or more second source-interconnection portions extending in the second direction between the two or more first source-interconnection portions. Associated systems are also disclosed.
-
公开(公告)号:US11495282B2
公开(公告)日:2022-11-08
申请号:US16991290
申请日:2020-08-12
Applicant: Micron Technology, Inc.
Inventor: Mamoru Nishizaki
IPC: G11C11/4091 , H01L27/108 , H01L23/528
Abstract: Drivers for sense amplifiers are disclosed. A driver may include two or more drain areas extending in a first direction and two or more source areas extending in the first direction. The driver may also include a drain interconnection including two or more first drain-interconnection portions which extend in the first direction above the two of more drain areas and one or more second drain-interconnection portions extending in a second direction between the two or more first drain-interconnection portions. The driver may also include a source interconnection including two or more first source-interconnection portions extending in the first direction above the two or more source areas and one or more second source-interconnection portions extending in the second direction between the two or more first source-interconnection portions. Associated systems are also disclosed.
-
公开(公告)号:US10339980B2
公开(公告)日:2019-07-02
申请号:US16029046
申请日:2018-07-06
Applicant: Micron Technology, Inc.
Inventor: Mamoru Nishizaki
IPC: G11C5/02 , G11C5/06 , G11C7/18 , G11C8/10 , G11C11/408 , G11C11/4097 , G11C29/00 , G11C29/02 , G11C7/12 , H01L27/108 , G11C29/12
Abstract: Apparatuses for controlling defective bit lines in a semiconductor device are described. An example apparatus includes: a first region including a plurality of bit lines, a plurality of word lines and a plurality of memory cells, each memory cell is coupled to an associated bit line and an associated word line; a second region including a plurality of sense amplifiers, each sense amplifier includes a sense node and a column selection switch coupled to the sense node; a third region including a plurality of bleeder circuits, and disposed between the first and second regions; and a plurality of column selection lines. Each bit line from the first region to the second region is coupled to the sense node of an associated one of the plurality of sense amplifiers, and each column selection line from the column selection switch is coupled to an associated bleeder circuit.
-
公开(公告)号:US20250029650A1
公开(公告)日:2025-01-23
申请号:US18749446
申请日:2024-06-20
Applicant: MICRON TECHNOLOGY, INC.
Inventor: KEIYA ANDO , Mamoru Nishizaki , KENJI ASAKI
IPC: G11C11/408 , G11C11/4074 , G11C11/4091
Abstract: An example apparatus includes: a plurality of first regions each including second and third regions; a plurality of main word driver circuits each configured to activate an associated one of a plurality of main word lines responsive to a row address signal; and a voltage control circuit configured to supply a first power voltage to the plurality of main word driver circuits in a first operation mode and a second power voltage different from the first power voltage to the plurality of main word driver circuits in a second operation mode. One or ones of the plurality of main word driver circuits is arranged in the second region included in each of the plurality of first regions. The voltage control circuit is divided into multiple circuit portions arranged in two or more third regions in two or more of the plurality of first regions, respectively.
-
公开(公告)号:US11984188B2
公开(公告)日:2024-05-14
申请号:US17733746
申请日:2022-04-29
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Mamoru Nishizaki
IPC: G11C5/06 , G11C11/4091 , H10B12/00 , G11C11/4094 , H01L23/522 , H01L23/528
CPC classification number: G11C5/063 , G11C11/4091 , H10B12/50 , G11C11/4094 , H01L23/5225 , H01L23/5226 , H01L23/5286
Abstract: Disclosed herein is an apparatus that includes a first wiring layer including a first bit line extending in a first direction, a first sense amplifier configured to amplify a potential of the first bit line, and a first transistor configured to supply an operation voltage to the first sense amplifier when a first control signal supplied to a gate electrode of the first transistor is activated. The first wiring layer further includes a first pattern coupled to the gate electrode of the first transistor and a second pattern having a first section arranged between the first bit line and the first pattern in a second direction perpendicular to the first direction.
-
公开(公告)号:US10468090B1
公开(公告)日:2019-11-05
申请号:US16127030
申请日:2018-09-10
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Mamoru Nishizaki
IPC: G11C11/40 , G11C11/4074 , G11C7/06 , G11C11/4091 , G11C5/14 , G11C5/06
Abstract: Disclosed herein is an apparatus that includes a first wiring layer including a first power line extending in a first direction, a second wiring layer including second and third power lines extending in a second direction, a third wiring layer including power electrode patterns arranged in the second direction, and a fourth wiring layer including a fourth power line extending in the second direction. The first and second power lines are connected by a first via electrode. The first and third power lines are connected by a second via electrode. The second power line and each of the power electrode patterns are connected by a third via electrode. The third power line and each of the power electrode patterns are connected by a fourth via electrode. The fourth power line and each of the power electrode patterns are connected by a fifth via electrode.
-
公开(公告)号:US20230014197A1
公开(公告)日:2023-01-19
申请号:US17935825
申请日:2022-09-27
Applicant: Micron Technology, Inc.
Inventor: Mamoru Nishizaki
IPC: G11C11/4091 , H01L27/108 , H01L23/528
Abstract: Drivers for sense amplifiers are disclosed. A driver may include two or more drain areas extending in a first direction and two or more source areas extending in the first direction. The driver may also include a drain interconnection including two or more first drain-interconnection portions which extend in the first direction above the two of more drain areas and one or more second drain-interconnection portions extending in a second direction between the two or more first drain-interconnection portions. The driver may also include a source interconnection including two or more first source-interconnection portions extending in the first direction above the two or more source areas and one or more second source-interconnection portions extending in the second direction between the two or more first source-interconnection portions. Associated systems are also disclosed.
-
公开(公告)号:US20200082868A1
公开(公告)日:2020-03-12
申请号:US16656870
申请日:2019-10-18
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Mamoru Nishizaki
IPC: G11C11/4074 , G11C7/06 , G11C11/4091 , G11C5/14
Abstract: Disclosed herein is an apparatus that includes a first wiring layer including a first power line extending in a first direction, a second wiring layer including second and third power lines extending in a second direction, a third wiring layer including power electrode patterns arranged in the second direction, and a fourth wiring layer including a fourth power line extending in the second direction. The first and second power lines are connected by a first via electrode. The first and third power lines are connected by a second via electrode. The second power line and each of the power electrode patterns are connected by a third via electrode. The third power line and each of the power electrode patterns are connected by a fourth via electrode. The fourth power line and each of the power electrode patterns are connected by a fifth via electrode.
-
公开(公告)号:US20190295605A1
公开(公告)日:2019-09-26
申请号:US16380912
申请日:2019-04-10
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Mamoru Nishizaki
IPC: G11C5/06 , G11C7/06 , G11C7/12 , G11C7/10 , G11C7/04 , G11C7/18 , H01L23/528 , G11C5/02 , G11C8/14 , H01L23/522
Abstract: The present disclosure relates generally to the field of power supply wiring in a semiconductor device. In one embodiment, a semiconductor device is disclosed that includes, an uppermost metal layer including a power supply enhancing wiring, power supply wiring coupled to the power supply enhancing wiring through a via between the uppermost metal layer and a metal layer underlying the uppermost metal layer, and at least one memory device component disposed in vertical alignment with the via between the uppermost metal layer and the metal layer underlying the uppermost metal layer.
-
公开(公告)号:US10304497B2
公开(公告)日:2019-05-28
申请号:US15709250
申请日:2017-09-19
Applicant: Micron Technology, Inc.
Inventor: Mamoru Nishizaki
IPC: G11C5/06 , H01L23/528 , G11C5/02 , G11C7/12 , G11C7/10 , H01L23/522 , G11C7/06
Abstract: The present disclosure relates generally to the field of power supply wiring in a semiconductor device. In one embodiment, a semiconductor device is disclosed that includes, an uppermost metal layer including a power supply enhancing wiring, power supply wiring coupled to the power supply enhancing wiring through a via between the uppermost metal layer and a metal layer underlying the uppermost metal layer, and at least one memory device component disposed in vertical alignment with the via between the uppermost metal layer and the metal layer underlying the uppermost metal layer.
-
-
-
-
-
-
-
-
-