Outer dimension measuring apparatus and outer dimension measuring method
    1.
    发明授权
    Outer dimension measuring apparatus and outer dimension measuring method 有权
    外尺寸测量仪和外尺寸测量方法

    公开(公告)号:US09383191B2

    公开(公告)日:2016-07-05

    申请号:US14799987

    申请日:2015-07-15

    Inventor: Yutaka Miki

    CPC classification number: G01B11/02 G01B11/08 G01B2210/50

    Abstract: An outer dimension measuring apparatus includes a light source; an optical system focusing the light emitted from the light source onto an optical axis; a reflector reflecting the focused light; a detector detecting an intensity of the reflected light; and a calculator calculating an outer dimension of a measured object using a first focus position, a second focus position, and a position of the reflector on the optical axis, the first focus position lying on the optical axis where a peak in reflected light intensity is detected by the detector for light reflected by a first surface, and the second focus position lying on the optical axis where a peak in reflected light intensity is detected by the detector for light that has been reflected by the reflector and emitted at a second surface.

    Abstract translation: 外部尺寸测量装置包括光源; 将从光源发射的光聚焦到光轴上的光学系统; 反射聚焦光的反射镜; 检测器,检测反射光的强度; 以及使用第一聚焦位置,第二聚焦位置和反射器在光轴上的位置来计算被测物体的外部尺寸的计算器,所述第一聚焦位置位于反射光强度的峰值的光轴上 由检测器检测由第一表面反射的光,并且第二对焦位置位于光轴处,其中反射光强度的峰值被检测器检测到已被反射器反射并在第二表面处发射的光。

    Thickness measurement apparatus and thickness measurement method
    2.
    发明授权
    Thickness measurement apparatus and thickness measurement method 有权
    厚度测量装置和厚度测量方法

    公开(公告)号:US09354044B2

    公开(公告)日:2016-05-31

    申请号:US14795311

    申请日:2015-07-09

    Inventor: Yutaka Miki

    CPC classification number: G01B11/06 G01B2210/50

    Abstract: A thickness measurement apparatus includes a light source emitting light; an optical system focusing the light emitted from the light source onto an optical axis; a reflector reflecting light focused by the optical system; a detector detecting intensity of the reflected light according to a position on the optical axis where the light passing through the optical system is in focus; and a calculator calculating thickness of a measured object using a refractive index of the measured object and an amount of displacement between a first focus position and a second focus position.

    Abstract translation: 厚度测量装置包括发射光的光源; 将从光源发射的光聚焦到光轴上的光学系统; 反射由光学系统聚焦的光的反射器; 检测器,其根据在所述光轴上通过所述光学系统的光被聚焦的位置来检测反射光的强度; 以及使用所测量的物体的折射率和第一聚焦位置和第二聚焦位置之间的位移量来计算被测物体的厚度的计算器。

    Position measurement apparatus
    3.
    发明授权

    公开(公告)号:US09983310B2

    公开(公告)日:2018-05-29

    申请号:US14834981

    申请日:2015-08-25

    Inventor: Yutaka Miki

    CPC classification number: G01S17/48 G01S7/4813 G01S7/4818

    Abstract: A position measurement apparatus includes a measurement head, a controller and a light transmission section. The measurement head includes a light projecting lens and a light receiving lens. The controller includes a light emitting section, a light emission circuit controlling the light emitting section, a light receiving section, and a pixel data processing circuit detecting a position of light received in the light receiving section, and outputting positional information to a calculation section calculating a position of an object to be measured. The light transmission section includes an optical fiber transmitting light from the light emitting section to the light projecting lens, and an image fiber with incidence and emission end faces, in which end faces of plural cores are two-dimensionally arrayed in the incidence end face and the emission end face, the image fiber transmitting light converged by the light receiving lens to the light receiving section.

    Optical observation apparatus and optical observation method

    公开(公告)号:US09903812B2

    公开(公告)日:2018-02-27

    申请号:US14835229

    申请日:2015-08-25

    Inventor: Yutaka Miki

    CPC classification number: G01N21/474 G01B11/24 G01N2021/4709 G01N2021/4742

    Abstract: Optical observation apparatus includes: light source emitting broadband light; image fiber with first and second end faces, wherein end faces of plural cores are two-dimensionally arrayed in first and second end faces; imaging optical system provided on first end face side of image fiber, causing light from first end face to be imaged on imaging plane; and axial aberration optical system provided on second end face side of image fiber, having an axial chromatic aberration on optical axis, and causing light from second end face toward object to be observed to be converged. Image fiber takes light from light source from first end face, and transmits light to second end face, and takes light, reflected and scattered by a surface of object, converged by axial aberration optical system, and focused for each plural core on second end face, from second end face and transmits light to first end face.

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