摘要:
This invention provides an integrated circuit (IC) optical detector. The IC optical detector comprises a substrate and an IC. The substrate comprises a plurality of test sites defined thereon. The test sites comprise a surface suitably treated for coating of at least one test sample. The at least one test sample is capable of being changed by a reaction. The IC comprises at least one optical sensor array for simultaneously receiving and sensing optical signals from the test sites during operations Presence of at least one changed test sample at a test site changes the quantity of light directed through the test site. The change in quantity of light is detectable by the sensor array. The optical sensor array further converts the sensed optical signals to electrical signals. The IC automatically processes and outputs the electrical signals during operation.This invention further provides a method for detecting a specific sample within at least one test sample. The method comprises securing said test sample on a plurality of test sites defined on a substrate; processing said test sample to allow said test sample to be optically differentiated; directing a light at said test sample; simultaneously receiving and sensing optical signals from said test sample using at least one optical sensor array of an IC; converting said sensed optical signals to electrical signals by said optical sensor array; and automatically processing and outputting said electrical signals by said IC to detect said specific sample within said test sample.
摘要:
This invention provides an integrated circuit (IC) optical detector. The IC optical detector comprises a substrate and an IC. The substrate comprises a plurality of test sites defined thereon. The test sites comprise a surface suitably treated for coating of at least one test sample. The at least one test sample is capable of being changed by a reaction. The IC comprises at least one optical sensor array for simultaneously receiving and sensing optical signals from the test sites during operations Presence of at least one changed test sample at a test site changes the quantity of light directed through the test site. The change in quantity of light is detectable by the sensor array. The optical sensor array further converts the sensed optical signals to electrical signals. The IC automatically processes and outputs the electrical signals during operation. This invention further provides a method for detecting a specific sample within at least one test sample. The method comprises securing said test sample on a plurality of test sites defined on a substrate; processing said test sample to allow said test sample to be optically differentiated; directing a light at said test sample; simultaneously receiving and sensing optical signals from said test sample using at least one optical sensor array of an IC; converting said sensed optical signals to electrical signals by said optical sensor array; and automatically processing and outputting said electrical signals by said IC to detect said specific sample within said test sample.
摘要:
A pixel element for an image sensor comprising, a photodiode and a reset transistor connected to an input node, wherein said reset transistor is a PMOSFET connected between said input node and the supply voltage, and wherein said pixel further comprises parallel complementary signal paths.
摘要:
A capped trimming hard-mask patterning process to form ultra-thin structures can include depositing a hard-mask layer over a layer of patterning material, depositing an imaging layer over the hard-mask layer, patterning the imaging layer and the hard-mask layer, selectively trim etching the hard-mask layer to form a pattern hard mask, and removing the portions of the patterning layer using the pattern hard mask formed from the trimmed hard-mask. Thus, the use of thin imaging layer, that has high etch selectivity to the hard-mask layer, allows the use of trim etch techniques without a risk of hard-mask erosion or the aspect ratio pattern collapse. That, in turn, allows for the formation of the ultra-thin pattern with widths less than the widths of the pattern of the imaging layer.
摘要:
The present invention relates to a lighting network control system and the corresponding control method. The control system consists of controllers, routers and illuminators connected via the serial connecting signal wires. The controller stores the control images and pictures. It transmits the serial control signal to routers and illuminators. The illuminators read in turn the serial control signal to extract the specific segment and transmit the rest to next device. A router reads in turn the specific segment from the control signal for its own stage. According to the requirements of the control signal, it transmits the control signal to different lighting network branches that connect with it. In the present invention, independent control to individual illuminator in the lighting network is implemented with comparatively lower cost. Arbitrary addition or reduction of illuminator(s) causes no affection to the entire system but to modify the signal data in the controller(s).
摘要:
The present invention relates to a lighting network control system and the corresponding control method. The control system consists of controllers, routers and illuminators connected via the serial connecting signal wires. The controller stores the control images and pictures. It transmits the serial control signal to routers and illuminators. The illuminators read in turn the serial control signal to extract the specific segment and transmit the rest to next device. A router reads in turn the specific segment from the control signal for its own stage. According to the requirements of the control signal, it transmits the control signal to different lighting network branches that connect with it. In the present invention, independent control to individual illuminator in the lighting network is implemented with comparatively lower cost. Arbitrary addition or reduction of illuminator(s) causes no affection to the entire system but to modify the signal data in the controller(s).