摘要:
Processing test results from a plurality of individual semiconductor testers by analyzing each test result at an adaptive test engine. A centralized system jointly analyzes all the test results from the plurality of individual semiconductor testers. The adaptive test engine or the centralized system identifies, based on the analysis of each test result or the joint analysis of all the test results, one or more of: a test environmental issue, a tester variability issue, a tester calibration issue, a product variability issue, and a manufacturing process variability issue. The adaptive test engine or the centralized system determines whether one or more of the plurality of individual semiconductor testers causes one or more of the identified issues or whether semiconductor products tested by the plurality of individual semiconductor testers causes one or more of the identified issues.
摘要:
The present invention describes a method and system for optimizing a test flow within each ATE (Automated Test Equipment) station. The test flow includes a plurality of test blocks. A test block includes a plurality of individual tests. A computing system schedule the test flow based one or more of: a test failure model, test block duration and a yield model. The failure model determines an order or sequence of the test blocks. There are at least two failure models: independent failure model and dependant failure model. The yield model describes whether a semiconductor chip is defective or not. Upon completing the scheduling, the ATE station conducts tests according to the scheduled test flow. The present invention can also be applied to software testing.
摘要:
Processing test results from a plurality of individual semiconductor testers by analyzing each test result at an adaptive test engine. A centralized system jointly analyzes all the test results from the plurality of individual semiconductor testers. The adaptive test engine or the centralized system identifies, based on the analysis of each test result or the joint analysis of all the test results, one or more of: a test environmental issue, a tester variability issue, a tester calibration issue, a product variability issue, and a manufacturing process variability issue. The adaptive test engine or the centralized system determines whether one or more of the plurality of individual semiconductor testers causes one or more of the identified issues or whether semiconductor products tested by the plurality of individual semiconductor testers causes one or more of the identified issues.
摘要:
Processing test results from a plurality of individual semiconductor testers by analyzing each test result at an adaptive test engine. A centralized system jointly analyzes all the test results from the plurality of individual semiconductor testers. The adaptive test engine or the centralized system identifies, based on the analysis of each test result or the joint analysis of all the test results, one or more of: a test environmental issue, a tester variability issue, a tester calibration issue, a product variability issue, and a manufacturing process variability issue. The adaptive test engine or the centralized system determines whether one or more of the plurality of individual semiconductor testers causes one or more of the identified issues or whether semiconductor products tested by the plurality of individual semiconductor testers causes one or more of the identified issues.
摘要:
Processing test results from a plurality of individual semiconductor testers by analyzing each test result at an adaptive test engine. A centralized system jointly analyzes all the test results from the plurality of individual semiconductor testers. The adaptive test engine or the centralized system identifies, based on the analysis of each test result or the joint analysis of all the test results, one or more of: a test environmental issue, a tester variability issue, a tester calibration issue, a product variability issue, and a manufacturing process variability issue. The adaptive test engine or the centralized system determines whether one or more of the plurality of individual semiconductor testers causes one or more of the identified issues or whether semiconductor products tested by the plurality of individual semiconductor testers causes one or more of the identified issues.
摘要:
An in-line motor and pump assembly is supported at the bottom of a fuel storage tank by a pipe and an internal concentric conduit for housing electrical conductors extending therewithin to the motor. An impeller, coaxial with the rotor of the motor, draws the fuel into an annular passageway surrounding the stator of the motor. Further passageways convey the fuel to an annular passageway defined between the pipe and the conduit for discharge external of the storage tank. A low pressure environment attendant the inflow of the fuel is used to channel fuel for lubrication and cooling purposes to a lower journal bearing and thrust bearing supporting a common shaft for the impeller and the motor. A high pressure environment attendant outflow of fuel is used to channel fuel for lubrication and cooling purposes to a journal bearing supporting the upper end of the shaft.
摘要:
An in-line motor and pump assembly is supported at the bottom of a fuel storage tank by a pipe and an internal concentric conduit for housing electrical conductors extending therewithin to the motor. An impeller, coaxial with the rotor of the motor, draws the fuel into an annular passageway surrounding the stator of the motor. Further passageways convey the fuel to an annular passageway defined between the pipe and the conduit for discharge external of the storage tank. A low pressure environment attendant the inflow of the fuel is used to channel fuel for lubrication and cooling purposes to a lower journal bearing and thrust bearing supporting a common shaft for the impeller and the motor. A high pressure environment attendant outflow of fuel is used to channel fuel for lubrication and cooling purposes to a journal bearing supporting the upper end of the shaft.
摘要:
An implementation of a technology, described herein, for facilitating the recognition of content of digital goods. At least one implementation, described herein, derives a probabilistic mirror distribution of a digital good (e.g., digital image or audio signal). It uses the resulting data to derive weighting factors (i.e., coefficients) for the digital good. Based, at least in part on such weighting factors, it determines statistics of the good and quantizes it. The scope of the present invention is pointed out in the appending claims.
摘要:
In an electrochemical fuel cell, a sufficient quantity of catalyst, effective for promoting the reaction of reactant supplied to an electrode, is disposed within the volume of the electrode so that a reactant introduced at a first major surface of the electrode is substantially completely reacted upon contacting the second major surface. Crossover of reactant from one electrode to the other electrode through the electrolyte in an electrochemical fuel cell is thereby reduced.
摘要:
Flow fields comprising a set of fluid distribution channels may be employed in fuel cells for purposes of distributing fluid reactants to an electrochemically active area of the fuel cell. Water management and reactant distribution may be improved by increasing pressure gradients between adjacent channels. Such pressure gradients may be increased by engineering the channels such that the resistance to reactant flow differs along the length of adjacent channels.