Integrated cross-tester analysis and real-time adaptive test

    公开(公告)号:US08855959B2

    公开(公告)日:2014-10-07

    申请号:US12871429

    申请日:2010-08-30

    IPC分类号: G01D3/00 G01P21/00 G01R31/319

    摘要: Processing test results from a plurality of individual semiconductor testers by analyzing each test result at an adaptive test engine. A centralized system jointly analyzes all the test results from the plurality of individual semiconductor testers. The adaptive test engine or the centralized system identifies, based on the analysis of each test result or the joint analysis of all the test results, one or more of: a test environmental issue, a tester variability issue, a tester calibration issue, a product variability issue, and a manufacturing process variability issue. The adaptive test engine or the centralized system determines whether one or more of the plurality of individual semiconductor testers causes one or more of the identified issues or whether semiconductor products tested by the plurality of individual semiconductor testers causes one or more of the identified issues.

    OPTIMAL TEST FLOW SCHEDULING WITHIN AUTOMATED TEST EQUIPMENT FOR MINIMIZED MEAN TIME TO DETECT FAILURE
    2.
    发明申请
    OPTIMAL TEST FLOW SCHEDULING WITHIN AUTOMATED TEST EQUIPMENT FOR MINIMIZED MEAN TIME TO DETECT FAILURE 审中-公开
    在自动测试设备中进行最佳测试流程调度,以最小化平均时间来检测故障

    公开(公告)号:US20110288808A1

    公开(公告)日:2011-11-24

    申请号:US12784142

    申请日:2010-05-20

    IPC分类号: G06F19/00 G01R31/26

    CPC分类号: G06F11/27 G01R31/2894

    摘要: The present invention describes a method and system for optimizing a test flow within each ATE (Automated Test Equipment) station. The test flow includes a plurality of test blocks. A test block includes a plurality of individual tests. A computing system schedule the test flow based one or more of: a test failure model, test block duration and a yield model. The failure model determines an order or sequence of the test blocks. There are at least two failure models: independent failure model and dependant failure model. The yield model describes whether a semiconductor chip is defective or not. Upon completing the scheduling, the ATE station conducts tests according to the scheduled test flow. The present invention can also be applied to software testing.

    摘要翻译: 本发明描述了用于优化每个ATE(自动测试设备)站内的测试流程的方法和系统。 测试流程包括多个测试块。 测试块包括多个单独测试。 计算系统基于以下一个或多个来计划测试流程:测试失败模型,测试块持续时间和产量模型。 故障模型确定测试块的顺序或顺序。 至少有两种故障模型:独立故障模型和依赖故障模型。 产量模型描述了半导体芯片是否有缺陷。 完成调度后,ATE站根据预定的测试流程进行测试。 本发明也可以应用于软件测试。

    INTEGRATED CROSS-TESTER ANALYSIS AND REAL-TIME ADAPTIVE TEST

    公开(公告)号:US20120049881A1

    公开(公告)日:2012-03-01

    申请号:US12871429

    申请日:2010-08-30

    IPC分类号: G01R31/26

    摘要: Processing test results from a plurality of individual semiconductor testers by analyzing each test result at an adaptive test engine. A centralized system jointly analyzes all the test results from the plurality of individual semiconductor testers. The adaptive test engine or the centralized system identifies, based on the analysis of each test result or the joint analysis of all the test results, one or more of: a test environmental issue, a tester variability issue, a tester calibration issue, a product variability issue, and a manufacturing process variability issue. The adaptive test engine or the centralized system determines whether one or more of the plurality of individual semiconductor testers causes one or more of the identified issues or whether semiconductor products tested by the plurality of individual semiconductor testers causes one or more of the identified issues.

    Integrated cross-tester analysis and real-time adaptive test
    4.
    发明授权
    Integrated cross-tester analysis and real-time adaptive test 有权
    集成交叉测试仪分析和实时自适应测试

    公开(公告)号:US08862424B2

    公开(公告)日:2014-10-14

    申请号:US13603892

    申请日:2012-09-05

    摘要: Processing test results from a plurality of individual semiconductor testers by analyzing each test result at an adaptive test engine. A centralized system jointly analyzes all the test results from the plurality of individual semiconductor testers. The adaptive test engine or the centralized system identifies, based on the analysis of each test result or the joint analysis of all the test results, one or more of: a test environmental issue, a tester variability issue, a tester calibration issue, a product variability issue, and a manufacturing process variability issue. The adaptive test engine or the centralized system determines whether one or more of the plurality of individual semiconductor testers causes one or more of the identified issues or whether semiconductor products tested by the plurality of individual semiconductor testers causes one or more of the identified issues.

    摘要翻译: 通过在自适应测试引擎分析每个测试结果来处理来自多个单独的半导体测试器的测试结果。 集中式系统共同分析来自多个单独的半导体测试器的所有测试结果。 自适应测试引擎或集中式系统基于对每个测试结果的分析或所有测试结果的联合分析来识别以下一个或多个:测试环境问题,测试者变异性问题,测试仪校准问题,产品 变异性问题和制造过程变异性问题。 自适应测试引擎或集中式系统确定多个单独半导体测试仪中的一个或多个是否导致所识别的一个或多个问题,或者由多个单独的半导体测试仪测试的半导体产品是否导致所识别的一个或多个问题。

    INTEGRATED CROSS-TESTER ANALYSIS AND REAL-TIME ADAPTIVE TEST
    5.
    发明申请
    INTEGRATED CROSS-TESTER ANALYSIS AND REAL-TIME ADAPTIVE TEST 有权
    综合交叉测试分析和实时自适应测试

    公开(公告)号:US20120330593A1

    公开(公告)日:2012-12-27

    申请号:US13603892

    申请日:2012-09-05

    IPC分类号: G01R31/26 G01R35/00 G06F19/00

    摘要: Processing test results from a plurality of individual semiconductor testers by analyzing each test result at an adaptive test engine. A centralized system jointly analyzes all the test results from the plurality of individual semiconductor testers. The adaptive test engine or the centralized system identifies, based on the analysis of each test result or the joint analysis of all the test results, one or more of: a test environmental issue, a tester variability issue, a tester calibration issue, a product variability issue, and a manufacturing process variability issue. The adaptive test engine or the centralized system determines whether one or more of the plurality of individual semiconductor testers causes one or more of the identified issues or whether semiconductor products tested by the plurality of individual semiconductor testers causes one or more of the identified issues.

    摘要翻译: 通过在自适应测试引擎分析每个测试结果来处理来自多个单独的半导体测试器的测试结果。 集中式系统共同分析来自多个单独的半导体测试器的所有测试结果。 自适应测试引擎或集中式系统基于对每个测试结果的分析或所有测试结果的联合分析来识别以下一个或多个:测试环境问题,测试者变异性问题,测试仪校准问题,产品 变异性问题和制造过程变异性问题。 自适应测试引擎或集中式系统确定多个单独半导体测试仪中的一个或多个是否导致所识别的一个或多个问题,或者由多个单独的半导体测试仪测试的半导体产品是否导致所识别的一个或多个问题。

    SUBMERGED DC BRUSHLESS MOTOR AND PUMP
    6.
    发明申请
    SUBMERGED DC BRUSHLESS MOTOR AND PUMP 有权
    直流无刷马达和泵

    公开(公告)号:US20090202366A1

    公开(公告)日:2009-08-13

    申请号:US12403627

    申请日:2009-03-13

    IPC分类号: F04D29/06 F04D13/08 F04D29/58

    摘要: An in-line motor and pump assembly is supported at the bottom of a fuel storage tank by a pipe and an internal concentric conduit for housing electrical conductors extending therewithin to the motor. An impeller, coaxial with the rotor of the motor, draws the fuel into an annular passageway surrounding the stator of the motor. Further passageways convey the fuel to an annular passageway defined between the pipe and the conduit for discharge external of the storage tank. A low pressure environment attendant the inflow of the fuel is used to channel fuel for lubrication and cooling purposes to a lower journal bearing and thrust bearing supporting a common shaft for the impeller and the motor. A high pressure environment attendant outflow of fuel is used to channel fuel for lubrication and cooling purposes to a journal bearing supporting the upper end of the shaft.

    摘要翻译: 在线电机和泵组件通过管道和内部同心导管支撑在燃料储罐的底部,用于容纳在其中延伸到电动机的电导体。 与电动机的转子同轴的叶轮将燃料吸入围绕电动机定子的环形通道中。 另外的通道将燃料传送到限定在管道和管道之间的环形通道,用于在储罐外部排放。 用于燃料流入的低压环境用于将燃料用于润滑和冷却目的,以将下轴颈轴承和推力轴承支撑在叶轮和电动机的公共轴上。 燃料的高压环境伴随的流出被用于将燃料用于润滑和冷却目的,用于支撑轴的上端的轴颈轴承。

    Submerged motor and pump assembly
    7.
    发明授权
    Submerged motor and pump assembly 有权
    潜水电机和泵组件

    公开(公告)号:US07513755B2

    公开(公告)日:2009-04-07

    申请号:US10883229

    申请日:2004-07-01

    IPC分类号: F04B17/03 F01D25/24 F03B11/08

    摘要: An in-line motor and pump assembly is supported at the bottom of a fuel storage tank by a pipe and an internal concentric conduit for housing electrical conductors extending therewithin to the motor. An impeller, coaxial with the rotor of the motor, draws the fuel into an annular passageway surrounding the stator of the motor. Further passageways convey the fuel to an annular passageway defined between the pipe and the conduit for discharge external of the storage tank. A low pressure environment attendant the inflow of the fuel is used to channel fuel for lubrication and cooling purposes to a lower journal bearing and thrust bearing supporting a common shaft for the impeller and the motor. A high pressure environment attendant outflow of fuel is used to channel fuel for lubrication and cooling purposes to a journal bearing supporting the upper end of the shaft.

    摘要翻译: 在线电机和泵组件通过管道和内部同心导管支撑在燃料储罐的底部,用于容纳在其中延伸到电动机的电导体。 与电动机的转子同轴的叶轮将燃料吸入围绕电动机定子的环形通道中。 另外的通道将燃料传送到限定在管道和管道之间的环形通道,用于在储罐外部排放。 用于燃料流入的低压环境用于将燃料用于润滑和冷却目的,以将下轴颈轴承和推力轴承支撑在叶轮和电动机的公共轴上。 燃料的高压环境伴随的流出被用于将燃料用于润滑和冷却目的,用于支撑轴的上端的轴颈轴承。

    Content recognizer via probabilistic mirror distribution
    8.
    发明授权
    Content recognizer via probabilistic mirror distribution 有权
    内容识别器通过概率镜分配

    公开(公告)号:US07136535B2

    公开(公告)日:2006-11-14

    申请号:US11275216

    申请日:2005-12-19

    IPC分类号: G06K9/36 G06K9/38

    CPC分类号: G06K9/4647

    摘要: An implementation of a technology, described herein, for facilitating the recognition of content of digital goods. At least one implementation, described herein, derives a probabilistic mirror distribution of a digital good (e.g., digital image or audio signal). It uses the resulting data to derive weighting factors (i.e., coefficients) for the digital good. Based, at least in part on such weighting factors, it determines statistics of the good and quantizes it. The scope of the present invention is pointed out in the appending claims.

    摘要翻译: 本文描述的用于促进数字商品内容的识别的技术的实现。 这里描述的至少一个实现导出数字商品(例如,数字图像或音频信号)的概率镜像分布。 它使用得到的数据来导出数字商品的加权因子(即系数)。 至少部分地基于这样的加权因子,它确定好的统计量并量化它。 在所附权利要求中指出了本发明的范围。