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公开(公告)号：US07763876B2
公开(公告)日：2010-07-27
申请号：US11783174
申请日：2007-04-06
IPC分类号： G01N21/86
CPC分类号： G01N21/57 , G01N2021/8663
摘要： A system is provided for measuring gloss and spatial dependence of gloss. In a first embodiment, the system comprises: a first illuminator configured to emit a first light beam at a point on a target, thereby producing a generally specular reflectance in a first direction; a second illuminator configured to emit a second light beam at the point on the target, thereby producing generally diffuse reflectance in the first direction; a linear array sensor configured to detect the generally specular reflectance and the generally diffuse reflectance in the first direction; and a processor configured to process the generally specular reflectance and the generally diffuse reflectance detected by the linear array sensor. In a second embodiment, the system comprises: an illuminator configured to emit a beam of light at a point on a target, thereby producing a generally specular reflectance in a first direction and generally diffuse reflectance in a second direction; a first linear array sensor configured to detect the generally specular reflectance in the first direction; a second linear array sensor configured to detect the generally diffuse reflectance in the second direction; and a processor configured to process the generally specular reflectance detected by the first linear array sensor and the generally diffuse reflectance detected by the second linear array sensor.
摘要翻译： 提供了一种用于测量光泽度和光泽度的空间依赖性的系统。 在第一实施例中，该系统包括：第一照明器，被配置为在目标点上发射第一光束，从而在第一方向上产生大致镜面反射率; 第二照明器，被配置为在所述目标点处发射第二光束，从而在所述第一方向上产生大体上的漫反射; 线性阵列传感器，被配置为检测在第一方向上的通常镜面反射率和大体上漫反射率; 以及处理器，其被配置为处理由线性阵列传感器检测到的大致镜面反射率和大体上漫反射反射。 在第二实施例中，该系统包括：照明器，被配置为在目标点上发射光束，从而在第一方向上产生大致镜面反射率，并且通常在第二方向上扩散反射率; 第一线性阵列传感器，被配置为检测第一方向上的大致镜面反射率; 第二线性阵列传感器，被配置为检测第二方向上的大体漫反射; 以及处理器，其被配置为处理由第一线性阵列传感器检测到的大致镜面反射率和由第二线性阵列传感器检测到的大致漫反射。
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公开(公告)号：US20080245979A1
公开(公告)日：2008-10-09
申请号：US11783174
申请日：2007-04-06
IPC分类号： G01N21/86
CPC分类号： G01N21/57 , G01N2021/8663
摘要： A system is provided for measuring gloss and spatial dependence of gloss. In a first embodiment, the system comprises: a first illuminator configured to emit a first light beam at a point on a target, thereby producing a generally specular reflectance in a first direction; a second illuminator configured to emit a second light beam at the point on the target, thereby producing generally diffuse reflectance in the first direction; a linear array sensor configured to detect the generally specular reflectance and the generally diffuse reflectance in the first direction; and a processor configured to process the generally specular reflectance and the generally diffuse reflectance detected by the linear array sensor. In a second embodiment, the system comprises: an illuminator configured to emit a beam of light at a point on a target, thereby producing a generally specular reflectance in a first direction and generally diffuse reflectance in a second direction; a first linear array sensor configured to detect the generally specular reflectance in the first direction; a second linear array sensor configured to detect the generally diffuse reflectance in the second direction; and a processor configured to process the generally specular reflectance detected by the first linear array sensor and the generally diffuse reflectance detected by the second linear array sensor.
摘要翻译： 提供了一种用于测量光泽度和光泽度的空间依赖性的系统。 在第一实施例中，该系统包括：第一照明器，被配置为在目标点上发射第一光束，从而在第一方向上产生大致镜面反射率; 第二照明器，被配置为在所述目标点处发射第二光束，从而在所述第一方向上产生大体上的漫反射; 线性阵列传感器，被配置为检测在第一方向上的通常镜面反射率和大体上漫反射率; 以及处理器，其被配置为处理由线性阵列传感器检测到的大致镜面反射率和大体上漫反射反射。 在第二实施例中，该系统包括：照明器，被配置为在目标点上发射光束，从而在第一方向上产生大致镜面反射率，并且通常在第二方向上扩散反射率; 第一线性阵列传感器，被配置为检测第一方向上的大致镜面反射率; 第二线性阵列传感器，被配置为检测第二方向上的大体漫反射; 以及处理器，其被配置为处理由第一线性阵列传感器检测到的大致镜面反射率和由第二线性阵列传感器检测到的大致漫反射。
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公开(公告)号：US07271380B2
公开(公告)日：2007-09-18
申请号：US11301613
申请日：2005-12-13
申请人： Martin E. Banton , Paul A. Hosier
发明人： Martin E. Banton , Paul A. Hosier
摘要： A photosensitive apparatus, such as scanner, includes a plurality of pixels, each pixel having associated therewith a set of photosensors, each photosensor filtered to record a primary color. The photosensors are exposed to light of each primary color separately, thereby deriving test signals. A cross-color correction factor for the pixel is derived from the test signals. The cross-color correction factor is used in processing signals output from the pixel when an image is being recorded, so as to isolate the effects of signal crosstalk between closely-spaced photosensors of different colors.
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4.发明授权Image data compensation for optical or spatial error in an array of photosensitive chips 有权感光芯片阵列中的光学或空间误差的图像数据补偿公开(公告)号：US08208684B2
公开(公告)日：2012-06-26
申请号：US12497341
申请日：2009-07-02
CPC分类号： H04N1/047 , G06T3/4007 , H04N1/193 , H04N1/1934 , H04N2201/03162 , H04N2201/04787 , H04N2201/04789 , H04N2201/04791 , H04N2201/04793
摘要： A method of processing image data from a multi-chip array with a plurality of photosensitive chips aligned substantially in a transverse direction, including: generating, using a processor for at least one specially programmed computer, a Δy or Δx optical error value equal to a difference in process and transverse directions, respectively, between actual and apparent locations for a first photosensor, the apparent location due to optical error; and storing, in a memory element for the specially programmed computer, respective outputs from the photosensors in the array for first and second scan lines. The actual location is included in the first scan line. The processor retrieves, for use as at least part of useful image data for the first photosensor, the stored output of: the first photosensor for the second scan line for a Δy optical error, or a second photosensor for the first line for a Δx optical error.
摘要翻译： 一种处理来自多芯片阵列的图像数据的方法，所述多芯片阵列具有基本在横向上排列的多个感光芯片，包括：使用用于至少一个专门编程的计算机的处理器，产生＆Dgr; y或＆Dgr; x光学误差 值分别等于第一光电传感器的实际和表观位置之间的过程和横向方向的差异，由于光学误差引起的表观位置; 以及将用于特殊编程的计算机的存储元件存储在用于第一和第二扫描线的阵列中的光电传感器的相应输出。 实际位置包含在第一条扫描线中。 处理器检索用作第一光电传感器的有用图像数据的至少一部分，存储的输出：用于第一扫描线的第一光电传感器用于光学误差，或用于第一行的第二光电传感器 ＆Dgr; x光学错误。
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5.发明授权Method for dicing a semiconductor wafer, a chip diced from a semiconductor wafer, and an array of chips diced from a semiconductor wafer 有权用于切割半导体晶片的方法，从半导体晶片切割的芯片以及从半导体晶片切割的芯片阵列公开(公告)号：US08129258B2
公开(公告)日：2012-03-06
申请号：US12646590
申请日：2009-12-23
IPC分类号： H01L21/00
CPC分类号： H01L23/544 , H01L21/268 , H01L21/6835 , H01L21/6836 , H01L2221/68327 , H01L2221/68336 , H01L2221/6834 , H01L2223/5442 , H01L2223/54426 , H01L2223/54453 , H01L2924/0002 , H01L2924/00
摘要： A method for dicing a semiconductor wafer, including: cutting a reference slot in a back main surface of the wafer; cutting a back slot in the back main surface, the back slot positioned with respect to the reference slot; determining a desired location for a chip edge with respect to the reference slot; and applying radiant energy in a path such that a series of reformed regions are formed within the wafer along the path. A crystalline structure of the wafer is modified in the series of reformed regions and an alignment of an edge of the laser is with respect to the desired location for the chip edge and in alignment with the back slot. The method includes separating the wafer along the series of reformed regions to divide portions of the wafer on either side of the series of reformed regions.
摘要翻译： 一种用于切割半导体晶片的方法，包括：切割晶片的后主表面中的参考槽; 切割后主表面中的后槽，相对于参考槽定位的后槽; 确定芯片边缘相对于参考时隙的期望位置; 并且在路径中施加辐射能，使得沿着路径在晶片内形成一系列重整区。 在一系列重整区域中修改了晶片的晶体结构，并且激光器边缘的对准相对于芯片边缘的期望位置并与后槽对准。 该方法包括沿着一系列重整区域分离晶片以将晶片的部分划分在一系列重整区域的两侧。
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6.发明授权Systems and methods for streak detection in image array scanning using overdetermined scanners and column filtering 失效使用超定义扫描仪和列过滤的图像阵列扫描中条纹检测的系统和方法公开(公告)号：US07359093B2
公开(公告)日：2008-04-15
申请号：US10845164
申请日：2004-05-14
申请人： Stuart A. Schweid , Shen-ge Wang , Paul A. Hosier
发明人： Stuart A. Schweid , Shen-ge Wang , Paul A. Hosier
IPC分类号： H04N1/409
CPC分类号： H04N1/4097 , H04N1/00092 , H04N1/1215 , H04N1/193
摘要： A streak detection method and system in a fixed imaging array digital scanning system obtains image data from each of the plurality of rows in the at least one full color spectrum channel set of rows of positionally discrete sensors and integrates this data to produce an estimate of image data recorded by at least one clear channel row of positionally discrete sensors. A clear channel error signal is generated by the comparison to alert the operator to the presence of non-image data. The clear channel error signal may be refined to through a low pass column filtering process in order to filter out potentially erroneous clear channel error resulting from thermal, mechanical or other noise sources unrelated to image scanning. Stationary obstructions in the field of view of the imaging array, or defects in one or more sensors in the imaging array, are detected through this comparison which would otherwise appear repeatedly reproduced as streaks or lines in the reproduced output image.
摘要翻译： 固定成像阵列数字扫描系统中的条纹检测方法和系统从至少一个位置离散传感器行的全色谱通道组中的多行中的每一行获得图像数据，并对该数据进行积分以产生图像估计 通过位置离散传感器的至少一个清晰通道行记录的数据。 通过比较产生清晰的通道错误信号，以向操作员警告非图像数据的存在。 可以通过低通列滤波处理来将清除信道误差信号细化为过滤掉与图像扫描无关的热，机械或其它噪声源引起的潜在错误的清除信道误差。 通过该比较来检测成像阵列的视场中的固定障碍物或成像阵列中的一个或多个传感器中的缺陷，否则该比较将被再现为再现的输出图像中的条纹或线条。
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7.发明授权Use of a U-groove as an alternative to using a V-groove for protection against dicing induced damage in silicon 失效使用U形槽作为使用V形槽的替代方案来防止在硅中切割引起的损坏公开(公告)号：US06955989B2
公开(公告)日：2005-10-18
申请号：US09996681
申请日：2001-11-30
申请人： Alain E. Perregaux , Paul A. Hosier , Josef E. Jedlicka , Nicholas J. Salatino , Jagdish C. Tandon
发明人： Alain E. Perregaux , Paul A. Hosier , Josef E. Jedlicka , Nicholas J. Salatino , Jagdish C. Tandon
IPC分类号： B28D5/02 , H01L21/301 , H01L21/3065 , H01L21/302
摘要： The present disclosure relates that by modifying chip die dicing methodology to a U-groove profile from a V-groove profile by modifying the second etch step to be a dry etch instead of a wet etch results in a direct cost savings by eliminating a more expensive process step, as well as the need for stripping the developed photoresist layer. Furthermore, going to a U-groove profile accomplishes additional indirect and greater cost savings resulting from increased process throughput, improved yield, and reduced metal layer defects.
摘要翻译： 本公开内容涉及通过将第二蚀刻步骤通过将第二蚀刻步骤修改为干蚀刻而不是湿蚀刻将芯片芯片切割方法修改为U形沟槽轮廓导致通过消除更昂贵的直接成本节省 工艺步骤，以及剥离显影的光致抗蚀剂层的需要。 此外，进入U形凹槽轮廓可实现额外的间接和更大的成本节省，这是由于加工量增加，产量提高和金属层缺陷减少。
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公开(公告)号：US6157019A
公开(公告)日：2000-12-05
申请号：US282317
申请日：1999-03-31
申请人： Paul A. Hosier
发明人： Paul A. Hosier
IPC分类号： H01L27/14 , G06T1/00 , H01L27/146 , H04N1/028 , H01L27/00 , H01L31/0232 , H01L31/062
CPC分类号： H01L27/14643 , H01L27/14621 , H01L27/14623 , H01L27/14632
摘要： The present invention relates to photosensitive chips for creating electrical signals from an original image, as would be found for example in a digital scanner, copier, facsimile machine, or other document generating or reproducing device. More specifically, the present invention provides a way of shielding the edge photosites with an opaque layer that overlaps the diced region and preserves the integrity of the filter layers while eliminating the need for a guardring to decrease the dead space and consequently reduce the undesirable effects of Moire patterns.
摘要翻译： 本发明涉及用于从原始图像产生电信号的感光芯片，例如在数字扫描仪，复印机，传真机或其他文件生成或再现装置中可以找到。 更具体地说，本发明提供了一种通过与切割区域重叠的不透明层来屏蔽边缘光电子的方式，并且保持了滤光层的完整性，同时消除了防护装置的需要以减小死空间，并因此减少不利影响 Moir + E，acu e + EE图案。
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9.发明授权
公开(公告)号：US6014160A
公开(公告)日：2000-01-11
申请号：US50272
申请日：1998-03-30
CPC分类号： H04N1/1934 , H04N1/193 , H04N1/40 , H04N3/1581 , H04N3/1593
摘要： An image sensor array includes a plurality of photosensor chips, which are butted end-to-end to form a single linear array of photosensors. Each individual chip in the array is provided with an independently-addressable output enable line and video output line. This configuration allows individual chips to be addressed to output image data at specific times and in a specific manner suitable for any kind of downstream circuitry.
摘要翻译： 图像传感器阵列包括多个光电传感器芯片，它们被端对端对接以形成光电传感器的单个线性阵列。 阵列中的每个芯片都提供独立可寻址的输出使能线和视频输出线。 这种配置允许单独的芯片被寻址以在特定时间和以适合于任何种类的下游电路的特定方式输出图像数据。
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公开(公告)号：US5696626A
公开(公告)日：1997-12-09
申请号：US542247
申请日：1995-10-12
IPC分类号： H01L31/0216 , H04N1/04
CPC分类号： H01L31/02162
摘要： A photosensitive chip, such as used in a scanner or facsimile, defines a linear array of photosites, each photosite being covered with a filter formed from a cured translucent liquid. At the critical ends of the chip, between the end photosite in the array and the edge of the chip, there is provided a ridge which protrudes over the thickness of the filter. This ridge maintains the physical integrity of the filter.
摘要翻译： 诸如用于扫描仪或传真机中的感光芯片限定了一种线性阵列的光斑，每个光斑都被由固化的半透明液体形成的过滤器覆盖。 在芯片的临界端，在阵列中的端部闪光和芯片的边缘之间，设置有突出于过滤器厚度的脊。 该脊保持过滤器的物理完整性。
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