摘要:
A vehicle auxiliary power supply device includes a resonant inverter circuit that converts DC input into a desired AC voltage and outputs the AC voltage and a control unit. The control unit includes a resonance-time managing unit managing resonance time of current flowing in the resonant inverter circuit, a gate-off-command generating unit detecting overcurrent flowing in the resonant inverter circuit based on detected current of a current detector, and, when the overcurrent is detected, generating, based on detected current of the current detector and resonance time managed by the resonance-time managing unit, a gate-off command to turn off switching elements included in the resonant inverter circuit after the elapse of time after which current flowing in the switching elements becomes zero for the first time, and a gate-signal generating unit generating a gate signal that controls the switching elements to be turned off when the gate-off command is input.
摘要:
A vehicle auxiliary power supply device includes a resonant inverter circuit that converts DC input into a desired AC voltage and outputs the AC voltage and a control unit. The control unit includes a resonance-time managing unit managing resonance time of current flowing in the resonant inverter circuit, a gate-off-command generating unit detecting overcurrent flowing in the resonant inverter circuit based on detected current of a current detector, and, when the overcurrent is detected, generating, based on detected current of the current detector and resonance time managed by the resonance-time managing unit, a gate-off command to turn off switching elements included in the resonant inverter circuit after the elapse of time after which current flowing in the switching elements becomes zero for the first time, and a gate-signal generating unit generating a gate signal that controls the switching elements to be turned off when the gate-off command is input.
摘要:
An object of the present invention is to provide an electron microscope that employs a hologram of a diffraction pattern to reconstruct a microscopic image involving no imaging aberration due to image forming lenses, as well as a combined illumination lens used for such an electron microscope. The electron microscope according to the present invention has an electron source (11), a condenser lens (12), a biprism (13) to split an electron beam supplied from the condenser lens (12) into coherent first and second electron beams (L1, L2) that are parallel to each other, a combined illumination lens (15) to make the first electron beam (L1) into a parallel wave and the second electron beam (L2) into a converging wave that converges at a predetermined distance, a sample stage (16) to hold a sample illuminated with the first electron beam (L1), a detector (17) to detect a hologram of a diffraction pattern formed by interference of the first electron beam (L1) with the second electron beam (L2), a computing unit (18) to conduct a predetermined Fourier transform on the hologram supplied from the detector (17) and reconstruct a microscopic image of the sample, and a display (19) to display the reconstructed microscopic image.
摘要:
An object of the present invention is to provide an electron microscope that employs a hologram of a diffraction pattern to reconstruct a microscopic image involving no imaging aberration due to image forming lenses, as well as a combined illumination lens used for such an electron microscope. The electron microscope according to the present invention has an electron source (11), a condenser lens (12), a biprism (13) to split an electron beam supplied from the condenser lens (12) into coherent first and second electron beams (L1, L2) that are parallel to each other, a combined illumination lens (15) to make the first electron beam (L1) into a parallel wave and the second electron beam (L2) into a converging wave that converges at a predetermined distance, a sample stage (16) to hold a sample illuminated with the first electron beam (L1), a detector (17) to detect a hologram of a diffraction pattern formed by interference of the first electron beam (L1) with the second electron beam (L2), a computing unit (18) to conduct a predetermined Fourier transform on the hologram supplied from the detector (17) and reconstruct a microscopic image of the sample, and a display (19) to display the reconstructed microscopic image.