公开(公告)号：US07816955B2

公开(公告)日：2010-10-19

申请号：US12044108

申请日：2008-03-07

申请人： Masayoshi Takahashi ,  Kengo Imagawa ,  Norio Chujo

发明人： Masayoshi Takahashi ,  Kengo Imagawa ,  Norio Chujo

IPC分类号： H03K4/06

CPC分类号： H03K4/06 ,  H01J37/1477 ,  H01J37/28 ,  H03K3/0231

摘要： The present invention provides a ramp generator capable of appropriately setting a rise starting point of an output voltage of a ramp waveform and an output voltage at the time of stable output. A current adjustment unit including a differential pair of transistors and an amplifier constitute a feedback circuit. By controlling the charging/discharging of an integration capacitor by ON/OFF of a discharge current source connected to a common emitter terminal of the current adjustment unit, an output of the ramp waveform outputted from an output terminal disposed at the connection end of the integration capacitor is controlled.

摘要翻译： 本发明提供一种斜坡发生器，其能够适当地设定稳定输出时的斜坡波形的输出电压的上升起点和输出电压。 包括差分对晶体管和放大器的电流调节单元构成反馈电路。 通过连接到电流调节单元的公共发射极端子的放电电流源的ON / OFF来控制积分电容器的充电/放电，从设置在集成连接端的输出端子输出的斜坡波形的输出 电容器被控制。

公开(公告)号：US20080231330A1

公开(公告)日：2008-09-25

申请号：US12044108

申请日：2008-03-07

申请人： Masayoshi Takahashi ,  Kengo Imagawa ,  Norio Chujo

发明人： Masayoshi Takahashi ,  Kengo Imagawa ,  Norio Chujo

IPC分类号： H03K4/06

CPC分类号： H03K4/06 ,  H01J37/1477 ,  H01J37/28 ,  H03K3/0231

摘要： The present invention provides a ramp generator capable of appropriately setting a rise starting point of an output voltage of a ramp waveform and an output voltage at the time of stable output. A current adjustment unit including a differential pair of transistors and an amplifier constitute a feedback circuit. By controlling the charging/discharging of an integration capacitor by ON/OFF of a discharge current source connected to a common emitter terminal of the current adjustment unit, an output of the ramp waveform outputted from an output terminal disposed at the connection end of the integration capacitor is controlled.

摘要翻译： 本发明提供一种斜坡发生器，其能够适当地设定稳定输出时的斜坡波形的输出电压的上升起点和输出电压。 包括差分对晶体管和放大器的电流调节单元构成反馈电路。 通过连接到电流调节单元的公共发射极端子的放电电流源的ON / OFF来控制积分电容器的充电/放电，从设置在集成连接端的输出端子输出的斜坡波形的输出 电容器被控制。

公开(公告)号：US06774680B2

公开(公告)日：2004-08-10

申请号：US10379540

申请日：2003-03-06

申请人： Kengo Imagawa ,  Norio Chujo ,  Kaoru Arita ,  Yoshiharu Umemura ,  Masahiro Imanari

发明人： Kengo Imagawa ,  Norio Chujo ,  Kaoru Arita ,  Yoshiharu Umemura ,  Masahiro Imanari

IPC分类号： H03K522

CPC分类号： H03F3/45152 ,  H03F2203/45472 ,  H03F2203/45658 ,  H03F2203/45681 ,  H03K5/08 ,  H03K5/2409

摘要： A comparator is provided with a pair of transistors which are continuously in ON state, in which a switch unit constructed of a diode pair, for switching a current path in response to a high/low relationship between a voltage level of an input signal and a voltage level of a reference voltage, and a unit for converting a current into a voltage level are provided between emitter terminals of the transistor pair.

摘要翻译： 比较器具有连续处于导通状态的一对晶体管，其中由二极管对构成的开关单元用于响应于输入信号的电压电平和 参考电压的电压电平和用于将电流转换成电压电平的单元设置在晶体管对的发射极端子之间。

公开(公告)号：US07358953B2

公开(公告)日：2008-04-15

申请号：US10714943

申请日：2003-11-18

申请人： Masami Makuuchi ,  Kengo Imagawa ,  Norio Chujo ,  Ritsuro Orihashi ,  Yoshitomo Arai ,  Atsushi Obuchi

发明人： Masami Makuuchi ,  Kengo Imagawa ,  Norio Chujo ,  Ritsuro Orihashi ,  Yoshitomo Arai ,  Atsushi Obuchi

IPC分类号： G09G3/36

CPC分类号： G09G3/006 ,  G09G3/3648 ,  G09G5/006 ,  G09G5/39 ,  G09G2310/027 ,  Y10S345/904

摘要： A semiconductor device having a liquid crystal driving circuit is disclosed. The driving circuit includes a digital functional unit and an analog functional unit. The digital functional unit is comprised of a display controller and a display data storage RAM, while the analog functional unit is made up of a gradation voltage generating circuit and a gradation voltage selecting circuit. The digital and analog function units are functionally divided from each other and testing of the digital function and testing of the analog function unit are performed in an overlapping manner independently from each other.

摘要翻译： 公开了一种具有液晶驱动电路的半导体器件。 驱动电路包括数字功能单元和模拟功能单元。 数字功能单元包括显示控制器和显示数据存储RAM，而模拟功能单元由灰度电压产生电路和灰度电压选择电路组成。 数字和模拟功能单元在功能上彼此划分，并且以彼此独立的重叠方式执行数字功能的测试和模拟功能单元的测试。

公开(公告)号：US20050122300A1

公开(公告)日：2005-06-09

申请号：US10981715

申请日：2004-11-05

申请人： Masami Makuuchi ,  Norio Chujo ,  Kengo Imagawa ,  Ritsuro Orihashi ,  Yoshitomo Arai

发明人： Masami Makuuchi ,  Norio Chujo ,  Kengo Imagawa ,  Ritsuro Orihashi ,  Yoshitomo Arai

IPC分类号： G01R31/316 ,  G01R31/28 ,  G02F1/133 ,  G09G3/00 ,  G09G3/20 ,  G09G3/36 ,  H01L21/822 ,  H01L27/04

CPC分类号： G09G3/006 ,  G09G3/3688

摘要： A semiconductor device according to the present invention has a liquid crystal driver circuit, and when gray-scale voltage thereof is tested, the gray-scale voltage (Vx) generated in a gray-scale voltage generator circuit provided therein is compared with reference voltage (e.g., Vx+ΔV) generated for testing the gray-scale voltage and the test result is output as binarized voltage from external terminals of the semiconductor device. This can speed up the gray-scale voltage test even in the case of higher gray scale in the liquid crystal driver circuit or increased number of output terminals of the semiconductor device. Therefore, it becomes possible to reduce the time and cost required for the test.

摘要翻译： 根据本发明的半导体器件具有液晶驱动电路，并且当其灰度电压被测试时，在其中提供的灰度级电压发生器电路中产生的灰度电压（Vx）与参考电压（ 例如，用于测试灰度电压而生成的Vx + DeltaV）和测试结果作为来自半导体器件的外部端子的二值化电压输出。 即使在液晶驱动电路中较高的灰度级或半导体器件的输出端数量增加的情况下，也可以加快灰度电压测试。 因此，可以减少测试所需的时间和成本。

公开(公告)号：US07474290B2

公开(公告)日：2009-01-06

申请号：US10981715

申请日：2004-11-05

申请人： Masami Makuuchi ,  Norio Chujo ,  Kengo Imagawa ,  Ritsuro Orihashi ,  Yoshitomo Arai

发明人： Masami Makuuchi ,  Norio Chujo ,  Kengo Imagawa ,  Ritsuro Orihashi ,  Yoshitomo Arai

IPC分类号： G09G3/36

CPC分类号： G09G3/006 ,  G09G3/3688

摘要： A semiconductor device according to the present invention has a liquid crystal driver circuit, and when gray-scale voltage thereof is tested, the gray-scale voltage (Vx) generated in a gray-scale voltage generator circuit provided therein is compared with reference voltage (e.g., Vx+ΔV) generated for testing the gray-scale voltage and the test result is output as binarized voltage from external terminals of the semiconductor device. This can speed up the gray-scale voltage test even in the case of higher gray scale in the liquid crystal driver circuit or increased number of output terminals of the semiconductor device. Therefore, it becomes possible to reduce the time and cost required for the test.

摘要翻译： 根据本发明的半导体器件具有液晶驱动电路，并且当其灰度电压被测试时，在其中提供的灰度级电压发生器电路中产生的灰度电压（Vx）与参考电压（ 例如，用于测试灰度电压而生成的Vx + DeltaV）和测试结果作为来自半导体器件的外部端子的二值化电压输出。 即使在液晶驱动电路中较高的灰度级或半导体器件的输出端数量增加的情况下，也可以加快灰度电压测试。 因此，可以减少测试所需的时间和成本。

公开(公告)号：US07443373B2

公开(公告)日：2008-10-28

申请号：US11002143

申请日：2004-12-03

申请人： Kengo Imagawa ,  Masami Makuuchi ,  Norio Chujo ,  Ritsuro Orihashi ,  Yoshitomo Arai

发明人： Kengo Imagawa ,  Masami Makuuchi ,  Norio Chujo ,  Ritsuro Orihashi ,  Yoshitomo Arai

IPC分类号： G09G3/36

CPC分类号： G09G3/3677 ,  G09G3/006 ,  G09G2310/0289

摘要： A problem, which one of the inventions included in the present application solves, is to provide a semiconductor device that can simultaneously test a plurality of output pins by less channels of a semiconductor test equipment in number than the integrated output pins of the semiconductor device. Representative one of the inventions has such a configuration that an LCD driver, which is the semiconductor device having a function of driving a gate line of a liquid crystal display panel, comprises: an exclusive-OR circuit for inverting polarities of positive and negative voltages for driving the gate line; a tri-state type inverter circuit capable of changing and controlling, to a high-impedance state, an output circuit for driving the gate line; and at least one of test control terminals TEST for controlling the exclusive-OR circuit and the tri-state type inverter circuit. When a test is conducted, only one terminal of the gate output outputs a positive voltage VGH or negative voltage VGL and the other terminal is set to a high-impedance state, whereby the plurality of gate outputs are simultaneously tested.

摘要翻译： 包括在本申请中的发明中的一个解决的问题是提供一种半导体器件，其可以通过半导体测试设备的数量少于半导体器件的集成输出引脚的较少通道同时测试多个输出引脚。 代表性的发明之一具有这样的结构，即作为具有驱动液晶显示面板的栅极线的功能的半导体器件的LCD驱动器包括：用于将正和负电压的极性反转的异或电路， 驾驶门线; 能够改变和控制高阻抗状态的用于驱动栅极线的输出电路的三态逆变器电路; 以及用于控制异或电路和三态逆变器电路的测试控制端子TEST中的至少一个。 当进行测试时，仅栅极输出的一个端子输出正电压VGH或负电压VGL，另一个端子被设置为高阻抗状态，从而同时测试多个栅极输出。

公开(公告)号：US20050122297A1

公开(公告)日：2005-06-09

申请号：US11002143

申请日：2004-12-03

申请人： Kengo Imagawa ,  Masami Makuuchi ,  Norio Chujo ,  Ritsuro Orihashi ,  Yoshitomo Arai

发明人： Kengo Imagawa ,  Masami Makuuchi ,  Norio Chujo ,  Ritsuro Orihashi ,  Yoshitomo Arai

IPC分类号： G01R31/28 ,  G02F1/1345 ,  G09G3/00 ,  G09G3/20 ,  G09G3/36

CPC分类号： G09G3/3677 ,  G09G3/006 ,  G09G2310/0289

摘要： A problem, which one of the inventions included in the present application solves, is to provide a semiconductor device that can simultaneously test a plurality of output pins by less channels of a semiconductor test equipment in number than the integrated output pins of the semiconductor device. Representative one of the inventions has such a configuration that an LCD driver, which is the semiconductor device having a function of driving a gate line of a liquid crystal display panel, comprises: an exclusive-OR circuit for inverting polarities of positive and negative voltages for driving the gate line; a tri-state type inverter circuit capable of changing and controlling, to a high-impedance state, an output circuit for driving the gate line; and at least one of test control terminals TEST for controlling the exclusive-OR circuit and the tri-state type inverter circuit. When a test is conducted, only one terminal of the gate output outputs a positive voltage VGH or negative voltage VGL and the other terminal is set to a high-impedance state, whereby the plurality of gate outputs are simultaneously tested.

摘要翻译： 包括在本申请中的发明中的一个解决的问题是提供一种半导体器件，其可以通过半导体测试设备的数量少于半导体器件的集成输出引脚的较少通道同时测试多个输出引脚。 代表性的发明之一具有这样的结构，即作为具有驱动液晶显示面板的栅极线的功能的半导体器件的LCD驱动器包括：用于将正和负电压的极性反转的异或电路， 驾驶门线; 能够改变和控制高阻抗状态的用于驱动栅极线的输出电路的三态逆变器电路; 以及用于控制异或电路和三态逆变器电路的测试控制端子TEST中的至少一个。 当进行测试时，仅栅极输出的一个端子输出正电压VGH或负电压VGL，另一个端子被设置为高阻抗状态，从而同时测试多个栅极输出。

公开(公告)号：US20080278717A1

公开(公告)日：2008-11-13

申请号：US12116241

申请日：2008-05-07

申请人： Masami Makuuchi ,  Ritsurou Orihashi ,  Masayoshi Takahashi ,  Wen Li ,  Kengo Imagawa ,  Takahiro Jingu

发明人： Masami Makuuchi ,  Ritsurou Orihashi ,  Masayoshi Takahashi ,  Wen Li ,  Kengo Imagawa ,  Takahiro Jingu

IPC分类号： G01N21/88

CPC分类号： G01N21/9501 ,  G01N21/94 ,  G01N2201/1241

摘要： The detection part has: a subtraction module for calculating correction data from data of detection systems when a reference-voltage generation module applies a reference voltage to the detection systems; a data-holding module for holding the correction data; an addition module for making a correction of detection data; a comparison module for comparing the detection data with switching data; and a selector for switching data of the detection systems including data subjected to the correction according to the output of the comparison module.

摘要翻译： 检测部具有：减法模块，用于当参考电压产生模块向检测系统施加参考电压时，从检测系统的数据计算校正数据; 用于保持校正数据的数据保持模块; 用于对检测数据进行校正的加法模块; 比较模块，用于将检测数据与切换数据进行比较; 以及选择器，用于根据比较模块的输出来切换包括经过校正的数据的检测系统的数据。

公开(公告)号：US08035071B2

公开(公告)日：2011-10-11

申请号：US12116241

申请日：2008-05-07

申请人： Masami Makuuchi ,  Ritsurou Orihashi ,  Masayoshi Takahashi ,  Wen Li ,  Kengo Imagawa ,  Takahiro Jingu

发明人： Masami Makuuchi ,  Ritsurou Orihashi ,  Masayoshi Takahashi ,  Wen Li ,  Kengo Imagawa ,  Takahiro Jingu

IPC分类号： G01N21/88

CPC分类号： G01N21/9501 ,  G01N21/94 ,  G01N2201/1241

摘要： The detection part has: a subtraction module for calculating correction data from data of detection systems when a reference-voltage generation module applies a reference voltage to the detection systems; a data-holding module for holding the correction data; an addition module for making a correction of detection data; a comparison module for comparing the detection data with switching data; and a selector for switching data of the detection systems including data subjected to the correction according to the output of the comparison module.

摘要翻译： 检测部具有：减法模块，用于当参考电压产生模块向检测系统施加参考电压时，从检测系统的数据计算校正数据; 用于保持校正数据的数据保持模块; 用于对检测数据进行校正的加法模块; 比较模块，用于将检测数据与切换数据进行比较; 以及选择器，用于根据比较模块的输出来切换包括经过校正的数据的检测系统的数据。