Nonvolatile semiconductor memory device and method of manufacturing the same
    10.
    发明授权
    Nonvolatile semiconductor memory device and method of manufacturing the same 失效
    非易失性半导体存储器件及其制造方法

    公开(公告)号:US08017989B2

    公开(公告)日:2011-09-13

    申请号:US12659703

    申请日:2010-03-17

    IPC分类号: H01L29/788

    摘要: A nonvolatile semiconductor memory device including a semiconductor substrate having a semiconductor layer and an insulating material provided on a surface thereof, a surface of the insulating material is covered with the semiconductor layer, and a plurality of memory cells provided on the semiconductor layer, the memory cells includes a first dielectric film provided by covering the surface of the semiconductor layer, a plurality of charge storage layers provided above the insulating material and on the first dielectric film, a plurality of second dielectric films provided on the each charge storage layer, a plurality of conductive layers provided on the each second dielectric film, and an impurity diffusion layer formed partially or overall at least above the insulating material and inside the semiconductor layer and at least a portion of a bottom end thereof being provided by an upper surface of the insulating material.

    摘要翻译: 一种非易失性半导体存储器件,包括具有半导体层和设置在其表面上的绝缘材料的半导体衬底,绝缘材料的表面被半导体层覆盖,并且设置在半导体层上的多个存储单元,存储器 电池包括通过覆盖半导体层的表面而提供的第一电介质膜,设置在绝缘材料上方和第一电介质膜上的多个电荷存储层,设置在每个电荷存储层上的多个第二电介质膜,多个 设置在每个第二电介质膜上的导电层,以及杂质扩散层,其部分或整体形成在绝缘材料的至少上方和半导体层的内部,并且其底端的至少一部分由绝缘体的上表面 材料。