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    Methods and apparatus for autonomous 3D self-assembly, spatial docking and reconfiguration
    2.
    发明授权
    Methods and apparatus for autonomous 3D self-assembly, spatial docking and reconfiguration 有权

    公开(公告)号：US12110131B2

    公开(公告)日：2024-10-08

    申请号：US17591234

    申请日：2022-02-02

    Applicant: Massachusetts Institute of Technology

    Inventor： Ariel Ekblaw ,  Joseph A. Paradiso

    IPC: B64G1/22 ,  G01R33/038

    CPC classification number: B64G1/22 ,  G01R33/0385

    Abstract: A method for autonomously assembling a plurality of tiles is performed in a microgravity environment. Each tile includes a shell having a first geometrical shape and an arrangement of first magnets and a controller that are supported by the shell. The controller controls operation of the arrangement of first magnets to self-assemble the shell with another tile. The first magnets are controlled to mate with a complementary arrangement of second magnets on the other tile when the complementary arrangement of second magnets floats to within a range of magnetic attractive force of the arrangement of first magnets, with or without the aid of propulsion. The controllers in the tiles detect the status of the magnetic bonds to determine whether each pair of tiles is properly bonded or has a magnetic bond error. When an error is detected, the tiles are controlled to disassemble and reassemble to correct the error.

    System for Introspection and Annotation of Electronic Circuit Design Data
    3.
    发明申请
    System for Introspection and Annotation of Electronic Circuit Design Data 审中-公开
    电子电路设计数据的内省和注释系统

    公开(公告)号：US20160350472A1

    公开(公告)日：2016-12-01

    申请号：US15232620

    申请日：2016-08-09

    Applicant: Massachusetts Institute of Technology

    Inventor： Pragun Goyal ,  Joseph A. Paradiso

    IPC: G06F17/50 ,  G01R1/067 ,  G01R31/28

    CPC classification number: G06F17/5081 ,  G01R1/06788 ,  G01R31/2806 ,  G01R31/2834 ,  G06F17/50 ,  G06Q10/00

    Abstract: A system for introspection and annotation of electronic design data includes a tracked probe that interacts with an electronic circuit, a tracking system, schematics, design files, or models for the circuit, electronic design system software, and a user interface. The probe has a sensor that tracks the position of the probe within the circuit. The tracking system receives data from the sensor and translates it into coordinates reflecting the location of the probe within the circuit. The software uses the probe coordinates to locate the position of the probe on the circuit schematic, identify the circuit component at the probe location, and display information about the identified feature. The displayed information preferably includes an annotated version of the circuit schematic. The system may include a measurement or instrumentation device, the probe may include at least one parameter measurement device, and the display may include information derived from the parameter measurements.

    Abstract translation: 用于电子设计数据的内省和注释的系统包括与电子电路，跟踪系统，原理图，设计文件或电路模型，电子设计系统软件和用户界面交互的跟踪探针。 探头具有跟踪电路内探头位置的传感器。 跟踪系统从传感器接收数据并将其转换为反映探针在电路内的位置的坐标。 软件使用探头坐标来定位探针在电路原理图上的位置，识别探针位置处的电路组件，并显示有关识别的特征的信息。 显示的信息优选地包括电路原理图的注释版本。 系统可以包括测量或仪器装置，探针可以包括至少一个参数测量装置，并且显示器可以包括从参数测量得到的信息。

    System for introspection and annotation of electronic circuit design data
    6.
    发明授权
    System for introspection and annotation of electronic circuit design data 有权

    公开(公告)号：US10380311B2

    公开(公告)日：2019-08-13

    申请号：US15232620

    申请日：2016-08-09

    Applicant: Massachusetts Institute of Technology

    Inventor： Pragun Goyal ,  Joseph A. Paradiso

    IPC: G06F17/50 ,  G01R1/067 ,  G01R31/28 ,  G06Q10/00

    Abstract: A system for introspection and annotation of electronic design data includes a tracked probe that interacts with an electronic circuit, a tracking system, schematics, design files, or models for the circuit, electronic design system software, and a user interface. The probe has a sensor that tracks the position of the probe within the circuit. The tracking system receives data from the sensor and translates it into coordinates reflecting the location of the probe within the circuit. The software uses the probe coordinates to locate the position of the probe on the circuit schematic, identify the circuit component at the probe location, and display information about the identified feature. The displayed information preferably includes an annotated version of the circuit schematic. The system may include a measurement or instrumentation device, the probe may include at least one parameter measurement device, and the display may include information derived from the parameter measurements.

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