摘要:
An adjustable gain line driver receives an input signal and a gain control signal and outputs a signal with a swing, and the swing is measured to generate a swing measurement signal. A target swing signal is generated having a target swing, and the target swing signal is measured to generate a target swing reference signal. The swing measurement signal is compared to the target swing reference control signal and a counter generating the gain control signal is incremented until the measurement signal meets the target swing reference signal. Optionally a reset signal resets the counter, and the gain control signal, at predetermined events.
摘要:
A clock/data recovery circuit includes an edge detector circuit operable to receive a serial data burst and to generate a reset signal in response to a first edge of the serial data burst. The clock/data recovery circuit may also include an oscillator coupled to the edge detector circuit. The oscillator locks onto a target data rate prior to receipt of the serial data burst and locks onto a phase of the serial data burst in response to the reset signal. The clock/data recovery circuit may also include a phase detector circuit that receives the serial data burst. The phase detector circuit is coupled to the oscillator. The phase detector circuit adjusts the oscillator to maintain the lock onto the phase of the serial data burst during the serial data burst.
摘要:
A clock/data recovery circuit includes an edge detector circuit operable to receive a serial data burst and to generate a reset signal in response to a first edge of the serial data burst. The clock/data recovery circuit may also include an oscillator coupled to the edge detector circuit. The oscillator locks onto a target data rate prior to receipt of the serial data burst and locks onto a phase of the serial data burst in response to the reset signal. The clock/data recovery circuit may also include a phase detector circuit that receives the serial data burst. The phase detector circuit is coupled to the oscillator. The phase detector circuit adjusts the oscillator to maintain the lock onto the phase of the serial data burst during the serial data burst.
摘要:
A method of forming a memory cell includes coupling a first transistor between a supply rail of a memory cell and a node operable to accept a supply voltage. The method further includes coupling a second transistor between a ground rail of the cell and a node operable to accept a ground. In one embodiment, the method includes forming the cell to accept selectively applied external voltages, wherein the external voltages are selected to minimize leakage current in the cell. In another embodiment, the method includes forming at least one of the first and the second transistors to have a channel width and/or a threshold voltage selected to minimize a total leakage current in the cell.
摘要:
In one embodiment, a memory block includes one or more bit lines that each include two or more cells. Each cell in each bit line has a distance from a sense amplifier coupled to the bit line, and each of one or more of the cells in each of one or more of the bit lines has a delay particularly set according to the distance of the cell from the sense amplifier coupled to the bit line.
摘要:
In one embodiment, a memory block includes one or more bit lines that each include two or more cells. Each cell in each bit line has a distance from a sense amplifier coupled to the bit line, and each of one or more of the cells in each of one or more of the bit lines has a delay particularly set according to the distance of the cell from the sense amplifier coupled to the bit line.
摘要:
A method of forming a memory cell includes coupling a first transistor between a supply rail of a memory cell and a node operable to accept a supply voltage. The method further includes coupling a second transistor between a ground rail of the cell and a node operable to accept a ground. In one embodiment, the method includes forming the cell to accept selectively applied external voltages, wherein the external voltages are selected to minimize leakage current in the cell. In another embodiment, the method includes forming at least one of the first and the second transistors to have a channel width and/or a threshold voltage selected to minimize a total leakage current in the cell.