摘要:
Methods and apparatuses are provided for increased efficiency in a processor via early instruction completion. An apparatus is provided for increased efficiency in a processor via early instruction completion. The apparatus comprises an execution unit for processing instructions and determining whether a later issued instruction is ready for completion or an earlier issued instruction is ready for completion and a retire unit for retiring the later issued instruction when the later instruction is ready for completion or to retire the earlier instruction when later instruction is not ready for completion and the earlier issued instruction has a known good completion status. A method is provided for increased efficiency in a processor via early instruction completion. The method comprises completing an earlier issued instruction having a known good completion status ahead of a later issued instruction when the later issued instruction is not ready for completion.
摘要:
Methods and apparatuses are provided for increased efficiency in a processor via control word prediction. The apparatus comprises an operational unit capable of determining whether an instruction will change a first control word to a second control word for processing dependent instructions. Execution units process the dependent instructions using a predicted control word and compare the second control word to the predicted control word. A scheduling unit causes the execution units to reprocess the dependent instructions when the predicted control word does not match the second control word. The method comprises determining that an instruction will change a first control word to a second control word and processing the dependent instructions using a predicted control word. The second control word is compared to the predicted control word and the dependent instructions are reprocessed using the second control word when the predicted control word does not match the second control word.
摘要:
Methods and apparatuses are provided for controlling power consumption in a processor (or computational unit thereof). The method comprises monitoring power consumption in a processor (or computational unit) and determining that the power consumption of the processor (or computational unit) exceeds a threshold. Thereafter, instruction issuance if modified (such as by slowing or ceasing instruction issuance) within the processor (or computational unit) until the power consumption is below the threshold. The apparatus comprises a power consumption monitor for determining when power consumption within the processor exceeds a threshold. Upon that determination, a scheduler begins modify instruction issuance to one or more execution units until the power consumption is below the threshold. The modification of instruction issuance can be to slow instruction issuance or cease instruction issuance for a time period or until the power consumption is below the threshold.
摘要:
A method and structure facilitates the debugging and test coverage capabilities of a microprocessor. A microprocessor having memory arrays, a debug block, and one or more built-in-self-test (BIST) engines is disclosed. The debug block is capable of driving control information out onto a state machine output bus in response to an event and the control information can be selectively used to control signature analysis or recording elements of the microprcessor, such as multiple-input-shift-registers and first-in-first-out devices, that facilitate in the monitoring and debugging of the microprocessor. The signature and recording elements may or may not be contained within the one or more BIST engines and may or may not be used in conjunction with the memory arrays or BIST engine(s) of the microprocessor.
摘要:
A highly flexible and complex BIST engine provides at-speed access, testing, characterization, and monitoring of on-chip memory arrays, independent of other chip circuitry such as a CPU core. Each BIST engine has a main control block, at least one address generation block having an address local control block and one or more address-data generation blocks, and at least one data generation block having a data local control block and one or more data generation blocks. Each of the local address and data control blocks are programmed independently to define operations that will be performed by the individual address and data generation blocks, respectively. The main control block in turn controls operation of the local address and data control blocks to effect desired testing, accessing, and monitoring of the on-chip memory arrays.
摘要:
Apparatus and method for accessing numerous remote registers on an integrated circuit chip using a minimum of interconnect traces. Plural primary nodes are configured in series along a serial data line, each of the plural primary nodes individually selectable according to a primary address presented on the serial data line. In one embodiment, a hierarchical one of the plural primary nodes includes plural secondary registers, each of the plural secondary registers individually selectable according to a secondary address presented on the serial data line. In another embodiment, a hierarchical one of the plural primary nodes includes plural secondary nodes, each of the plural secondary nodes individually selectable according to a secondary address presented on the serial data line. At least one of the plural secondary nodes includes plural tertiary registers, each of the plural tertiary registers individually selectable according to a tertiary address presented on the serial data line.
摘要:
A diseased retina has a blind spot where the center of the retina, called the fovea, exists. A compensation system could comprise first measuring a patient's healthy regions of the retina called PRL. A video camera could be mounted on a table, such as for reading applications, but preferably mounted on an eyeglass frame, capture an area of regard (AR). This AR is sent to a computer which directs a projector (such as a MEMS projector) to direct the AR using his healthy area of his retina. Improvements include adding an eyeball location sensor to keep the AR focused on a moving PRL. Another improvement is dithering the AR image in millimeter sized oscillations on the moving PRL. Reading enhancement software such as Spritz® can be integrated into the computer to display the enhanced text onto the PRL.
摘要:
A system and method are disclosed which provide the capability of repairing an optimum number of defective memory segments, such as RAM segments, in order to minimize the amount of unused repairing circuitry, such as fuses used for repairing defects within the memory. A preferred embodiment of the present invention provides a RAM block implemented such that the number of fuses required for repairing defects therein is proportional to the optimum number of defective segments capable of being repaired. A preferred embodiment allows for repairing an optimum number of defective segments, while being capable of repairing any of the segments (up to the optimum number) by mapping repair data to an appropriate defective segment. A preferred embodiment provides a repairable RAM block comprising multiple segments of RAM memory cells that are each repairable, a state machine capable of generating repair data for repairing one or more defective segments, a scan address machine capable of generating data identifying one or more defective segments, and a mapping circuitry for mapping the generated repair data of the state machine to the one or more defective segments specified by the scan address machine. Accordingly, by providing the capability of mapping generated repair data to any one of the segments of RAM that is detected as being defective, a preferred embodiment enables repairing an optimum number of defective segments, without being required to provide sufficient circuitry for repairing every segment of RAM.
摘要:
An improved method and structure for generating addresses of a memory array facilitates the testing of a memory cell by generating the address of any adjacent memory cell to the memory cell under test. The address generation provides for movement to any adjacent memory cell, in any direction, including north, south, east, west, northeast, northwest, southeast, and southwest. The address of any memory cell, even the address of a non-adjacent memory cell, may be selectively generated by exercising a programmable initialization feature.
摘要:
An improved method and structure for generating addresses of a memory array facilitates the testing of a memory cell by generating the address of any adjacent memory cell to the memory cell under test. The address generation provides for movement to any adjacent memory cell, in any direction, including north, south, east, west, northeast, northwest, southeast, and southwest. The address of any memory cell, even the address of a non-adjacent memory cell, may be selectively generated by defining a current memory address, choosing one or more modes by which increment-generated, decrement-generated, or combination increment/decrement addresses that define a next memory address are generated, and generating the row address and the column address of the next memory address in accordance with interdependent row carry-out and column carry-out operations.