摘要:
A Defect Leakage Screen Test apparatus and method is introduced to eliminate or reduce steps in the failure analysis process of memory devices, such as DRAM cells, or to eliminate the necessity for the application of a physical failure analysis on the memory device. Special single bit failures due to leakage current, junction current, or threshold leakage current, are characterized by varying the p-well voltage of the memory device during the read operation of the test. The p-well voltage is varied with a test code Initial Program Load (IPL). Additional logic is provided on the memory IC to decode the IPL logic signals. In order to perform the p-well varying test, the memory device is provided with the following: IPL decoding logic; a reference voltage generator; an IPL voltage reference multiplexor; a p-well voltage feed-back circuit; and a differential amplifier circuit.
摘要:
Embodiments of the present disclosure provide a power controller, a method of operating a power controller and a semiconductor memory system. In one embodiment, the power controller is for use with a memory and includes an access module configured to provide an active state of the memory to allow memory access. The power controller also includes a retain-till-access module configured to cycle a portion of the memory between the active state and a low leakage data retention state of the memory. The power controller further includes an expanded retain-till-access module configured to extend the active state of the memory for a specified period of time before returning the memory to the low leakage data retention state.
摘要:
A semiconductor memory chip architecture is described implementing of a multi-bit data control function which enables independent control of at least a plurality of data bits via a single control signal. A logically organized memory chip is organized as a 2.sup.n x 4 chip in which one control (CAS0) signal enables a single data bit and another control (CAS1) signal enables the remaining three data bits. By organizing data control on chips in this manner, it becomes possible to optimize design modules such that a minimum number of control signals are used.
摘要:
A computer program for generating a layout for a ferroelectric random access memory (FRAM) that is embodied on a non-transitory storage medium and executable by a processor is provided. FRAM specifications are received, and an FRAM floorplan and design rules are retrieved from the non-transitory storage medium. The layout for the FRAM based on the FRAM specifications and design rules is then assembled.
摘要:
A computer program for generating a layout for a ferroelectric random access memory (FRAM) that is embodied on a non-transitory storage medium and executable by a processor is provided. FRAM specifications are received, and an FRAM floorplan and design rules are retrieved from the non-transitory storage medium. The layout for the FRAM based on the FRAM specifications and design rules is then assembled.
摘要:
A high speed Random Access Memory (RAM) array device includes several logical banks, each of which can be uniquely addressed. Each of these logical banks contains a unique memory array segment and associated page register, the latter serving as a temporary storage location during high-speed page hit operations. To reduce latency during an initial page hit, further array optimization is realized by segmenting each logical bank into two segments with one, smaller segment, comprising a faster random access memory (FRAM) for storing initial data in a data stream. A high speed page register connects the FRAM directly to a multiplexer/demultiplexer connected to the device I/O ports bypassing an internal bus protocol such that the initial data can be transferred between the FRAM and the I/O ports faster thereby improving page-hit latency. Hence, segmenting the logical banks to include only a small high speed segment results in a performance gain approaching what could be achieved by implementing the entire memory device with a high speed FRAM, but at much lower cost.
摘要:
Embodiments of the present disclosure provide a power controller, a method of operating a power controller and a semiconductor memory system. In one embodiment, the power controller is for use with a memory and includes an access module configured to provide an active state of the memory to allow memory access. The power controller also includes a retain-till-access module configured to cycle a portion of the memory between the active state and a low leakage data retention state of the memory. The power controller further includes an expanded retain-till-access module configured to extend the active state of the memory for a specified period of time before returning the memory to the low leakage data retention state.
摘要:
The present invention provides a tunable voltage controller for use with a sub-circuit. In one embodiment, the tunable voltage controller includes a diode-connected MOS transistor contained in a doped well of a substrate and configured to provide a voltage for the sub-circuit. Additionally, the tunable voltage controller also includes a biasing unit configured to adjust the voltage by selectively connecting the doped well to one of a plurality of voltage sources or to a variable voltage source.
摘要:
The present invention provides a tunable voltage controller for use with a sub-circuit. In one embodiment, the tunable voltage controller includes a diode-connected MOS transistor contained in a doped well of a substrate and configured to provide a voltage for the sub-circuit. Additionally, the tunable voltage controller also includes a biasing unit configured to adjust the voltage by selectively connecting the doped well to one of a plurality of voltage sources or to a variable voltage source.