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公开(公告)号：US20230057027A1
公开(公告)日：2023-02-23
申请号：US17407259
申请日：2021-08-20
Applicant: Micron Technology, Inc.
Inventor： Lisa R. Copenspire-Ross , Amber Thompson , Amber Huddleston , Qianlan Liu , Charlotte Singleton
IPC: G05D1/02 , G05B19/4155
Abstract: Apparatuses, machine-readable media, and methods related to cleaning detection are described. A cleaning detection system can be used to determine whether there is a need for cleaning by comparing detection inputs, from sensors of the cleaning detection system, that are associated with an updated status of an area to a baseline status of an area. The cleaning detection system can receive a number of initial inputs associated with an area scanned by the device, determine a baseline status of the area based on the number of initial inputs, receive a number of detection inputs associated with the area scanned by the device, and determine whether a location of the area is in need of cleaning based on a comparison of the baseline status and the number of detection inputs.
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公开(公告)号：US20200211912A1
公开(公告)日：2020-07-02
申请号：US16233728
申请日：2018-12-27
Applicant: Micron Technology, Inc.
Inventor： Anilkumar Chandolu , Lisa R. Copenspire-Ross , Michael D. Kenney
Abstract: Semiconductor devices having measurement features and associated systems and methods are disclosed herein. In one embodiment, a semiconductor device includes a plurality of stacked semiconductor dies each having measurement features formed along an outer periphery of a surface thereof. One or more image capture devices can image the semiconductor device and a controller can detect the measurement features in imaging data received from the image capture devices. The controller can further determine the distance between two or more of the measurement features to estimate a bond line thickness between semiconductor dies in the stack.
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公开(公告)号：US11630924B2
公开(公告)日：2023-04-18
申请号：US17006662
申请日：2020-08-28
Applicant: Micron Technology, Inc.
Inventor： Bhagyashree Bokade , Anusha Gunda , Lisa R. Copenspire-Ross
Abstract: Methods, apparatuses, and non-transitory machine-readable media associated with sharing data with a particular audience are described. Examples can include receiving first data at a processing resource, determining whether the first data comprises a combination of bits associated with text or an image, or both, and comparing the combination of bits to second data stored on a memory resource. Examples can include identifying one or more words or one or more images represented by the first data, or both, based on the comparison and assigning to the first data first metadata representative of a first security categorization and a first confidence level and second metadata representative of a second security categorization and a second confidence level Examples can include transmitting an output that comprises the first data or third data that comprises a modified combination of bits relative to the combination of bits of the first data.
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公开(公告)号：US20220067216A1
公开(公告)日：2022-03-03
申请号：US17006662
申请日：2020-08-28
Applicant: Micron Technology, Inc.
Inventor： Bhagyashree Bokade , Anusha Gunda , Lisa R. Copenspire-Ross
Abstract: Methods, apparatuses, and non-transitory machine-readable media associated with sharing data with a particular audience are described. Examples can include receiving first data at a processing resource, determining whether the first data comprises a combination of bits associated with text or an image, or both, and comparing the combination of bits to second data stored on a memory resource. Examples can include identifying one or more words or one or more images represented by the first data, or both, based on the comparison and assigning to the first data first metadata representative of a first security categorization and a first confidence level and second metadata representative of a second security categorization and a second confidence level Examples can include transmitting an output that comprises the first data or third data that comprises a modified combination of bits relative to the combination of bits of the first data.
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Patent Agency Ranking
公开(公告)号：US10971409B2
公开(公告)日：2021-04-06
申请号：US16233728
申请日：2018-12-27
Applicant: Micron Technology, Inc.
Inventor： Anilkumar Chandolu , Lisa R. Copenspire-Ross , Michael D. Kenney
Abstract: Semiconductor devices having measurement features and associated systems and methods are disclosed herein. In one embodiment, a semiconductor device includes a plurality of stacked semiconductor dies each having measurement features formed along an outer periphery of a surface thereof. One or more image capture devices can image the semiconductor device and a controller can detect the measurement features in imaging data received from the image capture devices. The controller can further determine the distance between two or more of the measurement features to estimate a bond line thickness between semiconductor dies in the stack.
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公开(公告)号：US20230329612A1
公开(公告)日：2023-10-19
申请号：US17720770
申请日：2022-04-14
Applicant: Micron Technology, Inc.
Inventor： Lisa R. Copenspire-Ross , Nkiruka Christian , Trupti D. Gawai , Josephine T. Hamada , Anda C. Mocuta
CPC classification number: A61B5/18 , A61B5/7267 , A61B5/0022 , A61B5/6893 , B60R25/25 , B60W60/0051 , G16H40/63 , B60W2556/65 , B60W2540/221 , B60W2540/223 , B60W2540/225 , B60W2540/21
Abstract: Methods, devices, and systems related to determining driver capability are described. In an example, a method can include receiving, at a computing device, data associated with a driver from a sensor, inputting the data into an artificial intelligence (AI) model, performing an AI operation using the AI model, and determining whether the driver is capable of driving a vehicle based on an output of the AI model.
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公开(公告)号：US11641681B2
公开(公告)日：2023-05-02
申请号：US17189775
申请日：2021-03-02
Applicant: Micron Technology, Inc.
Abstract: Methods, apparatuses, and non-transitory machine-readable media associated with data transmission are described. Data transmission and remote activity monitoring can include detecting a triggering event and determining an output data type associated with the triggering event, wherein the output data type is a first type for display at a second device or a second type to initiate communication between the first device and one or more second devices. Data transmission can include transmitting the output data to the second device via a device-to-device data link in response to determining the output data type comprises the first type. In response to determining the output data type comprises the second type, data transmission can include initiating a two-way communication path with the second device, the two-way communication path comprising a device-to-device data link or a data link with a base station or access point and transmitting the output data to the second device.
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公开(公告)号：US20220287112A1
公开(公告)日：2022-09-08
申请号：US17189775
申请日：2021-03-02
Applicant: Micron Technology, Inc.
Abstract: Methods, apparatuses, and non-transitory machine-readable media associated with data transmission are described. Data transmission and remote activity monitoring can include detecting a triggering event and determining an output data type associated with the triggering event, wherein the output data type is a first type for display at a second device or a second type to initiate communication between the first device and one or more second devices. Data transmission can include transmitting the output data to the second device via a device-to-device data link in response to determining the output data type comprises the first type. In response to determining the output data type comprises the second type, data transmission can include initiating a two-way communication path with the second device, the two-way communication path comprising a device-to-device data link or a data link with a base station or access point and transmitting the output data to the second device.
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公开(公告)号：US20210225715A1
公开(公告)日：2021-07-22
申请号：US17207989
申请日：2021-03-22
Applicant: Micron Technology, Inc.
Inventor： Anilkumar Chandolu , Lisa R. Copenspire-Ross , Michael D. Kenney
Abstract: Semiconductor devices having measurement features and associated systems and methods are disclosed herein. In one embodiment, a semiconductor device includes a plurality of stacked semiconductor dies each having measurement features formed along an outer periphery of a surface thereof. One or more image capture devices can image the semiconductor device and a controller can detect the measurement features in imaging data received from the image capture devices. The controller can further determine the distance between two or more of the measurement features to estimate a bond line thickness between semiconductor dies in the stack.
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