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1.发明授权Apparatuses, systems, devices, and methods of replacing at least partially non-functional portions of memory 有权替换存储器的至少部分非功能部分的装置，系统，装置和方法公开(公告)号：US09165688B2
公开(公告)日：2015-10-20
申请号：US14454040
申请日：2014-08-07
Applicant: Micron Technology Inc.
Inventor： Chris Bueb , Sean Eilert
CPC classification number: G11C29/765 , G06F11/10 , G06F11/1044 , G06F11/1048 , G06F11/1072 , G11C29/42 , G11C29/52 , G11C29/808 , G11C29/82 , G11C2029/0409 , G11C2029/0411
Abstract: Subject matter disclosed herein relates to determining that a portion of a memory is at least partially non-functional, replacing the portion of at least partially non-functional memory; and adjusting an error detection and/or correction process responsive to determining that the portion of the memory is at least partially non-functional and/or replacing the portion of at least partially non-functional memory.
Abstract translation: 本文公开的主题涉及确定存储器的一部分至少部分地不起作用，代替至少部分非功能性存储器的部分; 以及响应于确定所述存储器的所述部分至少部分地不起作用和/或替换所述至少部分非功能性存储器的所述部分来调整错误检测和/或校正过程。
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公开(公告)号：US20140351630A1
公开(公告)日：2014-11-27
申请号：US14454040
申请日：2014-08-07
Applicant: Micron Technology Inc.
Inventor： Chris Bueb , Sean Eilert
CPC classification number: G11C29/765 , G06F11/10 , G06F11/1044 , G06F11/1048 , G06F11/1072 , G11C29/42 , G11C29/52 , G11C29/808 , G11C29/82 , G11C2029/0409 , G11C2029/0411
Abstract: Subject matter disclosed herein relates to determining that a portion of a memory is at least partially non-functional, replacing the portion of at least partially non-functional memory; and adjusting an error detection and/or correction process responsive to determining that the portion of the memory is at least partially non-functional and/or replacing the portion of at least partially non-functional memory.
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3.发明授权Apparatuses, systems, devices, and methods of replacing at least partially non-functional portions of memory 有权替换存储器的至少部分非功能部分的装置，系统，装置和方法公开(公告)号：US08806303B2
公开(公告)日：2014-08-12
申请号：US14055405
申请日：2013-10-16
Applicant: Micron Technology Inc.
Inventor： Chris Bueb , Sean Eilert
CPC classification number: G11C29/765 , G06F11/10 , G06F11/1044 , G06F11/1048 , G06F11/1072 , G11C29/42 , G11C29/52 , G11C29/808 , G11C29/82 , G11C2029/0409 , G11C2029/0411
Abstract: Subject matter disclosed herein relates to determining that a portion of a memory is at least partially non-functional, replacing the portion of at least partially non-functional memory; and adjusting an error detection and/or correction process responsive to determining that the portion of the memory is at least partially non-functional and/or replacing the portion of at least partially non-functional memory.
Abstract translation: 本文公开的主题涉及确定存储器的一部分至少部分地不起作用，代替至少部分非功能性存储器的部分; 以及响应于确定所述存储器的所述部分至少部分地不起作用和/或替换所述至少部分非功能性存储器的所述部分来调整错误检测和/或校正过程。
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4.发明申请APPARATUSES, SYSTEMS, DEVICES, AND METHODS OF REPLACING AT LEAST PARTIALLY NON-FUNCTIONAL PORTIONS OF MEMORY 有权设备，系统，设备和替代部分非功能部分存储器的方法公开(公告)号：US20140047283A1
公开(公告)日：2014-02-13
申请号：US14055405
申请日：2013-10-16
Applicant: Micron Technology Inc.
Inventor： Chris Bueb , Sean Eilert
IPC: G06F11/10
CPC classification number: G11C29/765 , G06F11/10 , G06F11/1044 , G06F11/1048 , G06F11/1072 , G11C29/42 , G11C29/52 , G11C29/808 , G11C29/82 , G11C2029/0409 , G11C2029/0411
Abstract: Subject matter disclosed herein relates to determining that a portion of a memory is at least partially non-functional, replacing the portion of at least partially non-functional memory; and adjusting an error detection and/or correction process responsive to determining that the portion of the memory is at least partially non-functional and/or replacing the portion of at least partially non-functional memory.
Abstract translation: 本文公开的主题涉及确定存储器的一部分至少部分地不起作用，代替至少部分非功能性存储器的部分; 以及响应于确定所述存储器的所述部分至少部分地不起作用和/或替换所述至少部分非功能性存储器的所述部分来调整错误检测和/或校正过程。
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