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260 条记录 (耗时 0.023 秒)

    Direct-heated gas-flow measuring apparatus
    1.
    发明授权
    Direct-heated gas-flow measuring apparatus 失效
    直热式气流测量仪

    公开(公告)号：US4735099A

    公开(公告)日：1988-04-05

    申请号：US935109

    申请日：1986-11-24

    申请人： Minoru Ohta ,  Kazuhiko Miura ,  Seizi Huzino ,  Kenji Kanehara ,  Tadashi Hattori

    发明人： Minoru Ohta ,  Kazuhiko Miura ,  Seizi Huzino ,  Kenji Kanehara ,  Tadashi Hattori

    IPC分类号： G01F1/68 ,  G01F1/684 ,  G01F1/692 ,  G01F1/698

    CPC分类号： G01F1/684 ,  G01F1/6845 ,  G01F1/698

    摘要： A direct-heated gas-flow measuring apparatus including a measuring tube disposed in the gas stream, a film resistor for generating heat and detecting the temperature thereof, and a feedback control circuit for controlling the heat generated by the film resistor so that the temperature of the film resistor is a predetermined value. Provided in a supporting portion of the film resistor for supporting it to the measuring tube is an aperture for throttling the heat transfer thereof.

    摘要翻译： 一种直接加热的气流测量装置，包括设置在气流中的测量管，用于产生热并检测其温度的膜电阻器，以及用于控制由薄膜电阻器产生的热量的反馈控制电路， 薄膜电阻器是预定值。 在用于将其支撑到测量管的膜电阻器的支撑部分中设置有用于节流其传热的孔。

    Direct-heated gas-flow measuring apparatus
    3.
    发明授权
    Direct-heated gas-flow measuring apparatus 失效
    直热式气流测量仪

    公开(公告)号：US4785662A

    公开(公告)日：1988-11-22

    申请号：US929309

    申请日：1986-11-12

    申请人： Minoru Ohta ,  Kazuhiko Miura ,  Seizi Huzino ,  Kenji Kanehara ,  Tadashi Hattori

    发明人： Minoru Ohta ,  Kazuhiko Miura ,  Seizi Huzino ,  Kenji Kanehara ,  Tadashi Hattori

    IPC分类号： G01F1/684 ,  G01F1/692 ,  G01F1/698 ,  G01F1/68

    CPC分类号： G01F1/684 ,  G01F1/692 ,  G01F1/6983

    摘要： A direct-heated gas-flow measuring apparatus including a measuring tube disposed in the gas stream, a film resistor for generating heat and detecting the temperature thereof, and a feedback control circuit for controlling the heat generated by the film resistor so that the temperature of the film resistor is a predetermined value. Provided at least at the upstream side of the film resistor near thereto is a shield for reducing the accumulation of deposits on the film resistor. The shield and the film resistor have substantially the same thickness to satisfy the condition:l/t.ltoreq.50where l is a distance therebetween and t is a thickness thereof.

    摘要翻译： 一种直接加热的气流测量装置，包括设置在气流中的测量管，用于产生热并检测其温度的膜电阻器，以及用于控制由薄膜电阻器产生的热量的反馈控制电路， 薄膜电阻器是预定值。 至少在其附近的薄膜电阻器的上游侧设置有用于减少薄膜电阻器上的沉积物积聚的屏蔽。 屏蔽和薄膜电阻器具有基本上相同的厚度以满足以下条件：l /t≤50其中l是其间的距离，t是其厚度。

    Direct-heated gas-flow measuring apparatus
    5.
    发明授权
    Direct-heated gas-flow measuring apparatus 失效
    直热式气流测量仪

    公开(公告)号：US4627279A

    公开(公告)日：1986-12-09

    申请号：US729855

    申请日：1985-05-02

    申请人： Minoru Ohta ,  Kazuhiko Miura ,  Seizi Huzino ,  Kenji Kanehara ,  Tadashi Hattori

    发明人： Minoru Ohta ,  Kazuhiko Miura ,  Seizi Huzino ,  Kenji Kanehara ,  Tadashi Hattori

    IPC分类号： G01F1/68 ,  G01F1/00 ,  G01F1/684 ,  G01F1/692 ,  G01F1/696 ,  G01F1/698

    CPC分类号： G01F1/698 ,  G01F1/684 ,  G01F1/692 ,  G01F1/6965

    摘要： A direct-heated gas-flow measuring apparatus for a passage including a plurality of film resistors, disposed within the passage, for generating heat and measuring the temperature thereof, and a feedback control circuit for controlling the heat generated by the film resistors so that the temperature of each of the film resistors is a predetermined value. The feedback control circuit generates a plurality of output signals corresponding to voltages applied to the film resistors. A mean value for the plurality of output signals is calculated as the amount of gas-flow rate.

    摘要翻译： 一种用于通道的直接加热气流测量装置，包括设置在通道内的用于产生热量并测量其温度的多个薄膜电阻器，以及用于控制由薄膜电阻器产生的热量的反馈控制电路， 每个薄膜电阻器的温度是预定值。 反馈控制电路产生对应于施加到薄膜电阻器的电压的多个输出信号。 多个输出信号的平均值被计算为气体流量的量。

    Direct-heated flow measuring apparatus having uniform characteristics
    7.
    发明授权
    Direct-heated flow measuring apparatus having uniform characteristics 失效
    具有均匀特性的直热式流量测量装置

    公开(公告)号：US4756190A

    公开(公告)日：1988-07-12

    申请号：US894895

    申请日：1986-08-08

    申请人： Minoru Ohta ,  Michitoshi Onoda ,  Kazuhiko Miura ,  Seizi Huzino ,  Tadashi Hattori

    发明人： Minoru Ohta ,  Michitoshi Onoda ,  Kazuhiko Miura ,  Seizi Huzino ,  Tadashi Hattori

    IPC分类号： G01F1/692 ,  G01F1/68

    CPC分类号： G01F1/692

    摘要： In a direct-heated flow measuring apparatus including a film resistor having a substrate and a resistance layer thereon, the substrate is supported by a supporting member in a passage. Provided between the substrate and the supporting member is an adiabatic member for enhancing the adiabatic effect of the resistance layer. The substrate is adhered by adhesives having an excellent thermal conductivity coefficient to the adiabatic member, and the supporting member is also adhered by adhesives having an excellent thermal conductivity coefficient to the adiabatic member.

    摘要翻译： 在包括具有基板和电阻层的薄膜电阻器的直接加热流量测量装置中，基板由通道中的支撑构件支撑。 在基板和支撑部件之间设置有用于增强电阻层的绝热效果的绝热部件。 基材通过具有优异导热系数的粘合剂粘合到绝热构件上，并且支撑构件也通过具有优异导热系数的粘合剂粘合到绝热构件上。

    Flow rate detecting apparatus having semiconductor chips
    10.
    发明授权
    Flow rate detecting apparatus having semiconductor chips 失效
    具有半导体芯片的流量检测装置

    公开(公告)号：US4682496A

    公开(公告)日：1987-07-28

    申请号：US690245

    申请日：1985-01-10

    申请人： Kazuhiko Miura ,  Tadashi Hattori ,  Yukio Iwasaki ,  Tokio Kohama ,  Kenji Kanehara

    发明人： Kazuhiko Miura ,  Tadashi Hattori ,  Yukio Iwasaki ,  Tokio Kohama ,  Kenji Kanehara

    IPC分类号： G01F1/68 ,  G01F1/684 ,  G01F1/688 ,  G01F1/69 ,  G01F1/692 ,  G01F1/698 ,  G01F1/699 ,  G01F15/04

    CPC分类号： G01F1/698 ,  G01F1/684 ,  G01F1/6842 ,  G01F1/692

    摘要： A semiconductor type flow rate detecting apparatus having first and second control units arranged at upstream and downstream positions respectively in a flow stream to be measured and an operation circuit. The first control unit includes a first temperature detecting element and a first temperature control heater. The second control unit includes a second temperature detecting element, a second temperature control heater and a preliminary heater. The operation circuit controls the second and preliminary heaters and generates a signal indicative of flow rate. The operation circuit has a constant power consumption circuit to control heat from the preliminary heater to a constant level.

    摘要翻译： 一种半导体型流量检测装置，具有分别设置在待测流路中的上游和下游位置的第一和第二控制单元以及运算电路。 第一控制单元包括第一温度检测元件和第一温度控制加热器。 第二控制单元包括第二温度检测元件，第二温度控制加热器和预加热器。 操作电路控制第二和初步加热器并产生指示流量的信号。 操作电路具有恒定的功耗电路，用于将来自预加热器的热量控制到恒定水平。