公开(公告)号：US20190019766A1

公开(公告)日：2019-01-17

申请号：US15750614

申请日：2016-08-03

Applicant: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY

Inventor： Yohei Hori ,  Yongxun Liu ,  Shinichi Ouchi ,  Tetsuji Yasuda ,  Meishoku Masahara ,  Toshifumi Irisawa ,  Kazuhiko Endo ,  Hiroyuki Ota ,  Tatsuro Maeda ,  Hanpei Koike ,  Yasuhiro Ogasahara ,  Toshihiro Katashita ,  Koichi Fukuda

IPC: H01L23/00 ,  H01L25/065 ,  H01L23/522

Abstract: A semiconductor device 100 of the present invention includes a front end and back ends A and B, each including a plurality of layers. Further, in the plurality of layers of the back end B, (i) circuits 22, 23, and 24 having a security function are provided in at least one layer having a wiring pitch of 100 nm or more, (ii) a circuit having a security function is provided in at least one wiring layer in M5 or higher level (M5, M6, M7, . . . ), (iii) a circuit having a security function is provided in at least one layer, for which immersion ArF exposure does not need to be used, or (iv) a circuit having a security function is provided in at least one layer that is exposed by using an exposure wavelength of 200 nm or more.

公开(公告)号：US10402248B2

公开(公告)日：2019-09-03

申请号：US15507105

申请日：2015-08-20

Applicant: National Institute of Advanced Industrial Science and Technology

Inventor： Yohei Hori ,  Kazukuni Kobara ,  Toshihiro Katashita ,  Toshihiro Matsui

IPC: G06F11/00 ,  G06F11/07 ,  G09C1/00 ,  H04L9/10 ,  H04L9/32 ,  H03K19/003

Abstract: A method and a program capable of controlling an error rate of device-specific information are provided. Provided is the method for controlling an error rate of device-specific information, including a step S1 of: inputting each of i (i is an arbitrary natural number) challenges, j times (j is an arbitrary natural number), into a PUF mounted chip; leaving j responses intact (j′=j) or processing j responses into j′ pieces (0

公开(公告)号：US20170255503A1

公开(公告)日：2017-09-07

申请号：US15507105

申请日：2015-08-20

Applicant: National Institute of Advanced Industrial Science and Technology

Inventor： Yohei Hori ,  Kazukuni Kobara ,  Toshihiro Katashita ,  Toshihiro Matsui

IPC: G06F11/07 ,  H03K19/003

CPC classification number: G06F11/076 ,  G06F11/0736 ,  G06F11/079 ,  G09C1/00 ,  H03K19/003 ,  H04L9/10 ,  H04L9/32

Abstract: A method and a program capable of controlling an error rate of device-specific information are provided. Provided is the method for controlling an error rate of device-specific information, including a step S1 of: inputting each of i (i is an arbitrary natural number) challenges, j times (j is an arbitrary natural number), into a PUF mounted chip; leaving j responses intact (j′=j) or processing j responses into j′ pieces (0