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公开(公告)号:US20190019766A1
公开(公告)日:2019-01-17
申请号:US15750614
申请日:2016-08-03
Inventor: Yohei Hori , Yongxun Liu , Shinichi Ouchi , Tetsuji Yasuda , Meishoku Masahara , Toshifumi Irisawa , Kazuhiko Endo , Hiroyuki Ota , Tatsuro Maeda , Hanpei Koike , Yasuhiro Ogasahara , Toshihiro Katashita , Koichi Fukuda
IPC: H01L23/00 , H01L25/065 , H01L23/522
Abstract: A semiconductor device 100 of the present invention includes a front end and back ends A and B, each including a plurality of layers. Further, in the plurality of layers of the back end B, (i) circuits 22, 23, and 24 having a security function are provided in at least one layer having a wiring pitch of 100 nm or more, (ii) a circuit having a security function is provided in at least one wiring layer in M5 or higher level (M5, M6, M7, . . . ), (iii) a circuit having a security function is provided in at least one layer, for which immersion ArF exposure does not need to be used, or (iv) a circuit having a security function is provided in at least one layer that is exposed by using an exposure wavelength of 200 nm or more.
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公开(公告)号:US20250063766A1
公开(公告)日:2025-02-20
申请号:US18722538
申请日:2022-11-16
Inventor: Wen-Hsin Chang , Toshifumi Irisawa , Naoya Okada , Yuta Saito , Shogo Hatayama
IPC: H01L29/786 , H01L29/16 , H01L29/45 , H01L29/66
Abstract: Provided are an electronic/optical device, which is reduced in contact resistance occurring between a layered material layer and a metal electrode layer, and a method of manufacturing the device. The electronic/optical device of the present invention includes a laminated structure in which an intermediate layer is arranged between a layered material layer (2) and a metal electrode layer (3). The intermediate layer is a crystal layer (4) of an intermediate layer-forming material containing: at least one of Sb and Bi; and Te. In addition, the method of manufacturing an electronic/optical device of the present invention includes: an intermediate layer-forming step of forming, on the layered material layer (2), the intermediate layer (crystal layer (4)) obtained by crystallizing an intermediate layer-forming material containing: at least one of Sb and Bi; and Te; and a metal electrode layer-forming step of forming the metal electrode layer (3) on the intermediate layer.
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