METHOD FOR PRODUCING SEMICONDUCTOR LASER ELEMENT
    2.
    发明申请
    METHOD FOR PRODUCING SEMICONDUCTOR LASER ELEMENT 有权
    生产半导体激光元件的方法

    公开(公告)号:US20170077672A1

    公开(公告)日:2017-03-16

    申请号:US15258868

    申请日:2016-09-07

    Abstract: A method for producing a semiconductor laser element includes providing a semiconductor wafer comprising: a nitride semiconductor substrate, and a semiconductor stack located on the substrate, the semiconductor stack including a plurality of nitride semiconductor layers; forming in the substrate a fissure starting point and a fissure extending from the fissure starting point; forming a cleavage reference portion extending parallel to a cleavage plane of the semiconductor wafer as estimated from a plan view shape of the fissure; and cleaving the semiconductor wafer parallel to the cleavage reference portion to thereby obtain resonator end faces.

    Abstract translation: 一种半导体激光元件的制造方法,其特征在于,具备:半导体晶片,其具备:氮化物半导体基板和位于所述基板上的半导体叠层,所述半导体叠层包括多个氮化物半导体层; 在基板上形成裂缝起点和从裂缝起点延伸的裂缝; 形成从所述裂缝的平面图形状估计的平行于所述半导体晶片的解理平面延伸的切割参考部分; 并且将半导体晶片与分割基准部分平行,从而获得谐振器端面。

    PLURALITY OF LIGHT-EMITTING DEVICES AND MANUFACTURING METHOD OF A PLURALITY OF LIGHT-EMITTING DEVICES

    公开(公告)号:US20250105585A1

    公开(公告)日:2025-03-27

    申请号:US18895149

    申请日:2024-09-24

    Inventor: Hiroki SAKATA

    Abstract: A plurality of light-emitting devices includes first, second, and third light-emitting devices. The first/second light-emitting device includes a first/second semiconductor laser element configured to emit light of a first/second color having a light emission peak wavelength of a first/second wavelength and a first/second reflective member having a reflectance of 90% or more with respect to the first/second wavelength. The third light-emitting device includes third and fourth semiconductor laser elements configured to emit light of the first and second colors having light emission peak wavelengths of third and fourth wavelengths, respectively, and a plurality of third reflective members having a reflectance of 90% or more with respect to the third wavelength and the fourth wavelength. A reflectance of the third reflective member with respect to light having the first/second wavelength is higher than a reflectance of the second/first reflective member with respect to the light having the first/second wavelength.

Patent Agency Ranking